摘要:
A nitride semiconductor device is provided. In the device, first and second conductivity type nitride layers are formed. An active layer is formed between the first and second conductivity type nitride layers. The active layer includes at least one quantum barrier layer and at least one quantum well layer. Also, a current spreading layer is interposed between the first conductivity type nitride layer and the active layer. The current spreading layer has an In content greater than the quantum well layer of the active layer.
摘要:
A method for growing a high quality indium gallium nitride by metal organic chemical vapor deposition (MOCVD) is provided. In the method, the indium gallium nitride grows at a growth rate of at least about 1.5 nm/min at a temperature of at least about 800° C. while an internal pressure of an MOCVD reactor is maintained at about 400 mbar or less.
摘要:
A metal wiring for a semiconductor device and a method for forming the same are provided. The metal wiring includes a first insulating layer and a second insulating layer; an interlayer insulating film formed between the first and second insulating layers, wherein the interlayer insulating film is provided with holes having a designated shape; a barrier metal layer, a copper seed layer, and a copper layer sequentially formed in the holes of the interlayer insulating film; and a capping layer formed between the interlayer insulating film and the second insulating layer. The capping layer formed between the interlayer insulating film and the second insulating layer may be made of a negatively charged insulating material, thereby improving electro-migration characteristics at an interface between the capping layer and the copper layers.
摘要:
A method of detecting misalignment of ion implantation areas comprises forming at least one standard pattern consisting of a first area and a second area for use in measuring resistance, implanting first and second conduction type impurity ions into the first and second areas, respectively, and measuring a resistance of the standard pattern. The method also includes forming a misalignment inspection pattern consisting of a first area and a second area on a predetermined area within a semiconductor substrate, implanting first and second conduction type impurity ions into the misalignment inspection pattern and active regions on the semiconductor substrate, respectively, and measuring a resistance of the misalignment inspection pattern. The method concludes by comparing the resistance of the standard pattern with the resistance of the misalignment inspection pattern.
摘要:
A patch-type extrinsic Fabry-Perot interferometric fiber optic sensor and a real-time structural vibration monitoring method using the same are disclosed. The patch-type extrinsic Fabry-Perot interferometric fiber optic sensor is provided by combining the existing EFPI (Extrinsic Fabry-Perot Interferometer) fiber optic sensor with a direction-detecting sensor which can acquire direction information of a strain of a structure, which can solve a signal distortion problem occurring in the existing EFPI fiber optic sensor through a simple signal process. The patch-type extrinsic Fabry-Perot interferometric fiber optic sensor includes a piezoelectric material which can apply a control force to the existing EFPI fiber optic sensor, and a self-sensing bridge circuit for extracting the direction information when the piezoelectric material is used as an actuator, so that the sensible range of strain can be extended and the piezoelectric material can directly be used as the actuator based on the sensed signal.
摘要:
A GaN-based LED comprises a substrate; an an-type GaN layer formed on the substrate; an active layer formed on a predetermined region of the n-type GaN layer; a p-type GaN layer formed on the active layer; a transparent electrode formed on the p-type GaN layer; a p-electrode formed on the transparent electrode; an n-type electrode formed on the n-type GaN layer on which the active layer is not formed; and a protective film formed on a resulting structure between the transparent electrode and the n-type electrode, the protective film being composed of a plasma-oxidized transparent layer.
摘要:
An air discharge apparatus usable with an air conditioner includes a body formed with a suction opening and a discharge opening, a blowing fan arranged in the body to circulate air, and a partition to separate a suction path defined between the suction opening and the blowing fan from a discharge path defined between the blowing fan and the discharge opening. The partition has a vortex-restraint portion, which protrudes into the discharge path to occupy a portion of a bottom region of the cross sectional area of the discharge path, thereby serving to prevent generation of a vortex of air in the discharge path.
摘要:
Embodiments of a computer system, and a software installation method thereof are described. An embodiment of a computer system can include a system for installing an O/S (Operating/System) and a part of system software; a storage unit for storing a plurality of system software, which can be installed depending on various O/Ses or devices; and a controlling unit for selectively installing system software, which is required for the system, among the stored plurality of system software.
摘要:
An air purifier includes a bell-mouth having an enhanced structure to prevent an increase of noise at a particular frequency when air flows into the blowing fan through the bell-mouth. The air purifier includes a housing, a filter unit and a blowing fan placed inside the housing, and a bell-mouth placed toward an intake side of the blowing fan. The bell-mouth includes an inlet port formed at a center of the bell-mouth, a flow guide extending from a periphery of the inlet port toward the blowing fan, and a flat section positioned to discontinue the flow guide to increase a distance between the blowing fan and the bell-mouth. The flat section is formed at the section in the range of about 240°˜330° with respect to a starting point of a scroll inside the bell-mouth. The flat section may have a saw-tooth shape to effectively distribute air passing therethrough.
摘要:
A method of fabricating a metal interconnection of semiconductor device is disclosed. A metal interconnection fabricating method according to the present invention comprises the steps of depositing a metal layer on a substrate having a predetermined structure; patterning a bottom metal layer through etching the metal layer; forming a pad electrically connecting the bottom metal layer to a scribe area; forming an insulating layer on the substrate including the bottom metal layer; forming a via hole and a trench, in which an upper metal layer is formed, on the insulating layer, the via hole connecting the bottom metal layer with the upper metal layer; forming a plating layer by means of electroplating; and performing a planarization process for the plating layer. Accordingly, the present invention needs not a separate seed layer because the bottom metal layer is used as a seed layer. In addition, the present invention can enhance device reliability by reducing electro-migration and stress-migration because the copper is uniformly grown from the bottom in one direction thereby completely filling the contact hole.