公开(公告)号：US20060285081A1

公开(公告)日：2006-12-21

申请号：US11336789

申请日：2006-01-23

申请人： Joon-seok Moon ,  Sang-il Park ,  Alexel Borodouline

发明人： Joon-seok Moon ,  Sang-il Park ,  Alexel Borodouline

IPC分类号： G03B21/28

CPC分类号： G03B21/28

摘要： A portable rear projection apparatus includes a lens element for magnifying an image projected from a projector, an aspherical mirror for reflecting the image magnified by the lens element to change a light path, a screen for displaying the image reflected from the aspherical mirror, and a movable screen support for supporting the screen.

摘要翻译： 便携式背投装置包括用于放大从投影仪投影的图像的透镜元件，用于反射由透镜元件放大的图像以改变光路的非球面镜，用于显示从非球面镜反射的图像的屏幕，以及 可移动屏幕支持支持屏幕。

公开(公告)号：US20100037360A1

公开(公告)日：2010-02-11

申请号：US12569680

申请日：2009-09-29

申请人： Hyeong Chan JO ,  Hong Jae Lim ,  Seung Jun Shin ,  Joon Hui Kim ,  Yong Seok Kim ,  Sang-il Park

发明人： Hyeong Chan JO ,  Hong Jae Lim ,  Seung Jun Shin ,  Joon Hui Kim ,  Yong Seok Kim ,  Sang-il Park

IPC分类号： G01Q70/02 ,  G01Q70/00

CPC分类号： G01Q70/02

摘要： An automatic probe exchange system for a scanning probe microscope (SPM) exchanges probes between a probe mount on the SPM and a probe mount on a probe tray based on differential magnetic force. When the magnetic force on the SPM side is greater, the probe is attached to the probe mount on the SPM. When the magnetic force on the probe tray side is greater, the probe is attached to the probe mount on the probe tray. The magnetic force on the probe tray side is varied by moving the magnets that generate the magnetic force on the probe tray side closer to or further from the probe.

摘要翻译： 用于扫描探针显微镜（SPM）的自动探针交换系统基于差分磁力在SPM上的探针安装座与探针托盘上的探针支架之间交换探头。 当SPM侧的磁力较大时，探头连接到SPM上的探头安装座上。 当探头托架侧的磁力较大时，探头将连接到探头托盘上的探头安装座上。 探头托盘侧的磁力通过移动产生磁力的磁铁在探头托盘一侧靠近或远离探头而变化。

公开(公告)号：US20080073519A1

公开(公告)日：2008-03-27

申请号：US11591794

申请日：2006-11-01

申请人： Hyun Seung Shin ,  Young Doo Kim ,  Yong Seok Kim ,  Sang-il Park

发明人： Hyun Seung Shin ,  Young Doo Kim ,  Yong Seok Kim ,  Sang-il Park

IPC分类号： G01N23/00

CPC分类号： G01Q30/06 ,  G01Q10/06

摘要： Provided are a scanning probe microscope (SPM) that prevents a distortion of an image caused by alignment errors of scanners and a method of measuring a sample using the same. The scanning probe microscope comprises a probe; a first scanner changing a position of the probe along a straight line; a second scanner changing a position of a sample in a plane; and an adjusting device adjusting a position of the second scanner or the first scanner so that the straight line where the position of the probe is changed using the first scanner is perpendicular to the plane in which the position of the sample is changed using the second scanner.

摘要翻译： 提供了一种扫描探针显微镜（SPM），其防止由扫描仪的对准误差引起的图像变形，以及使用其的测量样品的方法。 扫描探针显微镜包括探针; 第一扫描器沿着直线改变探头的位置; 第二扫描器改变样品在平面中的位置; 以及调节装置，其调节所述第二扫描器或所述第一扫描器的位置，使得使用所述第一扫描仪改变所述探针的位置的所述直线垂直于所述样本的位置使用所述第二扫描器改变的平面 。

公开(公告)号：US20050119879A1

公开(公告)日：2005-06-02

申请号：US10997966

申请日：2004-11-29

申请人： Ho-young Sung ,  Sang-il Park

发明人： Ho-young Sung ,  Sang-il Park

IPC分类号： H04R3/00 ,  G10L21/02 ,  G10L19/14

CPC分类号： G10L21/02 ,  G10L21/0232

摘要： A method and apparatus to compensate for imperfections in a sound field includes determining a frequency-response characteristic of a test signal, extracting a difference spectrum by filtering the frequency-response characteristic on different octave band scales, detecting frequency parameters of peak and dip components that deviate from a critical value in the difference spectrum, and calculating filter coefficients from the frequency parameters to filter an input audio signal.

