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公开(公告)号:US20090257275A1
公开(公告)日:2009-10-15
申请号:US12082181
申请日:2008-04-09
IPC分类号: G11C11/00
CPC分类号: G11C13/0069 , G11C13/0004 , G11C13/0061 , G11C2013/009 , G11C2013/0092 , G11C2213/77
摘要: A seasoned phase change memory has been subjected to a longer pulse to adjust resistance levels prior to use of the phase change memory.
摘要翻译: 在使用相变存储器之前,经验丰富的相变存储器已经经受更长的脉冲以调整电阻水平。
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公开(公告)号:US08228722B2
公开(公告)日:2012-07-24
申请号:US13107125
申请日:2011-05-13
IPC分类号: G11C11/00
CPC分类号: G11C13/0061 , G11C7/04 , G11C13/0004 , G11C13/0069 , G11C2013/0078 , G11C2013/0092 , G11C2213/77 , Y10S977/754
摘要: A phase change memory in the reset state may be heated to reduce or eliminate electrical drift.
摘要翻译: 可以加热复位状态的相变存储器以减少或消除电漂移。
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公开(公告)号:US20110210300A1
公开(公告)日:2011-09-01
申请号:US13107125
申请日:2011-05-13
IPC分类号: H01L45/00
CPC分类号: G11C13/0061 , G11C7/04 , G11C13/0004 , G11C13/0069 , G11C2013/0078 , G11C2013/0092 , G11C2213/77 , Y10S977/754
摘要: A phase change memory in the reset state may be heated to reduce or eliminate electrical drift.
摘要翻译: 可以加热复位状态的相变存储器以减少或消除电漂移。
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公开(公告)号:US20090244963A1
公开(公告)日:2009-10-01
申请号:US12080006
申请日:2008-03-31
IPC分类号: G11C11/00
CPC分类号: G11C13/0069 , G11C11/5678 , G11C13/0004 , G11C2013/0078 , G11C2013/0092
摘要: A multilevel phase change memory cell may have a plurality of intermediate levels between a set and a reset or a crystalline and amorphous states. These intermediate levels between set and reset may be differentiated not only by programming current, but also by different programming pulse widths. As a result, the intermediate states may be positioned, on the programming current versus programming pulse width curve, in regions of common resistance with a relatively large range of programming current.
摘要翻译: 多电平相变存储单元可以具有集合和复位之间的多个中间电平或晶体和非晶态。 可以通过编程电流,也可以通过不同的编程脉冲宽度来区分设置和复位之间的这些中间电平。 结果,中间状态可以在编程电流与编程脉冲宽度曲线上在具有相对大的编程电流范围的公共电阻的区域中定位。
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5.
公开(公告)号:US07990761B2
公开(公告)日:2011-08-02
申请号:US12080001
申请日:2008-03-31
申请人: George Gordon , Semyon D. Savransky , Ward Parkinson , Sergey A. Kostylev , James Reed , Tyler Lowrey , Ilya V. Karpov , Gianpaolo Spadini
发明人: George Gordon , Semyon D. Savransky , Ward Parkinson , Sergey A. Kostylev , James Reed , Tyler Lowrey , Ilya V. Karpov , Gianpaolo Spadini
IPC分类号: G11C11/00
CPC分类号: G11C13/0033 , G11C8/10 , G11C11/5678 , G11C13/0004 , G11C13/003 , G11C13/0035 , G11C13/004 , G11C13/0061 , G11C13/0069 , G11C16/3431 , G11C29/04 , G11C2013/0052 , G11C2013/0078 , G11C2013/0092 , G11C2213/76
摘要: Disturb from the reset to the set state may be reduced by creating an amorphous phase that is substantially free of crystal nuclei when programming the reset state in a phase change memory. In some embodiments, this can be achieved by using a current or a voltage to program that exceeds the threshold voltage of the phase change memory element, but does not exceed a safe current voltage which would cause a disturb.
摘要翻译: 通过在对相变存储器中的复位状态进行编程时产生基本上不含结晶核的非晶相,可以减小从复位到设定状态的干扰。 在一些实施例中,这可以通过使用超过相变存储元件的阈值电压的电流或电压来实现,但不超过将导致干扰的安全电流电压来实现。
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公开(公告)号:US20090244964A1
公开(公告)日:2009-10-01
申请号:US12080021
申请日:2008-03-31
IPC分类号: G11C11/21
CPC分类号: G11C13/0061 , G11C7/04 , G11C13/0004 , G11C13/0069 , G11C2013/0078 , G11C2013/0092 , G11C2213/77 , Y10S977/754
摘要: A phase change memory in the reset state may be heated to reduce or eliminate electrical drift.
