Method for reducing substrate charging
    2.
    发明授权
    Method for reducing substrate charging 有权
    减少基板充电的方法

    公开(公告)号:US08294976B1

    公开(公告)日:2012-10-23

    申请号:US12415937

    申请日:2009-03-31

    IPC分类号: G02B26/00

    摘要: An electrostatically actuatable micro electromechanical device is provided with enhanced reliability and lifetime. The electrostatically actuatable micro electromechanical device comprises: a substrate, a first conductor fixed to the top layer of the substrate, forming a fixed electrode, a second conductor fixed to the top layer of the substrate, and a substrate area. The second conductor is electrically isolated from the first conductor and comprises a moveable portion, suspended at a predetermined distance above the first conductor, the moveable portion forming a moveable electrode which approaches the fixed electrode upon applying an actuation voltage between the first and second conductors. The selected substrate surface area is defined as the orthogonal projection of the moveable portion on the substrate between the first and second conductors. In the substrate surface area at least one recess is provided in at least the top layer of the substrate.

    摘要翻译: 提供了一种可静电驱动的微机电装置,具有更高的可靠性和寿命。 静电致动微机电装置包括:基板,固定到基板的顶层的第一导体,形成固定电极,固定到基板的顶层的第二导体和基板区域。 所述第二导体与所述第一导体电隔离并且包括悬挂在所述第一导体上方预定距离处的可移动部分,所述可移动部分形成在所述第一和第二导体之间施加致动电压时接近所述固定电极的可移动电极。 所选择的基板表面积被定义为在第一和第二导体之间的基板上的可移动部分的正交投影。 在基板表面区域中,至少一个凹部设置在基板的至少顶层中。

    METHOD FOR REDUCING SUBSTRATE CHARGING
    4.
    发明申请
    METHOD FOR REDUCING SUBSTRATE CHARGING 有权
    减少基板充电的方法

    公开(公告)号:US20120279837A1

    公开(公告)日:2012-11-08

    申请号:US12415937

    申请日:2009-03-31

    IPC分类号: H01H57/00 H01H49/00

    摘要: An electrostatically actuatable micro electromechanical device is provided with enhanced reliability and lifetime. The electrostatically actuatable micro electromechanical device comprises: a substrate, a first conductor fixed to the top layer of the substrate, forming a fixed electrode, a second conductor fixed to the top layer of the substrate, and a substrate area. The second conductor is electrically isolated from the first conductor and comprises a moveable portion, suspended at a predetermined distance above the first conductor, the moveable portion forming a moveable electrode which approaches the fixed electrode upon applying an actuation voltage between the first and second conductors. The selected substrate surface area is defined as the orthogonal projection of the moveable portion on the substrate between the first and second conductors. In the substrate surface area at least one recess is provided in at least the top layer of the substrate.

    摘要翻译: 提供了一种可静电驱动的微机电装置,具有更高的可靠性和寿命。 静电致动微机电装置包括:基板,固定到基板的顶层的第一导体,形成固定电极,固定到基板的顶层的第二导体和基板区域。 所述第二导体与所述第一导体电隔离并且包括悬挂在所述第一导体上方预定距离处的可移动部分,所述可移动部分形成在所述第一和第二导体之间施加致动电压时接近所述固定电极的可移动电极。 所选择的基板表面积被定义为在第一和第二导体之间的基板上的可移动部分的正交投影。 在基板表面区域中,至少一个凹部设置在基板的至少顶层中。

    Emission microscope and method for continuous wavelength spectroscopy
    5.
    发明授权
    Emission microscope and method for continuous wavelength spectroscopy 失效
    发射显微镜和连续波长光谱法

    公开(公告)号:US6043882A

    公开(公告)日:2000-03-28

    申请号:US166011

    申请日:1998-10-02

    CPC分类号: G01J3/2803 G01J3/14 G01J3/443

    摘要: A photon-emission microscope method and system are described which allow both emission spot localization and continuous spectral analysis of the emited light from the emission spot of a biased electronic circuit. The system includes an emission microscope, a detector and an in-line, direct vision, chromatically dispersing prismatic device. The microscope system advantageously uses only one detector which does not need to be moved to be able to detect both the localization and spectral images. In a particular embodiment, localization of emission spots may be performed using monochromatic light which allows sharp images of the electronic circuit despite the fact that the electronic circuit is viewed through the dispersing device. Further, an improved procedure is described for overcoming errors caused by saturation of the detector at high sensitivities.

    摘要翻译: 描述了允许来自偏置电子电路的发射点的发射光的发射点定位和连续光谱分析的光子发射显微镜方法和系统。 该系统包括放射显微镜,检测器和直列视觉,色度分散棱镜装置。 显微镜系统有利地仅使用一个不需要移动以便能够检测定位和光谱图像的检测器。 在特定实施例中,发射点的定位可以使用单色光进行,其允许电子电路的清晰图像,尽管事实上通过分散装置观察电子电路。 此外,描述了用于克服由高灵敏度的检测器的饱和引起的误差的改进方法。