Apparatus and method of dynamically measuring thickness of a layer of a substrate
    1.
    发明授权
    Apparatus and method of dynamically measuring thickness of a layer of a substrate 有权
    动态测量衬底层厚度的装置和方法

    公开(公告)号:US07355394B2

    公开(公告)日:2008-04-08

    申请号:US11522416

    申请日:2006-09-18

    IPC分类号: G01B7/06 G01N27/72

    CPC分类号: G01B7/105

    摘要: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through the gap. The sensor heads make measurements at given sampling locations on the test object as the test object is moved through the gap. The apparatus also includes a position sensing mechanism to determine positions of the sampling locations on the test object. The apparatus also includes an evaluation circuit in communication with the eddy current sensor and to the position sensing mechanism for determining the thickness of the test object at the sampling locations.

    摘要翻译: 提供了一种用于测量被测物体的厚度的方法和装置。 该装置包括具有第一和第二传感器头的涡流传感器。 传感器头被定位成在其间具有预定的间隙,以通过该测试对象的至少一部分通过间隙。 当测试对象移动通过间隙时,传感器头在测试对象上的给定采样位置进行测量。 该装置还包括位置检测机构,用于确定测试对象上的采样位置的位置。 该装置还包括与涡流传感器和位置感测机构通信的评估电路,用于确定采样位置处的测试对象的厚度。

    Method and apparatus for dynamically measuring the thickness of an object
    2.
    发明授权
    Method and apparatus for dynamically measuring the thickness of an object 有权
    用于动态测量物体厚度的方法和装置

    公开(公告)号:US07112961B2

    公开(公告)日:2006-09-26

    申请号:US10685210

    申请日:2003-10-14

    IPC分类号: G01B7/06 G01N27/72

    CPC分类号: G01B7/105

    摘要: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through the gap. The sensor heads make measurements at given sampling locations on the test object as the test object is moved through the gap. The apparatus also includes a position sensing mechanism to determine positions of the sampling locations on the test object. The apparatus also includes an evaluation circuit in communication with the eddy current sensor and to the position sensing mechanism for determining the thickness of the test object at the sampling locations.

    摘要翻译: 提供了一种用于测量被测物体的厚度的方法和装置。 该装置包括具有第一和第二传感器头的涡流传感器。 传感器头被定位成在其间具有预定的间隙,以通过该测试对象的至少一部分通过间隙。 当测试对象移动通过间隙时,传感器头在测试对象上的给定采样位置进行测量。 该装置还包括位置检测机构,用于确定测试对象上的采样位置的位置。 该装置还包括与涡流传感器和位置感测机构通信的评估电路,用于确定采样位置处的测试对象的厚度。

    METHOD AND APPARATUS FOR MEASURING OBJECT THICKNESS
    3.
    发明申请
    METHOD AND APPARATUS FOR MEASURING OBJECT THICKNESS 有权
    用于测量物体厚度的方法和装置

    公开(公告)号:US20080186022A1

    公开(公告)日:2008-08-07

    申请号:US12099747

    申请日:2008-04-08

    IPC分类号: G01B7/06

    CPC分类号: G01B7/105

    摘要: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through the gap. The sensor heads make measurements at given sampling locations on the test object as the test object is moved through the gap. The apparatus also includes a position sensing mechanism to determine positions of the sampling locations on the test object. The apparatus also includes an evaluation circuit in communication with the eddy current sensor and to the position sensing mechanism for determining the thickness of the test object at the sampling locations.

    摘要翻译: 提供了一种用于测量被测物体的厚度的方法和装置。 该装置包括具有第一和第二传感器头的涡流传感器。 传感器头被定位成在其间具有预定的间隙,以通过该测试对象的至少一部分通过间隙。 当测试对象移动通过间隙时,传感器头在测试对象上的给定采样位置进行测量。 该装置还包括位置检测机构,用于确定测试对象上的采样位置的位置。 该装置还包括与涡流传感器和位置感测机构通信的评估电路,用于确定采样位置处的测试对象的厚度。

    Method and apparatus for measuring a thickness of a layer of a wafer
    4.
    发明授权
    Method and apparatus for measuring a thickness of a layer of a wafer 有权
    用于测量晶片层厚度的方法和装置

    公开(公告)号:US07777483B2

    公开(公告)日:2010-08-17

    申请号:US12099747

    申请日:2008-04-08

    IPC分类号: G01B7/06 G01N27/72

    CPC分类号: G01B7/105

    摘要: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through the gap. The sensor heads make measurements at given sampling locations on the test object as the test object is moved through the gap. The apparatus also includes a position sensing mechanism to determine positions of the sampling locations on the test object. The apparatus also includes an evaluation circuit in communication with the eddy current sensor and to the position sensing mechanism for determining the thickness of the test object at the sampling locations.