摘要翻译: 可以加热复位状态的相变存储器以减少或消除电漂移。
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7.
公开(公告)号:US20090244962A1
公开(公告)日:2009-10-01
申请号:US12080001
申请日:2008-03-31
申请人: George Gordon , Semyon D. Savransky , Ward Parkinson , Sergey A. Kostylev , James Reed , Tyler Lowrey , Ilya V. Karpov , Gianpaolo Spadini
发明人: George Gordon , Semyon D. Savransky , Ward Parkinson , Sergey A. Kostylev , James Reed , Tyler Lowrey , Ilya V. Karpov , Gianpaolo Spadini
IPC分类号: G11C11/00
CPC分类号: G11C13/0033 , G11C8/10 , G11C11/5678 , G11C13/0004 , G11C13/003 , G11C13/0035 , G11C13/004 , G11C13/0061 , G11C13/0069 , G11C16/3431 , G11C29/04 , G11C2013/0052 , G11C2013/0078 , G11C2013/0092 , G11C2213/76
摘要: Disturb from the reset to the set state may be reduced by creating an amorphous phase that is substantially free of crystal nuclei when programming the reset state in a phase change memory. In some embodiments, this can be achieved by using a current or a voltage to program that exceeds the threshold voltage of the phase change memory element, but does not exceed a safe current voltage which would cause a disturb.
摘要翻译: 通过在对相变存储器中的复位状态进行编程时产生基本上不含结晶核的非晶相,可以减小从复位到设定状态的干扰。 在一些实施例中,这可以通过使用超过相变存储元件的阈值电压的电流或电压来实现,但不超过将导致干扰的安全电流电压来实现。
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公开(公告)号:US08462546B2
公开(公告)日:2013-06-11
申请号:US13531689
申请日:2012-06-25
IPC分类号: G11C11/00
CPC分类号: G11C13/0061 , G11C7/04 , G11C13/0004 , G11C13/0069 , G11C2013/0078 , G11C2013/0092 , G11C2213/77 , Y10S977/754
摘要: A phase change memory in the reset state may be heated to reduce or eliminate electrical drift.
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公开(公告)号:US08076664B2
公开(公告)日:2011-12-13
申请号:US12004257
申请日:2007-12-20
CPC分类号: H01L45/1293 , G11C13/0004 , H01L45/06 , H01L45/1233 , H01L45/126 , H01L45/144 , H01L45/1683
摘要: A phase change memory may be formed with an insulator made up of two different layers having significantly different thermal conductivities. Pores may be formed within the stack of insulating layers and the pores may be filled with heaters, chalcogenide layers, and electrodes in some embodiments. The use of the two different insulator layers enables embodiments where thermal losses may be reduced and an amorphous region may be maintained along the entire length of the phase change material layer.
摘要翻译: 相变存储器可以由具有明显不同热导率的两个不同层构成的绝缘体形成。 在一些实施例中,可以在绝缘层的堆叠内形成孔,并且孔可以用加热器,硫族化物层和电极填充。 使用两个不同的绝缘体层可实现其中可以减少热损失的实施例,并且可以沿着相变材料层的整个长度保持非晶区域。
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10.
公开(公告)号:US20110240943A1
公开(公告)日:2011-10-06
申请号:US13158565
申请日:2011-06-13
申请人: George Gordon , Semyon D. Savransky , Ward Parkinson , Sergey A. Kostylev , James Reed , Tyler Lowrey , Ilya V. Karpov , Gianpaolo Spadini
发明人: George Gordon , Semyon D. Savransky , Ward Parkinson , Sergey A. Kostylev , James Reed , Tyler Lowrey , Ilya V. Karpov , Gianpaolo Spadini
IPC分类号: H01L45/00
CPC分类号: G11C13/0033 , G11C8/10 , G11C11/5678 , G11C13/0004 , G11C13/003 , G11C13/0035 , G11C13/004 , G11C13/0061 , G11C13/0069 , G11C16/3431 , G11C29/04 , G11C2013/0052 , G11C2013/0078 , G11C2013/0092 , G11C2213/76
摘要: Disturb from the reset to the set state may be reduced by creating an amorphous phase that is substantially free of crystal nuclei when programming the reset state in a phase change memory. In some embodiments, this can be achieved by using a current or a voltage to program that exceeds the threshold voltage of the phase change memory element, but does not exceed a safe current voltage which would cause a disturb.
摘要翻译: 通过在对相变存储器中的复位状态进行编程时产生基本上不含结晶核的非晶相,可以减小从复位到设定状态的干扰。 在一些实施例中,这可以通过使用超过相变存储元件的阈值电压的电流或电压来实现,但不超过将导致干扰的安全电流电压来实现。
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