摘要:
An integrated circuit containing a data processing system with a number of external peripheral pins utilizes the peripheral pins for both testing the corresponding peripherals and for parallel testing of other complex functions in a MCU. The MCU has a plurality of test modes that can be selected, with different peripheral pins being connected to a test circuit depending on which test mode is selected. This allows testing of peripherals via their corresponding pins, as well as other complex functions without the necessity of having dedicated test pins.
摘要:
Systems and methods for electronically converting an analog signal to a digital signal are disclosed. The systems and methods may include, for a first bit value, setting a first conversion value to include a first offset; using the output of a first comparison, setting a second conversion value; and if the first bit value has a predetermined relationship to the first offset bit value, removing the first offset from the second conversion value, and, using the output of a second comparison, setting a third conversion value.
摘要:
A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.
摘要:
A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.
摘要:
A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided.
摘要:
A method and apparatus for preventing a data processing system (10) from entering a non-recoverable state. In one form, the present invention uses a pin (40) to indicate whether or not the execution of a non-recoverable instruction is legal. If the pin indicates that the execution of the instruction is legal, then the instruction is executed and the data processing system (10) is placed into a state that requires an external stimulus in order to recover. If the pin indicates that the execution of the instruction is illegal, then the instruction is not permitted to place the data processing system (10) into a state that requires an external stimulus in order to recover. Instead, an internal recovery mechanism is provided which returns the data processing system (10) to normal processing.
摘要:
A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.
摘要:
A measurement circuit and method for measuring a quiescent current of a circuit under test are provided. The measurement circuit comprises: a comparator having a first input terminal for receiving a reference voltage, a second input terminal coupled to the circuit under test, and an output terminal; a current source having a first terminal coupled to a first power supply voltage terminal, and a second terminal for providing a current to the circuit under test; a first switch having a first terminal coupled to the second terminal of the current source, a second terminal coupled to the circuit under test, and a control terminal coupled to the output terminal of the comparator; and a first counter having a first input terminal coupled to the output terminal of the comparator, a second input terminal for receiving a clock signal, and an output terminal for providing a first counter value associated with the quiescent current.
摘要:
A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided.
摘要:
An integrated circuit may be initialized by determining that the supply voltage is ramping up and resetting logic in the integrated circuit to a predetermined initial state using a reset signal. After the logic is determined to be in its initial state and the supply voltage is established, the reset signal may be latched off.