SLIDING MEMBER AND METHOD FOR MANUFACTURING THE SAME
    3.
    发明申请
    SLIDING MEMBER AND METHOD FOR MANUFACTURING THE SAME 有权
    滑动构件及其制造方法

    公开(公告)号:US20130309522A1

    公开(公告)日:2013-11-21

    申请号:US13982613

    申请日:2012-02-09

    IPC分类号: C23C14/02 C23C16/02

    摘要: Provided is a sliding member having slidability and abrasion resistance both at satisfactory levels. This sliding member has a sliding surface including a base and a filling part. The base includes a first material and bears regularly arranged concavities. The filling part includes a second material and is arranged in the sliding surface to fill the concavities. The first material includes one selected from the group consisting of a metallic material, a ceramic material, and a carbonaceous material. The second material includes at least one selected from the group consisting of a metallic material, a ceramic material, and a carbonaceous material. The first and second materials differ from each other in at least one of frictional coefficient and hardness. The base and the filling part are substantially flush with each other in the sliding surface.

    摘要翻译: 具有滑动性和耐磨性均在满意的水平的滑动构件。 该滑动部件具有包括基部和填充部的滑动面。 底座包括第一种材料,并经常布置有凹凸。 填充部分包括第二材料并且布置在滑动表面中以填充凹部。 第一材料包括选自金属材料,陶瓷材料和碳质材料的材料。 第二材料包括选自由金属材料,陶瓷材料和碳质材料组成的组中的至少一种。 第一和第二材料在摩擦系数和硬度中的至少一个方面彼此不同。 底座和填充部分在滑动表面上彼此基本齐平。

    Contact probe pin for semiconductor test apparatus
    4.
    发明授权
    Contact probe pin for semiconductor test apparatus 有权
    用于半导体测试装置的探针

    公开(公告)号:US08166568B2

    公开(公告)日:2012-04-24

    申请号:US12847442

    申请日:2010-07-30

    IPC分类号: G01N13/16 G01Q70/14

    摘要: It is an object to provide a contact probe pin for a semiconductor test apparatus, including an amorphous carbon type conductive film formed on the probe pin base material surface. The conductive film is excellent in tin adhesion resistance of preventing tin which is the main component of solder from adhering to the contact part of the probe pin during contact between the probe pin and solder. The contact probe pin for a semiconductor test apparatus, includes an amorphous carbon type conductive film formed on the conductive base material surface. The amorphous carbon type conductive film has an outer surface with a surface roughness (Ra) of 6.0 nm or less, a root square slope (RΔq) of 0.28 or less, and a mean value (R) of curvature radii of concave part tips of the surface form of 180 nm or more, in a 4-μm2 scan range by an atomic force microscope.

    摘要翻译: 本发明的目的是提供一种用于半导体测试装置的接触探针,包括形成在探针针基材表面上的非晶碳型导电膜。 导电膜在探针和焊料之间的接触期间,防止作为焊料的主要成分的锡的锡粘附性优异地粘附到探针的接触部分。 用于半导体测试装置的接触探针包括形成在导电基材表面上的非晶碳型导电膜。 非晶碳类导电膜的表面粗糙度(Ra)为6.0nm以下,根平方斜率(R&Dgr; q)为0.28以下,凹部的曲率半径的平均值(R) 180nm以上的表面形状的尖端,在原子力显微镜的4μm2扫描范围内。

    External storage device and power management method for the same
    5.
    发明授权
    External storage device and power management method for the same 有权
    外部存储设备和电源管理方法相同

    公开(公告)号:US07984315B2

    公开(公告)日:2011-07-19

    申请号:US11665856

    申请日:2005-10-24

    申请人: Hirotaka Ito

    发明人: Hirotaka Ito

    摘要: An external storage device includes a media control section (10), a monitoring section (20), an interface section (30) and a power control section (40). The media control section (10) drives a recording media and performs data access to the recording media. The monitoring section (20) monitors whether the data access by the media control section (10) can be performed or not. The interface section (30) performs communication with a host device. When the monitoring section (20) detects that the data access can not be performed, the power control section (40) limits power supply to the interface section (30). When the monitoring section (20) detects that the data access can be performed, the power control section (40) re-starts the power supply.

