中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

7 records (took 0.014 seconds)

    Vertical probe head
    1.
    发明授权
    Vertical probe head 有权

    公开(公告)号：US11774468B2

    公开(公告)日：2023-10-03

    申请号：US17858424

    申请日：2022-07-06

    Applicant: MPI CORPORATION

    Inventor： Chin-Tien Yang ,  Yang-Hung Cheng ,  Yu-Hao Chen ,  Chin-Yi Tsai ,  Hui-Pin Yang ,  Horng-Chuan Sun

    IPC: G01R1/073

    CPC classification number: G01R1/07314 ,  G01R1/07357

    Abstract: A vertical probe head includes upper and lower die units having upper and lower through holes, and probes each including a body portion between the die units, tail and head portion installation parts in the upper and lower through holes respectively, and a head portion contact part for electrically contacting a device under test. The probes include a pair of signal probes including at least one distinctive probe, for which, the body portion is smaller in width than the head portion installation part, and a body portion center line is deviated from a head portion installation part center line toward the probe paired thereto. For the paired probes, a head portion contact part pitch is larger than a body portion pitch for matching a large-pitch high-speed differential pair of the device under test, great impedance matching effect, and consistent contact force and stable elasticity of the probes in operation.

    Probe head for high frequency signal test and medium or low frequency signal test at the same time
    2.
    发明授权
    Probe head for high frequency signal test and medium or low frequency signal test at the same time 有权

    公开(公告)号：US11150269B2

    公开(公告)日：2021-10-19

    申请号：US16990283

    申请日：2020-08-11

    Applicant: MPI CORPORATION

    Inventor： Hui-Pin Yang ,  Shang-Jung Hsieh ,  Yu-Wen Chou ,  Ching-Fang Yu ,  Huo-Kang Hsu ,  Chin-Tien Yang

    IPC: G01R1/073 ,  G01R1/067

    Abstract: A probe head includes a probe seat, a first spring probe penetrating through upper, middle and lower dies of the probe seat for transmitting a first test signal, and at least two shorter second spring probes penetrating through the lower die for transmitting a second test signal with higher frequency. Two second spring probes are electrically connected in a way that top ends thereof are abutted against two electrically conductive contacts on a bottom surface of the middle die electrically connected by a connecting circuit therein. The lower die has a communicating space and at least two lower installation holes communicating therewith and each accommodating a second spring probe partially located in the communicating space. The probe head is adapted for concurrent high and medium or low frequency signal tests, meets fine pitch and high frequency testing requirements and prevents probe cards from too complicated circuit design.

    Probe card
    4.
    发明授权
    Probe card 有权

    公开(公告)号：US12025637B2

    公开(公告)日：2024-07-02

    申请号：US17499990

    申请日：2021-10-13

    Applicant: MPI Corporation

    Inventor： Chin-Yi Tsai ,  Chia-Tai Chang ,  Cheng-Nien Su ,  Chin-Tien Yang ,  Chen-Chih Yu

    IPC: G01R1/073

    CPC classification number: G01R1/07342

    Abstract: The present invention provides a probe card comprising a probe base, at least one impedance-matching probes, and a plurality of first probes. The probe base has a probing side and a tester side opposite to the probing side. Each impedance-matching probe has a probing part and a signal transmitting part electrically coupled to the probing part, wherein one end of the signal transmitting part is arranged at tester side, and the signal transmitting part has a central probing axis. Each first probe has a probing tip and a cantilever part coupled to the probing tip, wherein the cantilever part is coupled to the probe base and has a first central axis such that an included angle is formed between the central probing axis and the first central axis.

