SSD WITH REDUCED SECURE ERASE TIME AND ENDURANCE STRESS

    公开(公告)号:US20200273525A1

    公开(公告)日:2020-08-27

    申请号:US16874242

    申请日:2020-05-14

    Abstract: An embodiment of an electronic apparatus may include one or more substrates, and logic coupled to the one or more substrates, the logic to set an erase voltage for a first block of a persistent storage media to a default erase voltage, determine if the first block of the persistent storage media is identified for a secure erase operation, and set the erase voltage for the first block of the persistent storage media to a shallow erase voltage if the first block of the persistent storage media is identified for the secure erase operation, where the shallow erase voltage corresponds to a weaker erase operation relative to the default erase voltage. Other embodiments are disclosed and claimed.

    SSD with reduced secure erase time and endurance stress

    公开(公告)号:US11462273B2

    公开(公告)日:2022-10-04

    申请号:US16874242

    申请日:2020-05-14

    Abstract: An embodiment of an electronic apparatus may include one or more substrates, and logic coupled to the one or more substrates, the logic to set an erase voltage for a first block of a persistent storage media to a default erase voltage, determine if the first block of the persistent storage media is identified for a secure erase operation, and set the erase voltage for the first block of the persistent storage media to a shallow erase voltage if the first block of the persistent storage media is identified for the secure erase operation, where the shallow erase voltage corresponds to a weaker erase operation relative to the default erase voltage. Other embodiments are disclosed and claimed.

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