Method of transforming polymer films into carbon films
    5.
    发明授权
    Method of transforming polymer films into carbon films 失效
    将聚合物膜转化为碳膜的方法

    公开(公告)号:US06817915B2

    公开(公告)日:2004-11-16

    申请号:US10351343

    申请日:2003-01-27

    IPC分类号: H01J3100

    CPC分类号: H01J9/027 H01J2329/00

    摘要: A process of efficiently transforming polymer films arranged on an electron source substrate into carbon films is provided. A light is irradiated onto a region of the substrate where a plurality of polymer films, associated electrodes and part of wirings are arranged so that the plurality of polymer films are simultaneously transformed into lower resistance films such as carbon films through heating by the irradiated light, wherein for the irradiating light, a light absorptance of the wirings is lower than that of the electrodes.

    摘要翻译: 提供了将布置在电子源基板上的聚合物膜有效地转化成碳膜的方法。 将光照射到基板的多个聚合物膜,相关电极和布线部分的区域上,使得多个聚合物膜通过照射光的加热同时转变成诸如碳膜的下电阻膜, 对于照射光,布线的光吸收率低于电极的光吸收率。

    Electron-emitting device, electron source, and image display apparatus
    7.
    发明授权
    Electron-emitting device, electron source, and image display apparatus 失效
    电子发射器件,电子源和图像显示装置

    公开(公告)号:US07138759B2

    公开(公告)日:2006-11-21

    申请号:US10789995

    申请日:2004-03-02

    申请人: Masafumi Kyogaku

    发明人: Masafumi Kyogaku

    IPC分类号: H01J1/304

    摘要: To provide an electron-emitting device that can be used to manufacture an image forming apparatus having a superior display quality and in which the development of the abnormal light emission point is suppressed and the unevenness of brightness is not caused. The electron-emitting device includes: a cathode electrode and a gate electrode, which are formed on a base surface and opposed to each other with a space therebetween; and an electron-emitting film which is located on the cathode electrode, and in the electron-emitting device, the electron-emitting film has two end portions (A and B) in a plane substantially parallel to the base surface in a direction substantially perpendicular to a direction along which the cathode electrode and the gate electrode are opposed to each other, and a structure is used in which electric field strengths applied between each of the two end portions (A and B) of the electron-emitting film and the gate electrode are made weaker than an electric field strength applied between a region between the two end portions (A and B) of the electron-emitting film and the gate electrode at a time of driving.

    摘要翻译: 为了提供一种可用于制造具有优良显示品质并且异常发光点的显影被抑制并且不会引起亮度不均匀的图像形成装置的电子发射器件。 电子发射器件包括:阴极电极和栅极电极,其形成在基底表面上并且彼此相对且间隔开; 和位于阴极电极上的电子发射膜,并且在电子发射器件中,电子发射膜在基本上垂直于基底平面的方向上具有两个端部(A和B) 到阴极电极和栅极彼此相对的方向,并且使用其中施加在电子发射膜的两个端部(A和B)中的每一个之间的电场强度和栅极的结构 使得电极比施加在驱动时电子发射膜的两个端部(A和B)与栅电极的区域之间的电场强度弱。

    Scanning atomic force microscope
    8.
    发明授权
    Scanning atomic force microscope 失效
    扫描原子力显微镜

    公开(公告)号:US5567872A

    公开(公告)日:1996-10-22

    申请号:US399521

    申请日:1995-03-07

    摘要: A scanning atomic force microscope includes a probe arranged near a sample surface to oppose the sample surface, a support device for supporting the prove, a moving mechanism for moving the probe relative to the sample, and a signal detector for detecting a signal corresponding to a structure of the sample surface obtained by the probe. The signal detector includes a laser beam oscillator for oscillating a laser beam, and a laser beam receiving device for receiving the laser beam which is emitted from the laser beam oscillator and is reflected by the support device. The scanning atomic force microscope is further provided with a laser beam output device which has a function of controlling the laser beam oscillator to discontinuously emit the laser beam.

    摘要翻译: 扫描原子力显微镜包括布置在样品表面附近以与样品表面相对的探针,用于支撑证明的支撑装置,用于相对于样品移动探针的移动机构,以及用于检测对应于 通过探针获得的样品表面的结构。 信号检测器包括用于振荡激光束的激光束振荡器和用于接收从激光束振荡器发射并被支撑装置反射的激光束的激光束接收装置。 扫描原子力显微镜还设置有具有控制激光束振荡器以不连续地发射激光束的功能的激光束输出装置。

    Method of analyzing sample using secondary ion emitted from sample and analyzer for performing analysis method
    9.
    发明授权
    Method of analyzing sample using secondary ion emitted from sample and analyzer for performing analysis method 有权
    使用从样品和分析仪发射的二次离子分析样品进行分析方法的方法

    公开(公告)号:US09267902B2

    公开(公告)日:2016-02-23

    申请号:US13979144

    申请日:2012-01-12

    摘要: Provided is a sample analysis method of irradiating a sample with a primary ion beam to analyze a secondary ion emitted from the sample by mass spectrometry, the sample analysis method including the steps of cooling a sample placed in a chamber; forming an ice layer on a surface of the cooled sample by discharging one of water and an aqueous solution to the chamber; and irradiating the surface of the sample with the primary ion beam with the ice layer being formed thereon, wherein an amount of the water forming the ice layer is 0.1 ng/mm2 or more and 20 ng/mm2 or less.

    摘要翻译: 提供了一种用一次离子束照射样品以通过质谱分析从样品发射的二次离子的样品分析方法,该样品分析方法包括以下步骤:冷却置于室中的样品; 通过将水和水溶液中的一种排出到所述室,在所述冷却样品的表面上形成冰层; 并且在其上形成有冰层的初级离子束照射样品的表面,其中形成冰层的水的量为0.1ng / mm 2以上且20ng / mm 2以下。

    SAMPLE ANALYSIS METHOD AND ANALYZER
    10.
    发明申请
    SAMPLE ANALYSIS METHOD AND ANALYZER 有权
    样品分析方法和分析仪

    公开(公告)号:US20130320204A1

    公开(公告)日:2013-12-05

    申请号:US13979144

    申请日:2012-01-12

    IPC分类号: G01N23/22

    摘要: Provided is a sample analysis method of irradiating a sample with a primary ion beam to analyze a secondary ion emitted from the sample by mass spectrometry, the sample analysis method including the steps of cooling a sample placed in a chamber; forming an ice layer on a surface of the cooled sample by discharging one of water and an aqueous solution to the chamber; and irradiating the surface of the sample with the primary ion beam with the ice layer being formed thereon, wherein an amount of the water forming the ice

    摘要翻译: 提供了一种用一次离子束照射样品以通过质谱分析从样品发射的二次离子的样品分析方法,该样品分析方法包括以下步骤:冷却置于室中的样品; 通过将水和水溶液中的一种排出到所述室,在所述冷却样品的表面上形成冰层; 并且在其上形成有冰层的初级离子束照射样品的表面,其中形成冰的水量