    Probe head for high frequency signal test and medium or low frequency signal test at the same time
    5.
    发明授权
    Probe head for high frequency signal test and medium or low frequency signal test at the same time 有权

    公开(公告)号：US11346860B2

    公开(公告)日：2022-05-31

    申请号：US16990612

    申请日：2020-08-11

    Applicant: MPI CORPORATION

    Inventor： Chin-Tien Yang ,  Hui-Pin Yang ,  Shang-Jung Hsieh ,  Tsung-Yi Chen ,  Yu-Hao Chen ,  Jhin-Ying Lyu

    IPC: G01R1/067 ,  G01R1/073

    Abstract: A probe head includes a probe seat having upper, middle and lower dies, an electrically conductive layer inside the probe seat, a first spring probe penetrating through the probe seat, and at least two shorter second spring probes penetrating through the lower die in a way that top ends of the second spring probes are located inside the probe seat and abutted against the electrically conductive layer. Another probe head includes the aforesaid probe seat, an electrically conductive layer partially inside the probe seat and partially outside the probe seat, a first spring probe penetrating through the probe seat, and a shorter second spring probe penetrating through the lower die in a way that a top end of the second spring probe is located inside the probe seat and abutted against the electrically conductive layer. As such, fine pitch requirement and different high frequency testing requirements are fulfilled.

    High frequency probe card
    6.
    发明授权
    High frequency probe card 有权
    高频探头卡

    公开(公告)号：US09201098B2

    公开(公告)日：2015-12-01

    申请号：US13941210

    申请日：2013-07-12

    Applicant: MPI CORPORATION

    Inventor： Chia-Tai Chang ,  Chin-Yi Tsai ,  Chiu-Kuei Chen ,  Chen-Chih Yu ,  Chien-Chang Lai ,  Chin-Tien Yang ,  Hui-Pin Yang ,  Keng-Shieng Chang ,  Yun-Ru Huang

    IPC: G01R31/00 ,  G01R1/073 ,  G01R1/067

    CPC classification number: G01R1/07342 ,  G01R1/06772

    Abstract: A high frequency probe card includes at least one substrate having at least one first opening, an interposing plate disposed on the at least one substrate and having at least one second opening corresponding to the at least one first opening, a circuit board disposed on the interposing plate and having a third opening corresponding to the at least one first and second openings, and at least one probe module including at least one ground probe and at least one high frequency signal probe passing through the corresponding substrate, the interposing plate and the third opening and being electrically connected with the circuit board. Each high frequency signal probe includes a signal probe and a first conductor corresponding to the signal probe and being electrically connected with the ground probe. An insulation layer is disposed between the first conductor and the signal probe.

    Abstract translation: 高频探针卡包括具有至少一个第一开口的至少一个基板，设置在所述至少一个基板上的插入板，并且具有至少一个对应于所述至少一个第一开口的第二开口，布置在插入件上的电路板 并且具有对应于所述至少一个第一和第二开口的第三开口，以及至少一个探针模块，包括至少一个接地探针和至少一个穿过相应基板的高频信号探针，所述插入板和所述第三开口 并与电路板电连接。 每个高频信号探头包括信号探针和对应于信号探针的第一导体并与接地探头电连接。 绝缘层设置在第一导体和信号探头之间。

    PROBE CARD
    7.
    发明申请
    PROBE CARD 有权

    公开(公告)号：US20220113334A1

    公开(公告)日：2022-04-14

    申请号：US17499990

    申请日：2021-10-13

    Applicant: MPI Corporation

    Inventor： Chin-Yi Tsai ,  Chia-Tai Chang ,  Cheng-Nien Su ,  Chin-Tien Yang ,  Chen-Chih Yu

    IPC: G01R1/073

    Abstract: The present invention provides a probe card comprising a probe base, at least one impedance-matching probes, and a plurality of first probes. The probe base has a probing side and a tester side opposite to the probing side. Each impedance-matching probe has a probing part and a signal transmitting part electrically coupled to the probing part, wherein one end of the signal transmitting part is arranged at tester side, and the signal transmitting part has a central probing axis. Each first probe has a probing tip and a cantilever part coupled to the probing tip, wherein the cantilever part is coupled to the probe base and has a first central axis such that an included angle is formed between the central probing axis and the first central axis.

Patent Agency Ranking