摘要:
A method for fabricating a magnetic head includes forming a first pole and a flux shaping layer in spaced relation to the first pole. A nonmagnetic layer is formed adjacent the flux shaping layer and positioned on an air bearing surface (ABS) side of the flux shaping layer. A tapered recess is created in the nonmagnetic layer, the taper of the recess increasing (i.e., becoming deeper) towards the flux forming layer. The recess is filled with a magnetic material. A probe layer is formed such that it is in electrical communication with the magnetic material filling the recess.
摘要:
A magnetic recording disk drive uses side-by-side read/write heads formed on head carriers that are identical for both top and bottom disk surfaces. Thus, a common head carrier functions as a single manufacturable part usable for both top and bottom disk surfaces. The common head carrier has a trailing end with a pattern of components formed on it that includes three side-by-side transducers (two read elements equally spaced about a center write element) and five terminal pads, one of which is a common pad, and all of the electrical connectors interconnecting the five terminal pads with the three transducers. There are only three terminal pads for the two read elements, with one of the read terminal pads being a common terminal pad that is electrically connected to both read elements. During assembly of the disk drive, the common carrier, when used as the top carrier, has a first read terminal pad and the common terminal pad connected to the leads on the suspension. When used as the bottom carrier, the second read terminal pad and the common terminal pad are connected to the leads on the suspension. Thus, only one carrier common to both top and bottom sides of the disk needs to be manufactured. The uniqueness of the top and bottom carriers is obtained by the wiring connection of the read terminal pads to the leads on the suspensions.
摘要:
A magnetic head assembly includes first and second pole pieces and first and second coil layers wherein the second pole piece has a ferromagnetic pole tip which forms a portion of an air bearing surface and defines a track width of a write head. A write gap layer is located between the first pole piece and the pole tip. A dielectric first insulation layer interfaces first and second side surfaces of the pole tip and is located between the first and second coil layers. The second pole piece has a ferromagnetic second pole piece structure which is magnetically connected to each of the pole tip and the first pole piece and extends across the second coil layer. In a first embodiment the second pole piece structure is a single layer and in a second embodiment the second pole piece structure has front and back components with a flat laminated second pole piece yoke layer located therebetween.
摘要:
A method for fabricating a magnetic head includes forming a first pole and a flux shaping layer in spaced relation to the first pole. A nonmagnetic layer is formed adjacent the flux shaping layer and positioned on an air bearing surface (ABS) side of the flux shaping layer. A tapered recess is created in the nonmagnetic layer, the taper of the recess increasing (i.e., becoming deeper) towards the flux forming layer. The recess is filled with a magnetic material. A probe layer is formed such that it is in electrical communication with the magnetic material filling the recess.
摘要:
A perpendicular recording head has a second pole piece which includes a bottom ferromagnetic shaping layer and a top ferromagnetic probe layer. Each of these layers has a flare point where the layers first commence to widen after the ABS with the flare point of the shaping layer being located between an air bearing surface (ABS) of the head and the flare point of the probe layer. Further, the probe layer has a probe at the ABS which has a decreasing width from its top to its bottom to provide a trapezoidal shape which minimizes side writing due to skew of the probe at outermost and innermost circular tracks of a rotating magnetic disk.
摘要:
A magnetic head assembly includes first and second pole pieces and first and second coil layers wherein the second pole piece has a ferromagnetic pole tip which forms a portion of an air bearing surface and defines a track width of a write head. A write gap layer is located between the first pole piece and the pole tip. A dielectric first insulation layer interfaces first and second side surfaces of the pole tip and is located between the first and second coil layers. The second pole piece has a ferromagnetic second pole piece structure which is magnetically connected to each of the pole tip and the first pole piece and extends across the second coil layer. In a first embodiment the second pole piece structure is a single layer and in a second embodiment the second pole piece structure has front and back components with a flat laminated second pole piece yoke layer located therebetween.
摘要:
A magnetic recording disk drive uses side-by-side read/write heads formed on head carriers that are substantially identical for both top and bottom disk surfaces. Thus, a common head carrier functions as a single manufacturable part usable for both top and bottom disk surfaces. The common head carrier has a trailing end with a pattern of components formed on it that includes three side-by-side transducers and sets of terminal pads. In the read/write/read side-by-side head arrangement, the first element is a center write element, such as an inductive coil, and the second and third elements are read elements, such as magnetoresistive read elements, that are generally equally spaced from the center write element. In common carriers to be used for the top disk surfaces, one of the read elements is electrically connected to the read/write channel of the disk drive, and in common carriers to be used for the bottom disk surfaces, the other read element on the common carrier is electrically connected to the read/write channel. The disk drive thus operates in cylinder mode with side-by-side heads using a common carrier for both top and bottom disk surfaces.
摘要:
A method comprises depositing first and second lead layers in end regions which surround a central region; and forming a read sensor in the central region such that a first edge of the read sensor is disposed above an edge of the first lead layer and a second edge of the read sensor is disposed above an edge of the second lead layer. In one approach, first and second bias layers are deposited in end regions over the first and the second lead layers. The read sensor is formed in the central region such that the first edge of the read sensor is disposed above an edge of the first bias layer and the second edge of the read sensor is disposed above an edge of the second bias layer. Third and fourth bias layers are deposited adjacent the read sensor. Methods taking different approaches are also presented.
摘要:
A method for milling a structure. A single- or multi-layer resist having no undercut is added to a surface of a structure to be milled, the surface to be milled defining a plane. A milling process, such as ion milling, is performed. The milling process includes milling the structure at high incidence and milling the structure at razing incidence. The milling process can be performed only once, or repeated multiple times. High incidence can be defined as about 65 to about 90 degrees from the plane of the surface being milled. Razing incidence can be defined as about 0 to about 30 degrees from the plane of the surface being milled.
摘要:
A method for determining a characteristic of a magnetic head during its fabrication process on the surface of a wafer substrate. The method involves the fabrication of a test magnetic pole artifact in a field area of the substrate surface adjacent to the actual magnetic pole that is being fabricated. A test pole structure is fabricated simultaneously with, and utilizing the same fabrication conditions and parameters as, the actual pole such that the test pole is nearly identical to the actual pole. During a field etch step undertaken in the fabrication of the actual pole, portions of the test pole structure are removed, leaving a test pole artifact on the wafer surface. The test pole artifact can thus be easily measured as an accurate indication of characteristics of the actual magnetic pole that are difficult to measure directly, thereby saving time and expense in the magnetic head fabrication process. This method is particularly suited to determining the width of the base of the P2 pole tip of a magnetic head, where measurement of the base of the actual magnetic head pole tip is made difficult by the presence of the pole tip, and where the test artifact is easily measured because the test pole tip structure has been etched away, leaving only the artifact for measurement.