摘要翻译： 补偿声场缺陷的方法和装置包括确定测试信号的频率响应特性，通过对不同倍频程频带尺度上的频率响应特性进行滤波来提取差分频谱，检测峰值和倾角分量的频率参数， 偏离差分频谱中的临界值，并根据频率参数计算滤波器系数以滤波输入音频信号。

公开(公告)号：US20050116228A1

公开(公告)日：2005-06-02

申请号：US11029335

申请日：2005-01-06

申请人： Sang-il Park ,  Kyung-jin Yoo ,  Kyu-hwan Choi

发明人： Sang-il Park ,  Kyung-jin Yoo ,  Kyu-hwan Choi

IPC分类号： H01L29/786 ,  H01L21/336 ,  H01L21/77 ,  H01L21/84 ,  H01L27/12 ,  H01L29/49 ,  H01L31/036

CPC分类号： H01L27/124 ,  H01L27/12 ,  H01L29/4908 ,  H01L29/66757

摘要： A method of manufacturing a thin film transistor includes forming a semiconductor layer on a substrate; forming a gate insulating layer over the entire surface of the substrate to cover the semiconductor layer; depositing a conductive layer on the gate insulating layer; forming a first photosensitive pattern over the conductive layer; patterning the conductive layer according to the photosensitive pattern to form a gate electrode; and ion-doping an impurity into the semiconductor layer using the photosensitive pattern as a mask to form source and drain regions.

公开(公告)号：US08402560B2

公开(公告)日：2013-03-19

申请号：US12773587

申请日：2010-05-04

申请人： Sang-il Park ,  Hanaul Noh

发明人： Sang-il Park ,  Hanaul Noh

IPC分类号： G01Q10/00

CPC分类号： G01Q10/065

摘要： A scanning probe microscope compensates for relative drift between its upper structure that includes a probe and a scanner that scans the probe in a straight line and a lower structure that includes a sample stage and a scanner that scans the sample stage in a plane. A light beam from the upper structure is initially aligned with a center of a position sensitive photo detector (PSPD) disposed on the lower structure at a predetermined position of the sample stage and any subsequent misalignments of the light beam with the center of the PSPD at the predetermined position of the sample stage are determined to be caused by drift and compensated by the scanning probe microscope.

摘要翻译： 扫描探针显微镜补偿其上部结构之间的相对漂移，其包括探针和扫描仪，扫描仪以直线扫描探针，下部结构包括扫描样品台和平面扫描仪的扫描仪。 来自上部结构的光束最初与设置在样品台的预定位置处的下部结构上的位置敏感光电检测器（PSPD）的中心对准，并且光束与PSPD的中心的任何随后的未对准 确定样品台的预定位置是由漂移引起的并由扫描探针显微镜进行补偿。

公开(公告)号：US07709791B2

公开(公告)日：2010-05-04

申请号：US11872614

申请日：2007-10-15

申请人： Hyeong Chan Jo ,  Hong Jae Lim ,  Seung Jun Shin ,  Joon Hui Kim ,  Yong Seok Kim ,  Sang-il Park

发明人： Hyeong Chan Jo ,  Hong Jae Lim ,  Seung Jun Shin ,  Joon Hui Kim ,  Yong Seok Kim ,  Sang-il Park

IPC分类号： G01N23/00 ,  G21K7/00

CPC分类号： G01Q70/02

摘要： Provided is a scanning probe microscope (SPM), a probe of which can be automatically replaced and the replacement probe can be attached onto an exact position. The SPM includes a first scanner that has a carrier holder, and changes a position of the carrier holder in a straight line; a second scanner changing a position of a sample on a plane; and a tray being able to store a spare carrier and a spare probe attached to the spare carrier. The carrier holder includes a plurality of protrusions.

摘要翻译： 提供了一种扫描探针显微镜（SPM），其探头可以自动更换，更换探头可以安装到精确位置。 SPM包括具有承载架的第一扫描器，并且将载体保持器的位置改变为直线; 第二扫描仪改变样品在平面上的位置; 以及托盘，其能够存储备用载体和附接到备用载体的备用探头。 承载架包括多个突起。

公开(公告)号：US06945100B2

公开(公告)日：2005-09-20

申请号：US10748827

申请日：2003-12-29

申请人： Joonhyung Kwon ,  Young Seok Kim ,  Sang-il Park

发明人： Joonhyung Kwon ,  Young Seok Kim ,  Sang-il Park

IPC分类号： G01B21/30 ,  G01Q10/02 ,  G01Q10/04 ,  G01Q20/02 ,  G01Q30/00 ,  G01Q60/32 ,  G01Q60/38 ,  G01Q70/02 ,  G01Q70/10 ,  H01J37/26 ,  G01N13/16 ,  G01B5/28

CPC分类号： G01Q20/02 ,  G01Q10/02 ,  G01Q10/04 ,  G01Q70/02 ,  Y10S977/732 ,  Y10S977/849 ,  Y10S977/869 ,  Y10S977/87 ,  Y10S977/873 ,  Y10S977/881

摘要： A mounting mechanism for the probe tip of a Scanning Probe Microscope (SPM) includes a scanner supported by a stationary frame, and a kinematic mechanism supported by the scanner. The kinematic mechanism includes at least three protrusions and at least one magnet. The mounting mechanism for the probe tip also includes a chip mount having a hole, a slot and a flat surface. The chip mount, on being held by the magnet, provides an easy way to mount the probe tip without requiring any tools.

