公开(公告)号：US11774468B2

公开(公告)日：2023-10-03

申请号：US17858424

申请日：2022-07-06

Applicant: MPI CORPORATION

Inventor： Chin-Tien Yang ,  Yang-Hung Cheng ,  Yu-Hao Chen ,  Chin-Yi Tsai ,  Hui-Pin Yang ,  Horng-Chuan Sun

IPC: G01R1/073

CPC classification number: G01R1/07314 ,  G01R1/07357

Abstract: A vertical probe head includes upper and lower die units having upper and lower through holes, and probes each including a body portion between the die units, tail and head portion installation parts in the upper and lower through holes respectively, and a head portion contact part for electrically contacting a device under test. The probes include a pair of signal probes including at least one distinctive probe, for which, the body portion is smaller in width than the head portion installation part, and a body portion center line is deviated from a head portion installation part center line toward the probe paired thereto. For the paired probes, a head portion contact part pitch is larger than a body portion pitch for matching a large-pitch high-speed differential pair of the device under test, great impedance matching effect, and consistent contact force and stable elasticity of the probes in operation.

公开(公告)号：US20250147073A1

公开(公告)日：2025-05-08

申请号：US18934482

申请日：2024-11-01

Applicant: MPI Corporation

Inventor： CHIEN-MING LO ,  Hsuan-Ti Yeh ,  Chih-Hao Ho ,  Horng-Chuan Sun ,  Chien-Ming Huang ,  Chia-Hung Liu

IPC: G01R1/073 ,  G01R3/00

Abstract: The present invention provides a probe card. The probe card comprises a circuit board, a cantilever-type space transformer electrically connected to the circuit board, and a vertical probe head electrically connected to the cantilever-type space transformer. The vertical probe head comprises a probe base and a plurality of vertical probes. The cantilever-type space transformer comprises a mounting base and a plurality of cantilever converting probes, wherein each cantilever converting probe has a fixed segment and an exposed segment. The fixed segment is secured to the mounting base, and the exposed segment is located outside the mounting base. The fixing segment enters from the side of the mounting base and forms a contact at the bottom of the mounting base.

公开(公告)号：US10393773B2

公开(公告)日：2019-08-27

申请号：US15274409

申请日：2016-09-23

Applicant: MPI CORPORATION

Inventor： Tsung-Yi Chen ,  Ting-Hsin Kuo ,  Yi-Lung Lee ,  Shih-Shin Chen ,  Horng-Chuan Sun ,  Horng-Kuang Fan

IPC: G01R1/067 ,  G01R31/28 ,  H01R12/71 ,  H01R13/24 ,  H01R13/436 ,  G01R31/44

Abstract: A probe card includes a probe seat having upper and lower dies and a probe accommodating hole, a spring probe inserted through the probe accommodating hole and including a spring sleeve having upper and lower non-spring sections, and a circuit board disposed on the upper die and having a contact pad against which the spring probe is abutted. At least one of the upper and lower dies has a stopping surface partially facing the probe accommodating hole and an extended portion inserting hole in alignment with the probe accommodating hole. At least one of the upper and lower non-spring sections has a cylinder portion abutted on the stopping surface and an extended portion inserted through the extended portion inserting hole.