    摘要翻译: 外部存储装置包括媒体控制部分(10),监视部分(20),接口部分(30)和功率控制部分(40)。 媒体控制部分(10)驱动记录媒体并对记录媒体执行数据访问。 监视部(20)监视是否可以执行媒体控制部(10)的数据访问。 接口部(30)与主机进行通信。 当监视部分(20)检测到无法进行数据访问时,电源控制部分(40)限制对接口部分(30)的电力供应。 当监视部分(20)检测到可以执行数据访问时,功率控制部分(40)重新启动电源。

    Hard coating for glass molding and glass molding die having the hard coating
    6.
    发明授权
    Hard coating for glass molding and glass molding die having the hard coating 有权
    用于玻璃成型的硬涂层和具有硬涂层的玻璃模塑模具

    公开(公告)号:US07618719B2

    公开(公告)日:2009-11-17

    申请号:US11555904

    申请日:2006-11-02

    IPC分类号: C03B11/00

    摘要: A hard coating combining excellent mold releasability with respect to glass with excellent durability at high temperature environment of 600° C. or more, and a glass molding die having the hard coating are provided. A glass molding die has a hard coating formed on a molding surface of a base. The hard coating includes one or two of W and V, and B, C and N; wherein when a composition of the coating is expressed as Wa1Va2BbCcNd, 0.1≦a1+a2≦0.5, 0.05≦b≦0.5, 0.02≦c≦0.15, 0.05≦d≦0.5, and a1+a2+b+c+d=1 are given. The hard coating can be formed on the molding surface of the base via an intermediate layer including an amorphous CrSiN film.

    摘要翻译: 提供了在600℃以上的高温环境下具有优异的耐玻璃脱模性的硬质涂层,以及具有硬涂层的玻璃成形模具。 玻璃模具具有形成在基底的模制表面上的硬涂层。 硬涂层包括W和V中的一种或两种,B,C和N; 其中当涂层的组成被表示为Wa1Va2BbCcNd时,0.1 <= a1 + a2 <= 0.5,0.05 <= b <= 0.5,0.02 <= c <0.15,0.05 <= d <= 0.5,a1 + a2 给出+ b + c + d = 1。 可以通过包括非晶CrSiN膜的中间层在基底的模制表面上形成硬涂层。

    Multi-initiator control unit and method

    公开(公告)号:US07164689B2

    公开(公告)日:2007-01-16

    申请号:US09998693

    申请日:2001-12-03

    IPC分类号: H04L12/28

    摘要: The multi-initiator control unit for performing packet-unit communication with each of a plurality of devices connected via a transmission line includes: a packet filter for analyzing a received packet and outputting the results; a plurality of command control circuits each for controlling a command processing sequence performed with the corresponding device; a multi-control circuit for giving sequence execution permission to one of the plurality of command control circuits; and a packet processing circuit for generating a packet containing information output by the permission-given command control circuit and outputting the packet for transmission, and also outputting a received packet according to the analysis results output by the packet filter.

    Packet transmission/reception processor
    10.
    发明授权
    Packet transmission/reception processor 失效
    分组发送/接收处理器

    公开(公告)号:US06977901B2

    公开(公告)日:2005-12-20

    申请号:US09838181

    申请日:2001-04-20

    CPC分类号: H04L12/40071 H04L12/64

    摘要: If a packet processing controller at a consumer node has failed to process a received packet within a predetermined amount of time, a packet processing control timer detects a time-out and informs a CPU of that. In response, the CPU issues packet processing suspend instruction and packet transmit instruction for the controller by way of a register. In accordance with these instructions, the controller suspends the current packet processing and produces header and data for a WRS packet, which is transmitted to a producer node through a bus. In this manner, a packet can be processed without causing a time-out at the producer node.

    摘要翻译: 如果消费者节点处的分组处理控制器在预定时间量内未能处理接收到的分组,则分组处理控制定时器检测到超时并通知CPU。 作为响应,CPU通过寄存器向控制器发出数据包处理挂起指令和数据包发送指令。 根据这些指令,控制器暂停当前分组处理,并产生用于通过总线传送到生产者节点的WRS分组的报头和数据。 以这种方式,可以处理分组而不会在生成器节点处造成超时。