-
公开(公告)号:US10763188B2
公开(公告)日:2020-09-01
申请号:US14998122
申请日:2015-12-23
Applicant: Intel Corporation
Inventor: Aravindha R. Antoniswamy , Thomas John Fitzgerald , Kumaran Murugesan Chakravarthy , Syadwad Jain , Wei Hu , Zhizhong Tang
IPC: H01L23/373 , H01L21/48 , H01L23/367 , H01L23/00
Abstract: Integrated heat spreaders having electromagnetically-formed features, and semiconductor packages incorporating such integrated heat spreaders, are described. In an example, an integrated heat spreader includes a top plate flattened using an electromagnetic forming process. Methods of manufacturing integrated heat spreaders having electromagnetically-formed features are also described.
-
公开(公告)号:US20190027379A1
公开(公告)日:2019-01-24
申请号:US15767126
申请日:2015-11-16
Applicant: Intel Corporation
Inventor: Wei Hu , Aravindha R. Antoniswamy , Thomas J. Fitzgerald , Nikunj P. Patel , Syadwad Jain , Zhizhong Tang , Shrenik Kothari
IPC: H01L21/48 , H01L23/367 , H01L23/373 , H01L23/544 , H01L23/42
Abstract: Disclosed herein are embodiments of sintered heat spreaders with inserts and related devices and methods. In some embodiments, a heat spreader may include: a frame including aluminum and a polymer binder; an insert disposed in the frame, wherein the insert has a thermal conductivity higher than a thermal conductivity of the frame; and a recess having at least one sidewall formed by the frame. The polymer binder may be left over from sintering frame material and insert material to form the heat spreader.
-
公开(公告)号:US08896110B2
公开(公告)日:2014-11-25
申请号:US13801882
申请日:2013-03-13
Applicant: Intel Corporation
Inventor: Wei Hu , Zhizhong Tang , Syadwad Jain , Rajen S. Sidhu
IPC: H01L23/02 , H01L23/373
CPC classification number: H01L23/3736 , H01L23/42 , H01L24/33 , H01L2224/32225 , H01L2224/32245 , H01L2224/33181 , H01L2924/01322 , H01L2924/16251 , H01L2924/00
Abstract: Embodiments of the present disclosure describe techniques and configurations for paste thermal interface materials (TIMs) and their use in integrated circuit (IC) packages. In some embodiments, an IC package includes an IC component, a heat spreader, and a paste TIM disposed between the die and the heat spreader. The paste TIM may include particles of a metal material distributed through a matrix material, and may have a bond line thickness, after curing, of between approximately 20 microns and approximately 100 microns. Other embodiments may be described and/or claimed.
Abstract translation: 本公开的实施例描述了用于糊状热界面材料(TIM)的技术和配置及其在集成电路(IC)封装中的应用。 在一些实施例中,IC封装包括设置在管芯和散热器之间的IC部件,散热器和粘合剂TIM。 糊料TIM可以包括通过基质材料分布的金属材料的颗粒,并且在固化后可以具有在约20微米和约100微米之间的粘合线厚度。 可以描述和/或要求保护其他实施例。
-
公开(公告)号:US08866290B2
公开(公告)日:2014-10-21
申请号:US13836407
申请日:2013-03-15
Applicant: Intel Corporation
Inventor: Zhizhong Tang , Syadwad Jain , Paul R. Start
IPC: H01L23/367 , B29C39/10 , F28F3/00
CPC classification number: H01L23/367 , B29C39/10 , H01L21/4882 , H01L23/3675 , H01L2224/16225 , H01L2224/73253 , H01L2924/15311
Abstract: Embodiments of the present disclosure describe techniques and configurations for molded heat spreaders. In some embodiments, a heat spreader includes a first insert having a first face and a first side, the first face positioned to form a bottom surface of a first cavity, and a second insert having a second face and a second side, the second face positioned to form a bottom surface of a second cavity. The second cavity may have a depth that is different from a depth of the first cavity. The heat spreader may further include a molding material disposed between the first and second inserts and coupled with the first side and the second side, the molding material forming at least a portion of a side wall of the first cavity and at least a portion of a side wall of the second cavity. Other embodiments may be described and/or claimed.
Abstract translation: 本公开的实施例描述了用于模制散热器的技术和配置。 在一些实施例中,散热器包括具有第一面和第一侧的第一插入件,第一面被定位成形成第一腔体的底面,第二插入件具有第二面和第二面,第二面 定位成形成第二腔的底表面。 第二腔可以具有与第一腔的深度不同的深度。 散热器还可以包括设置在第一和第二插入件之间并与第一侧和第二侧耦合的成型材料,模制材料形成第一空腔的侧壁的至少一部分和至少一部分 第二腔的侧壁。 可以描述和/或要求保护其他实施例。
-
公开(公告)号:US11652018B2
公开(公告)日:2023-05-16
申请号:US17343565
申请日:2021-06-09
Applicant: Intel Corporation
Inventor: Dinesh P. R. Thanu , Hemanth K. Dhavaleswarapu , John J. Beatty , Syadwad Jain , Nachiket R. Raravikar
IPC: H01L23/34 , H01L23/367 , H01L23/498 , H01L23/00 , H01L23/31
CPC classification number: H01L23/367 , H01L23/3142 , H01L23/3675 , H01L23/49833 , H01L24/17 , H01L24/81
Abstract: A microelectronic package may be fabricated to include a microelectronic substrate, at least one microelectronic device attached to the microelectronic substrate, a heat dissipation device in thermal contact with at least one microelectronic device and having at least one projection attached to the microelectronic substrate, and at least one standoff extending from the at least one projection, wherein the at least one standoff contacts the microelectronic substrate to control the bond line thickness between the heat dissipation device and at least one microelectronic device and/or to control the bond line thickness of a sealant which may be used to attached the at least one projection to the microelectronic substrate.
