Abstract:
The present invention provides a system and method of correcting duty cycle (DC) and compensating for active clock edge shift. In an embodiment, the system includes at least one control circuit to receive DCC control signals and to output at least one first adjustment signal, at least one second adjustment signal, at least one first correction signal, and at least one second correction signal, at least one adjustment circuit to change a DC value of an input clock signal, at least one correction circuit to compensate for a shift of an active clock edge of the input clock signal, and where one of the at least one adjustment circuit and the at least one correction circuit is to receive the input clock signal and wherein one of the at least one adjustment circuit and the at least one correction circuit is to transmit a corrected output clock signal.
Abstract:
An example clock delivery system includes a phase-locked loop (PLL) configured to generate a plurality of input clocks, a phase interpolator configured to receive the plurality of input clocks and generate a plurality of output clocks, and a clock data recovery (CDR) circuit configured to receive the plurality of output clocks. The phase interpolator includes a decoder having a plurality of inputs configured to receive binary codes and a respective plurality of outputs configured to output thermometer codes, and a mixer circuitry segmented into a plurality of unit circuits that are enabled or disabled based on bits of the thermometer codes.
Abstract:
An exemplary timing generator includes a coarse delay circuit configured to generate a coarse delayed rising edge signal and a coarse delayed falling edge signal from a reference timing signal; a fine delay circuit configured to generate a fine delayed rising edge signal from the coarse delayed rising edge signal and a fine delayed falling edge signal from the coarse delayed falling edge signal; an edge combiner configured to generate the timing signal based on the fine delayed rising edge signal and the fine delayed falling edge signal; and a masking circuit configured to generate a rising edge masking signal and a falling edge masking signal for controlling when the rising edges and the falling edges of the timing signal are generated.
Abstract:
A memory-like structure composed of variable resistor elements for use in tuning respective branches and leaves of a clock distribution structure, which may be used to compensate for chip-by-chip and/or combinatorial logic path-by-path delay variations, which may be due, for example, to physical variations in deep submicron devices and interconnections, is presented. A single system clocked scan flip-fop with the capability to perform delay test measurements is also presented. Methods for measuring combinatorial logic path delays to determine the maximum clock frequency and delays to program the variable resistors, as well as methods for calibrating and measuring the programmed variable resistors, are also presented.
Abstract:
A semiconductor device capable of accurately controlling the cycle of an internal clock signal. This semiconductor device, by using signal that is output from a sequence register of an asynchronous successive approximation type ADC when N times of comparison are completed, detects whether or not the signal and its delay signal are output when the period transitions from a comparison period to a sampling period, and generates, on the basis of the detection result, a delay control signal for controlling the cycle of an internal clock signal by controlling the delay times of the delay circuits.
Abstract:
A memory-like structure composed of variable resistor elements for use in tuning respective branches and leaves of a clock distribution structure, which may be used to compensate for chip-by-chip and/or combinatorial logic path-by-path delay variations, which may be due, for example, to physical variations in deep submicron devices and interconnections, is presented. A single system clocked scan flip-fop with the capability to perform delay test measurements is also presented. Methods for measuring combinatorial logic path delays to determine the maximum clock frequency and delays to program the variable resistors, as well as methods for calibrating and measuring the programmed variable resistors, are also presented.
Abstract:
Circuits and methods are provided for efficient feed-forward equalization when sample-and-hold circuitry is employed to generate n time-delayed versions of an input data signal to be equalized. To equalize the input data signal, m data signals are input to m feed-forward equalization (FFE) taps of a current-integrating summer circuit, wherein each of the m data signals corresponds to one of the n time-delayed versions of the input data signal. A capacitance is precharged to a precharge level during a reset period of the current-integrating summer circuit. An output current is generated by each of the m FFE taps during an integration period of the current-integrating summer circuit, wherein the output currents from the m FFE taps collectively charge or discharge the capacitance during the integration period. A gating control signal is applied to an FFE tap during the integration period to disable the FFE tap during a portion of the integration period in which the data signal input to the FFE tap is invalid.
Abstract:
Circuits and methods are provided for efficient feed-forward equalization when sample-and-hold circuitry is employed to generate n time-delayed versions of an input data signal to be equalized. To equalize the input data signal, m data signals are input to m feed-forward equalization (FFE) taps of a current-integrating summer circuit, wherein each of the m data signals corresponds to one of the n time-delayed versions of the input data signal. A capacitance is precharged to a precharge level during a reset period of the current-integrating summer circuit. An output current is generated by each of the m FFE taps during an integration period of the current-integrating summer circuit, wherein the output currents from the m FFE taps collectively charge or discharge the capacitance during the integration period. A gating control signal is applied to an FFE tap during the integration period to disable the FFE tap during a portion of the integration period in which the data signal input to the FFE tap is invalid.
Abstract:
A phase interpolator circuit is provided that generates an output clock signal by interpolating between phases of first and second clock signals. Interpolation is performed by detecting an edge of the first clock signal and applying a first current to charge a capacitance of an output node to a voltage level which is less than or equal to a switching threshold of a voltage comparator, and detecting an edge of the second clock signal and applying a second current to charge the capacitance of the output node to a voltage level which exceeds the switching threshold of the voltage comparator. The magnitude of the first current is varied to adjust a timing at which the capacitance of the output node is charged to a voltage level that exceeds the switching threshold of the voltage comparator and to adjust a phase of the output clock signal output from the voltage comparator.
Abstract:
A phase interpolator circuit is provided that generates an output clock signal by interpolating between phases of first and second clock signals. Interpolation is performed by detecting an edge of the first clock signal and applying a first current to charge a capacitance of an output node to a voltage level which is less than or equal to a switching threshold of a voltage comparator, and detecting an edge of the second clock signal and applying a second current to charge the capacitance of the output node to a voltage level which exceeds the switching threshold of the voltage comparator. The magnitude of the first current is varied to adjust a timing at which the capacitance of the output node is charged to a voltage level that exceeds the switching threshold of the voltage comparator and to adjust a phase of the output clock signal output from the voltage comparator.