NONVOLATILE MEMORY
    1.
    发明申请

    公开(公告)号:US20250046368A1

    公开(公告)日:2025-02-06

    申请号:US18920447

    申请日:2024-10-18

    Abstract: A memory device includes control circuitry that executes a first programming operation and executes a second programming operation after the first programming operation. The first programming operation includes setting a threshold voltage of each of a second set of memory cells in a second section corresponding to write data, and setting a threshold voltage of each of the third set of memory cells in a third section. The second programming operation includes setting the threshold voltage of each of the second set of memory cells in a fifth section corresponding to the write data, and setting the threshold voltage of each of the third set of memory cells in a sixth section or a seventh section among a plurality of fourth sections in accordance with temperature information. The sixth section includes the same voltage range as the third section. The seventh section is higher in voltage than the third section.

    MEMORY SYSTEM
    3.
    发明公开
    MEMORY SYSTEM 审中-公开

    公开(公告)号:US20240302994A1

    公开(公告)日:2024-09-12

    申请号:US18589277

    申请日:2024-02-27

    CPC classification number: G06F3/0656 G06F3/0611 G06F3/0659 G06F3/0679

    Abstract: A memory system includes a nonvolatile memory, a memory controller, and a control circuit including a buffer and configured to store a first address transmitted by the memory controller in the buffer, generate a second address based on the first address stored in the buffer, and transmit the generated second address to the nonvolatile memory.

    NONVOLATILE MEMORY
    6.
    发明公开
    NONVOLATILE MEMORY 审中-公开

    公开(公告)号:US20230317152A1

    公开(公告)日:2023-10-05

    申请号:US17929439

    申请日:2022-09-02

    CPC classification number: G11C11/5628 G11C11/5671 G11C16/10

    Abstract: A memory device includes control circuitry that executes a first programming operation and executes a second programming operation after the first programming operation. The first programming operation includes setting a threshold voltage of each of a second set of memory cells in a second section corresponding to write data, and setting a threshold voltage of each of the third set of memory cells in a third section. The second programming operation includes setting the threshold voltage of each of the second set of memory cells in a fifth section corresponding to the write data, and setting the threshold voltage of each of the third set of memory cells in a sixth section or a seventh section among a plurality of fourth sections in accordance with temperature information. The sixth section includes the same voltage range as the third section. The seventh section is higher in voltage than the third section.

    SEMICONDUCTOR DEVICE AND SEMICONDUCTOR STORAGE DEVICE

    公开(公告)号:US20210373784A1

    公开(公告)日:2021-12-02

    申请号:US17200264

    申请日:2021-03-12

    Abstract: A semiconductor device of an embodiment includes a seed generator circuit configured to generate a seed from inputted data by using first random number sequence data generated by an XorShift circuit; and a random number generator circuit configured to receive the seed as input to generate second random number sequence data by a second XorShift circuit.

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