    摘要翻译: 提供了一种用于测量被测物体的厚度的方法和装置。 该装置包括具有第一和第二传感器头的涡流传感器。 传感器头被定位成在其间具有预定的间隙,以通过该测试对象的至少一部分通过间隙。 当测试对象移动通过间隙时,传感器头在测试对象上的给定采样位置进行测量。 该装置还包括位置检测机构,用于确定测试对象上的采样位置的位置。 该装置还包括与涡流传感器和位置感测机构通信的评估电路,用于确定采样位置处的测试对象的厚度。

    Method and apparatus for measuring object thickness
    5.
    发明申请
    Method and apparatus for measuring object thickness 有权
    测量物体厚度的方法和装置

    公开(公告)号:US20070063698A1

    公开(公告)日:2007-03-22

    申请号:US11522416

    申请日:2006-09-18

    IPC分类号: G01B7/06

    CPC分类号: G01B7/105

    摘要: A method and apparatus are provided for measuring the thickness of a test object. The apparatus includes an eddy current sensor having first and second sensor heads. The sensor heads are positioned to have a predetermined gap therebetween for passage by at least a portion of the test object through the gap. The sensor heads make measurements at given sampling locations on the test object as the test object is moved through the gap. The apparatus also includes a position sensing mechanism to determine positions of the sampling locations on the test object. The apparatus also includes an evaluation circuit in communication with the eddy current sensor and to the position sensing mechanism for determining the thickness of the test object at the sampling locations.

    摘要翻译: 提供了一种用于测量被测物体的厚度的方法和装置。 该装置包括具有第一和第二传感器头的涡流传感器。 传感器头被定位成在其间具有预定的间隙,以通过该测试对象的至少一部分通过间隙。 当测试对象移动通过间隙时,传感器头在测试对象上的给定采样位置进行测量。 该装置还包括位置检测机构,用于确定测试对象上的采样位置的位置。 该装置还包括与涡流传感器和位置感测机构通信的评估电路,用于确定采样位置处的测试对象的厚度。

    STREAMING DIGITAL MEDIA BOOKMARK CREATION AND MANAGEMENT

    公开(公告)号:US20180047429A1

    公开(公告)日:2018-02-15

    申请号:US15673641

    申请日:2017-08-10

    申请人: Paul Smith

    发明人: Paul Smith

    摘要: A user can quickly and efficiently create, edit, search, playback and share bookmarks in one or more videos that are pre-recorded or being recorded or streaming live. The bookmark includes reference to a portion of the video for an amount of time. The bookmark portions may not include a specified end time. The bookmark may include the source of the video, a start time of the bookmarked portion of the video stream or file, a length of the referenced video portion, and content such as text, emoticons, or other content received from a user that creates, edits, or manages the bookmark. The bookmarks may be grouped together into a set of bookmarks, thereby forming an edit of the original streaming or pre-recorded videos when played sequentially, wherein the edit includes a set of bookmarked video portions (bookmarked videos) taken from one or more particular live streaming or pre-recorded videos.

    Low profile mount for flat panel electronic display
    10.
    发明授权
    Low profile mount for flat panel electronic display 有权
    薄型安装用于平板电子显示屏

    公开(公告)号:US09109742B2

    公开(公告)日:2015-08-18

    申请号:US13061910

    申请日:2009-08-31

    申请人: Paul Smith

    发明人: Paul Smith

    IPC分类号: H04N5/64 F16M13/02 F16M11/10

    摘要: A low-profile mount for a flat panel electronic display that is selectively shiftable between a wall-confronting position wherein the back of the flat panel electronic display is disposed parallel and proximate to the wall surface and a tilt position wherein the top of the display is tilted away from the wall surface. The mount is configured so that points spaced apart forwardly from display receiving surfaces of the mount are shifted along a substantially horizontal axis as the mount is shifted between the wall confronting position and the tilt position. Advantageously, the display can be attached to the mount so that the points are horizontally registered with a center of gravity of the display such that the display is self-balancing at any point along the travel between the wall confronting position and the tilt position.

    摘要翻译: 一种用于平板电子显示器的薄型安装件,其可在壁对面位置之间选择性地移动,其中平板电子显示器的背面平行并靠近壁表面,以及倾斜位置,其中显示器的顶部为 倾斜远离墙面。 安装件被构造成使得当安装件在壁面相对位置和倾斜位置之间移动时,使得从安装件的显示器接收表面向前间隔开的点沿着基本上水平的轴线移动。 有利地,显示器可以附接到安装件,使得点与显示器的重心水平地对准,使得显示器在沿着面向对面的位置和倾斜位置之间的行进的任何点处是自平衡的。