摘要:
A power-down mode control apparatus includes an internal power-down control block configured to receive a locking completion signal and to generate an internal power-down signal, which is toggled for a predetermined time; a noise check block configured to check occurrence/non-occurrence of noise on the basis of a phase detection signal and to generate a plurality of power-down selection signals in response to the locking completion signal and the internal power-down signal; and a power-down enter control block configured to generate a plurality of power-down enter signals, which instruct individual circuits to enter a power-down mode in response to a reference clock signal, the plurality of power-down selection signals, a power-down mode signal, and the internal power-down signal.
摘要:
An apparatus for setting a test mode in a semiconductor integrated circuit includes a test mode control block that generates a coding control signal according to whether or not a control fuse is cut, and a test mode coding block that sets default values of a multi-bit test code in response to the coding control signal.
摘要:
A power-down mode control apparatus includes an internal power-down control block configured to receive a locking completion signal and to generate an internal power-down signal, which is toggled for a predetermined time; a noise check block configured to check occurrence/non-occurrence of noise on the basis of a phase detection signal and to generate a plurality of power-down selection signals in response to the locking completion signal and the internal power-down signal; and a power-down enter control block configured to generate a plurality of power-down enter signals, which instruct individual circuits to enter a power-down mode in response to a reference clock signal, the plurality of power-down selection signals, a power-down mode signal, and the internal power-down signal.
摘要:
A power-down mode control apparatus includes an internal power-down control block configured to receive a locking completion signal and to generate an internal power-down signal, which is toggled for a predetermined time; a noise check block configured to check occurrence/non-occurrence of noise on the basis of a phase detection signal and to generate a plurality of power-down selection signals in response to the locking completion signal and the internal power-down signal; and a power-down enter control block configured to generate a plurality of power-down enter signals, which instruct individual circuits to enter a power-down mode in response to a reference clock signal, the plurality of power-down selection signals, a power-down mode signal, and the internal power-down signal.
摘要:
An apparatus for setting a test mode in a semiconductor integrated circuit includes a test mode control block that generates a coding control signal according to whether or not a control fuse is cut, and a test mode coding block that sets default values of a multi-bit test code in response to the coding control signal.
摘要:
A DLL circuit includes a duty ratio detection unit that detects a duty ratio of a rising clock and a duty ratio of a falling clock, thereby outputting a duty ratio detection signal. A correction control unit generates a correction control signal in response to the duty ratio detection signal. A duty ratio correction unit corrects a duty ratio of an internal. clock in response to the correction control signal, thereby outputting a reference clock.
摘要:
A duty cycle correcting circuit includes a duty detector that detects a duty ratio of an output clock signal to output a duty detection signal, a variable delay unit that outputs a delay clock signal obtained by variably delaying a input signal according to the duty detection signal, and a pulse width modulating unit that generates a first clock signal that is at a high level when both the input clock signal and the delay clock signal are at a high level and generates a second clock signal that is at a high level when any of the input clock signal and the delay clock signal is at a high level, wherein the pulse width modulating unit selectively outputs the first clock signal or the second clock signal as the output clock signal.
摘要:
A semiconductor memory apparatus includes a delay line configured to delay a reference clock, a first delay block configured to delay a feedback clock, a first phase comparator configured to compare the reference clock with an output of the first delay block, a second delay block configured to delay the reference clock, a second phase comparator configured to compare the feedback clock with an output of the second delay block, a delay controller configured to control a delay amount of the delay line based on comparison results from the first and second phase comparators, a delay model configured to delay an output of the delay line by a modeled delay time to generate the feedback clock, and a locking detector configured to control the delay controller based on comparison results from the first and second phase comparators.
摘要:
A semiconductor memory device includes a delay locked loop for correcting a duty cycle rate of a delay locked clock signal. The semiconductor memory device includes a delay locked circuit, a duty cycle correction circuit, and a clock synchronization circuit. The delay locked circuit outputs a delay locked clock by delaying a system clock by a predetermined time. The duty cycle correction circuit outputs a first clock by correcting a duty cycle of the delay locked clock, wherein the proportion of high to low level periods of the delay locked clock is controlled according to a time difference between a second edge of the first clock and that of a second clock derived from the first clock. The clock synchronization circuit synchronizes a first edge of the first clock with that of the second clock.
摘要:
A delay locked loop (DLL) circuit includes a clock signal dividing unit that can divide a reference clock signal by a predetermined division ratio and generate a division clock signal, a feedback loop that can perform a delay locked operation on the division clock signal and generate a delay clock signal, a half period delay unit that can delay the delay clock signal by a half period of the reference clock signal and generate a half period delay clock signal, and an operation unit that can combine the delay clock signal and the half period delay clock signal and generate an output clock signal.