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公开(公告)号:US11328151B2
公开(公告)日:2022-05-10
申请号:US16631396
申请日:2018-07-16
Applicant: IMEC VZW , Katholieke Universiteit Leuven, KU LEUVEN R&D
Inventor: Yuqian Li , Geert Vanmeerbeeck , Alexandra Dusa
Abstract: Disclosed herein are cell differentiating systems for differentiating cells. The systems comprise an input means for receiving a reconstructed image of a cell based on a holographic image of the cell in suspension, and a cell recognition means for determining cell characterization features from the reconstructed image of the cell for characterization of the cell. The cell recognition means thereby is configured for determining, as cell recognition features, image moments.
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公开(公告)号:US11609172B2
公开(公告)日:2023-03-21
申请号:US17128093
申请日:2020-12-19
Applicant: IMEC VZW
Inventor: Richard Stahl , Abdulkadir Yurt , Ziduo Lin , Geert Vanmeerbeeck , Andy Lambrechts
Abstract: A device for detecting particles in air; said device comprising: a flow channel configured to allow a flow of air comprising particles through the flow channel; a light source configured to illuminate the particles, such that an interference pattern is formed by interference between light being scattered by the particles and non-scattered light from the light source; an image sensor configured to detect incident light, detect the interference pattern, and to acquire a time-sequence of image frames, each image frame comprising a plurality of pixels, each pixel representing a detected intensity of light; and a frame processor configured to filter information in the time-sequence of image frames, wherein said filtering comprises: identifying pixels of interest in the time-sequence of image frames, said pixels of interest picturing an interference pattern potentially representing a particle in the flow of air, and outputting said identified pixels of interest for performing digital holographic reconstruction.
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公开(公告)号:US11175625B2
公开(公告)日:2021-11-16
申请号:US16467612
申请日:2017-12-08
Applicant: IMEC VZW
Inventor: Ziduo Lin , Abdulkadir Yurt , Richard Stahl , Geert Vanmeerbeeck
Abstract: Example embodiments relate to methods and imaging systems for holographic imaging. One embodiment includes a method for holographic imaging of an object. The method includes driving a laser using a current which is below a threshold current of the laser. The method also includes illuminating the object using illumination light output by the laser. Further, the method includes detecting an interference pattern formed by object light, having interacted with the object, and reference light of the illumination light.
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公开(公告)号:US10684589B2
公开(公告)日:2020-06-16
申请号:US15847521
申请日:2017-12-19
Applicant: IMEC vzw
Inventor: Abdulkadir Yurt , Geert Vanmeerbeeck , Richard Stahl , Ziduo Lin
Abstract: An apparatus for in-line holographic imaging is disclosed. In one aspect, the apparatus includes at least a first light source and a second light source arranged for illuminating an object arranged in the apparatus with a light beam. The apparatus also includes an image sensor arranged to detect at least a first and a second interference pattern, wherein the first interference pattern is formed when the object is illuminated by the first light source and the second interference pattern is formed when the object is illuminated by the second light source. The first and second interference patterns are formed by diffracted light, being scattered by the object, and undiffracted light of the light beam. The at least first and second light sources are arranged at different angles in relation to the object, and possibly illuminate the object using different wavelengths.
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公开(公告)号:US10295451B2
公开(公告)日:2019-05-21
申请号:US15738227
申请日:2016-06-28
Applicant: IMEC VZW , Universiteit Gent
Inventor: Bendix Schneider , Peter Bienstman , Joni Dambre , Geert Vanmeerbeeck , Liesbet Lagae
Abstract: A device for extracting at least one object characteristic of an object (106) is presented, the device comprising: a light sensor (101) for recording a hologram of an object and a processing unit (102) coupled to the light sensor and configured for extracting at least one object characteristic from the hologram; wherein the processing unit is configured for extracting the at least one object characteristic from a section of the hologram without reconstructing an image representation of the object. Further, a device (200) for sorting an object (106), a method for identifying an object and a method for sorting objects is presented.
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公开(公告)号:US20180011443A1
公开(公告)日:2018-01-11
申请号:US15545611
申请日:2016-02-04
Applicant: IMEC VZW
Inventor: Richard Stahl , Tom Claes , Xavier Rottenberg , Geert Vanmeerbeeck , Andy Lambrechts
CPC classification number: G03H1/0465 , G01N15/1434 , G01N15/147 , G01N15/1484 , G01N2015/1454 , G02B6/122 , G02B21/0008 , G02B27/0087 , G02B2006/12061 , G03H1/0443 , G03H2001/0447 , G03H2222/34 , G03H2222/35 , G03H2222/53 , H04N5/2256 , H04N5/374
Abstract: Embodiments described herein relate to a large area lens-free imaging device. One example is a lens-free device for imaging one or more objects. The lens-free device includes a light source positioned for illuminating at least one object. The lens-free device also includes a detector positioned for recording interference patterns of the illuminated at least one object. The light source includes a plurality of light emitters that are positioned and configured to create a controlled light wavefront for performing lens-free imaging.