摘要翻译： 用于扫描探针显微镜（SPM）的探针尖端的安装机构包括由固定框架支撑的扫描仪和由扫描仪支撑的运动机构。 运动机构包括至少三个突起和至少一个磁体。 用于探针尖端的安装机构还包括具有孔，槽和平坦表面的芯片安装件。 由磁体保持的芯片安装座提供了一种简单的方法来安装探针尖端，而不需要任何工具。

公开(公告)号：US06875644B2

公开(公告)日：2005-04-05

申请号：US10166367

申请日：2002-06-11

申请人： Sang-il Park ,  Kyung-jin Yoo ,  Kyu-hwan Choi

发明人： Sang-il Park ,  Kyung-jin Yoo ,  Kyu-hwan Choi

IPC分类号： H01L29/786 ,  H01L21/336 ,  H01L21/77 ,  H01L21/84 ,  H01L27/12 ,  H01L29/49

CPC分类号： H01L27/124 ,  H01L27/12 ,  H01L29/4908 ,  H01L29/66757

摘要： A method of manufacturing a thin film transistor includes forming a semiconductor layer on a substrate; forming a gate insulating layer over the entire surface of the substrate to cover the semiconductor layer; depositing a conductive layer on the gate insulating layer; forming a first photosensitive pattern over the conductive layer; patterning the conductive layer according to the photosensitive pattern to form a gate electrode; and ion-doping an impurity into the semiconductor layer using the photosensitive pattern as a mask to form source and drain regions.

摘要翻译： 制造薄膜晶体管的方法包括在衬底上形成半导体层; 在所述基板的整个表面上形成栅极绝缘层以覆盖所述半导体层; 在栅极绝缘层上沉积导电层; 在所述导电层上形成第一感光图案; 根据感光图案图案化导电层以形成栅电极; 并且使用光敏图案作为掩模将杂质离子掺杂到半导体层中以形成源极和漏极区域。

公开(公告)号：US4908519A

公开(公告)日：1990-03-13

申请号：US256352

申请日：1988-10-11

申请人： Sang-il Park ,  Calvin F. Quate

发明人： Sang-il Park ,  Calvin F. Quate

IPC分类号： G01Q30/18 ,  G01Q30/20 ,  G01Q60/00 ,  H01J37/20

CPC分类号： G01Q30/18 ,  B82Y35/00 ,  H01J37/20 ,  Y10S977/86

摘要： A sample and selective support structure mounted on a platform in a scanning tunneling microscope includes a double spring support with the springs overlapped to reduce overall length of the support. In a preferred embodiment, a rigid support structure supports a first platform. A second platform is positioned around and spaced from the first platform and includes a plurality of support members extending therefrom. A first set of springs is attached to the rigid support structure and to the second platform for supporting the second platform, and a second set of springs is attached to the second platform and to the first platform for supporting the first platform. By attaching the second set of springs to the rigid members extending from the second platform, the first and second sets of springs can be overlapped, thereby reducing the overall length of the spring support without reducing the effective length of the springs. A lock mechanism is provided for locking the first and second platforms when not in use, and includes a rod that engages holes in two members depending from the first and second platforms. The lock mechanism further includes first and second rigid arms pivotally attached to the rod and supported whereby the rigid arms extend from and retract to the rod when the rod is translated. When the rigid arms are extended from the rod, the arms engage lock mechanisms depending from the first platform, thereby achieving a rigid lock in six axes of motion.

摘要翻译： 在扫描隧道显微镜中安装在平台上的样品和选择性支撑结构包括双弹簧支撑件，弹簧重叠以减少支撑件的总长度。 在优选实施例中，刚性支撑结构支撑第一平台。 第二平台定位在第一平台周围并与第一平台间隔开并包括从其延伸的多个支撑构件。 第一组弹簧附接到刚性支撑结构和第二平台以支撑第二平台，并且第二组弹簧附接到第二平台和第一平台以支撑第一平台。 通过将第二组弹簧连接到从第二平台延伸的刚性构件，第一组弹簧和第二组弹簧可以重叠，从而在不减少弹簧的有效长度的情况下减小弹簧支撑件的总长度。 提供了一种用于在不使用时锁定第一和第二平台的锁定机构，并且包括杆，该杆与第一和第二平台相对应地接合两个构件中的孔。 锁定机构还包括枢转地附接到杆并被支撑的第一和第二刚性臂，由此当杆被平移时，刚性臂从杆延伸并缩回到杆。 当刚性臂从杆延伸时，臂接合从第一平台垂下的锁定机构，从而实现六个运动轴的刚性锁定。