-
公开(公告)号:US20210305118A1
公开(公告)日:2021-09-30
申请号:US17343565
申请日:2021-06-09
Applicant: Intel Corporation
Inventor: Dinesh P. R. Thanu , Hemanth K. Dhavaleswarapu , John J. Beatty , Syadwad Jain , Nachiket R. Raravikar
IPC: H01L23/367 , H01L23/498 , H01L23/00 , H01L23/31
Abstract: A microelectronic package may be fabricated to include a microelectronic substrate, at least one microelectronic device attached to the microelectronic substrate, a heat dissipation device in thermal contact with at least one microelectronic device and having at least one projection attached to the microelectronic substrate, and at least one standoff extending from the at least one projection, wherein the at least one standoff contacts the microelectronic substrate to control the bond line thickness between the heat dissipation device and at least one microelectronic device and/or to control the bond line thickness of a sealant which may be used to attached the at least one projection to the microelectronic substrate.
-
公开(公告)号:US10969840B2
公开(公告)日:2021-04-06
申请号:US15768915
申请日:2015-11-16
Applicant: Intel Corporation
Inventor: Aravindha R. Antoniswamy , Syadwad Jain , Zhizhong Tang , Wei Hu
IPC: G06F1/20 , H01L21/48 , H01L23/40 , H01L23/373 , H01L23/367 , H01L23/36
Abstract: Disclosed herein are embodiments of heat spreaders with interlocked inserts, and related devices and methods. In some embodiments, a heat spreader may include: a frame formed of a first material, wherein the frame includes an opening, a projection of the frame extends into the opening, and the projection has a top surface, a side surface, and a bottom surface; a recess having at least one sidewall formed by the frame; and an insert formed of a second material different from the first material, wherein the insert is disposed in the frame and in contact with the top surface, the side surface, and the bottom surface of the projection.
-
8.
公开(公告)号:US20190067153A1
公开(公告)日:2019-02-28
申请号:US15689463
申请日:2017-08-29
Applicant: Intel Corporation
Inventor: Dinesh P. R. Thanu , Hemanth K. Dhavaleswarapu , John J. Beatty , Syadwad Jain , Nachiket R. Raravikar
IPC: H01L23/367 , H01L23/498 , H01L23/00 , H01L23/31
Abstract: A microelectronic package may be fabricated to include a microelectronic substrate, at least one microelectronic device attached to the microelectronic substrate, a heat dissipation device in thermal contact with at least one microelectronic device and having at least one projection attached to the microelectronic substrate, and at least one standoff extending from the at least one projection, wherein the at least one standoff contacts the microelectronic substrate to control the bond line thickness between the heat dissipation device and at least one microelectronic device and/or to control the bond line thickness of a sealant which may be used to attached the at least one projection to the microelectronic substrate.
-
公开(公告)号:US11062970B2
公开(公告)日:2021-07-13
申请号:US15689463
申请日:2017-08-29
Applicant: Intel Corporation
Inventor: Dinesh P. R. Thanu , Hemanth K. Dhavaleswarapu , John J. Beatty , Syadwad Jain , Nachiket R. Raravikar
IPC: H01L23/34 , H01L23/367 , H01L23/498 , H01L23/00 , H01L23/31
Abstract: A microelectronic package may be fabricated to include a microelectronic substrate, at least one microelectronic device attached to the microelectronic substrate, a heat dissipation device in thermal contact with at least one microelectronic device and having at least one projection attached to the microelectronic substrate, and at least one standoff extending from the at least one projection, wherein the at least one standoff contacts the microelectronic substrate to control the bond line thickness between the heat dissipation device and at least one microelectronic device and/or to control the bond line thickness of a sealant which may be used to attached the at least one projection to the microelectronic substrate.
-
公开(公告)号:US10651108B2
公开(公告)日:2020-05-12
申请号:US15197440
申请日:2016-06-29
Applicant: Intel Corporation
Inventor: Zhizhong Tang , Syadwad Jain , Wei Hu , Michael A. Schroeder , Rajen S. Sidhu , Carl L. Deppisch , Patrick Nardi , Kelly P. Lofgreen , Manish Dubey
IPC: H05K5/00 , H01L23/373 , H01L23/498 , H01L23/00 , H01L23/42 , F28F13/00 , F28F21/04 , F28F21/02 , F28F21/08 , F28D21/00
Abstract: Devices and methods disclosed herein can include a conductive foam having pores disposed within the conductive foam. The conductive foam can be compressible between an uncompressed thickness and a compressed thickness. The compressed thickness can be ninety-five percent or less of the uncompressed thickness. In one example, a filler can be disposed in the pores of the conductive foam. The filler can include a first thermal conductivity. The first thermal conductivity can be greater than a thermal conductivity of air.
-
-
-
-
-
-
-
-
-