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公开(公告)号:US12196942B2
公开(公告)日:2025-01-14
申请号:US17555792
申请日:2021-12-20
Applicant: IMEC VZW
Inventor: Ziduo Lin , Murali Jayapala , Geert Vanmeerbeeck , Abdulkadir Yurt
IPC: G02B21/36 , G02B21/06 , H01L27/146 , H01L31/0304 , H01L31/0352
Abstract: According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising: an array of light sensitive areas sensitive to detect light spanning a wavelength range of at least 400-1200 nm; at least one light source comprising at least a first point of operation in which the at least one light source is configured to generate visible light, and a second point of operation in which the at least one light source is configured to generate infrared light, and being arranged to illuminate the microscopic object such that light is scattered by the microscopic object; wherein the array of light sensitive areas is configured to detect an interference pattern formed between the scattered light and non-scattered light; the device being configured to be set in a selected point of operation from the at least first and second points of operation, for detecting the interference pattern for imaging the microscopic object at a wavelength defined by the selected point of operation.
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公开(公告)号:US12117342B2
公开(公告)日:2024-10-15
申请号:US17555785
申请日:2021-12-20
Applicant: IMEC VZW
Inventor: Geert Vanmeerbeeck , Ziduo Lin , Murali Jayapala , Abdulkadir Yurt
IPC: G01J3/28
CPC classification number: G01J3/2823 , G01J3/2803 , G01J2003/2826
Abstract: According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising:
an array of light sensitive areas, each being sensitive to detect light spanning a wavelength range of at least 400-1200 nm;
at least one light source configured to generate light at a plurality of wavelengths within the wavelength range, comprising at least one wavelength in a visible part of the wavelength range and at least one wavelength in a short-wave infrared, SWIR, part of the wavelength range, and arranged to illuminate the microscopic object with the generated light such that at least part of the light is scattered by the microscopic object;
wherein the device is configured to transmit the scattered light and non-scattered light, from the same light source, to the array of light sensitive areas configured to detect an interference pattern formed between the scattered light and the non-scattered light, for each wavelength.-
9.
公开(公告)号:US12025567B2
公开(公告)日:2024-07-02
申请号:US17725871
申请日:2022-04-21
Applicant: IMEC VZW
Inventor: Ziduo Lin , Abdulkadir Yurt , Murali Jayapala , Geert Vanmeerbeeck
CPC classification number: G01N21/90 , G01N2021/8845
Abstract: An illumination system and method for illumination of a sample in a container is described herein. In some embodiments, the container includes a defined volume for receiving the sample. The illumination system includes, in some embodiments, at least one light source, a mask comprising an opaque portion, preventing light from passing through the mask, and an at least partially transparent portion, allowing light to pass through the mask. The illumination system can be adapted to be positioned such that the light generated by the light source, passing through the mask, illuminates the sample in the container. The light source and the mask are configured such that a shape, a size, and a position of a projection of the light passing through the mask, onto a plane of a bottom surface of the container, match a shape, a size, and a position of the bottom surface.
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10.
公开(公告)号:US11946850B2
公开(公告)日:2024-04-02
申请号:US17127980
申请日:2020-12-18
Applicant: IMEC VZW
Inventor: Geert Vanmeerbeeck , Ziduo Lin , Abdulkadir Yurt , Richard Stahl , Andy Lambrechts
IPC: G01N15/14 , G01N15/1434 , G03H1/08 , G01N15/06
CPC classification number: G01N15/1434 , G03H1/0866 , G01N15/06 , G01N2015/1454 , G01N2015/1486 , G03H2001/0883
Abstract: A device for detecting particles in air; said device comprising:
a receiver for receiving a flow of air comprising particles;
a particle capturing arrangement configured to transfer the particles from the flow of air to a liquid for collection of a set of particles in the liquid;
a flow channel configured to pass a flow of the liquid comprising the set of particles through the flow channel;
a light source configured to illuminate the set of particles in the flow channel, such that an interference pattern is formed by interference between light being scattered by the set of particles and non-scattered light from the light source; and
an image sensor comprising a plurality of photo-sensitive elements configured to detect incident light, the image sensor being configured to detect the interference pattern.
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