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公开(公告)号：US07777252B2
公开(公告)日：2010-08-17
申请号：US11632665
申请日：2005-06-22
申请人： Masahiro Sugimoto , Tetsu Kachi , Yoshitaka Nakano , Tsutomu Uesugi , Hiroyuki Ueda , Narumasa Soejima
发明人： Masahiro Sugimoto , Tetsu Kachi , Yoshitaka Nakano , Tsutomu Uesugi , Hiroyuki Ueda , Narumasa Soejima
IPC分类号： H01L29/739 , H01L31/072
CPC分类号： H01L29/778 , H01L21/28 , H01L29/2003 , H01L29/66431 , H01L29/66462 , H01L29/7787
摘要： A semiconductor device has a stacked structure in which a p-GaN layer, an SI-GaN layer, and an AlGaN layer are stacked, and has a gate electrode that is formed at a top surface side of the AlGaN layer. A band gap of the AlGaN layer is wider than a band gap of the p-GaN layer and the SI-GaN layer. Moreover, impurity concentration of the SI-GaN layer is less than 1×1017 cm−3. Semiconductor devices including III-V semiconductors may have a stable normally-off operation.
摘要翻译： 半导体器件具有其中堆叠p-GaN层，SI-GaN层和AlGaN层的堆叠结构，并且具有形成在AlGaN层的顶表面侧的栅电极。 AlGaN层的带隙比p-GaN层和SI-GaN层的带隙宽。 此外，SI-GaN层的杂质浓度小于1×1017cm-3。 包括III-V半导体的半导体器件可以具有稳定的常关断操作。
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公开(公告)号：US20090134456A1
公开(公告)日：2009-05-28
申请号：US11921085
申请日：2006-05-25
IPC分类号： H01L29/78 , H01L21/336
CPC分类号： H01L29/207 , H01L29/0623 , H01L29/0649 , H01L29/0653 , H01L29/2003 , H01L29/66462 , H01L29/7787 , H01L29/7788 , H01L29/7828 , H01L29/7832
摘要： The present invention aims to suppress the diffusion of p-type impurities (typically magnesium), included in a semiconductor region of a III-V compound semiconductor, into an adjoining different semiconductor region. A semiconductor device 10 of the present invention comprises a first semiconductor region 28 of gallium nitride (GaN) including p-type impurities that consist of magnesium, a second semiconductor region 34 of gallium nitride, and an impurity diffusion suppression layer 32 of silicon oxide (SiO2) located between the first semiconductor region 28 and the second semiconductor region 34.
摘要翻译： 本发明旨在抑制包含在III-V族化合物半导体的半导体区域中的p型杂质（通常为镁）扩散到邻接的不同半导体区域中。 本发明的半导体器件10包括由镁构成的p型杂质，氮化镓的第二半导体区域34和氧化硅的杂质扩散抑制层32的氮化镓（GaN）的第一半导体区域28（ SiO 2），位于第一半导体区域28和第二半导体区域34之间。
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公开(公告)号：US09184271B2
公开(公告)日：2015-11-10
申请号：US12822328
申请日：2010-06-24
申请人： Masahiro Sugimoto , Tetsu Kachi , Yoshitaka Nakano , Tsutomu Uesugi , Hiroyuki Ueda , Narumasa Soejima
发明人： Masahiro Sugimoto , Tetsu Kachi , Yoshitaka Nakano , Tsutomu Uesugi , Hiroyuki Ueda , Narumasa Soejima
IPC分类号： H01L29/778 , H01L29/66 , H01L21/28 , H01L29/20
CPC分类号： H01L29/778 , H01L21/28 , H01L29/2003 , H01L29/66431 , H01L29/66462 , H01L29/7787
摘要： A semiconductor device has a stacked structure in which a p-GaN layer, an SI-GaN layer, and an AlGaN layer are stacked, and has a gate electrode that is formed at a top surface side of the AlGaN layer. A band gap of the AlGaN layer is wider than a band gap of the p-GaN layer and the SI-GaN layer. Moreover, impurity concentration of the SI-GaN layer is less than 1×1017 cm−3. Semiconductor devices including III-V semiconductors may have a stable normally-off operation.
摘要翻译： 半导体器件具有其中堆叠p-GaN层，SI-GaN层和AlGaN层的堆叠结构，并且具有形成在AlGaN层的顶表面侧的栅电极。 AlGaN层的带隙比p-GaN层和SI-GaN层的带隙宽。 此外，SI-GaN层的杂质浓度小于1×1017cm-3。 包括III-V半导体的半导体器件可以具有稳定的常关断操作。
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公开(公告)号：US20080149964A1
公开(公告)日：2008-06-26
申请号：US11795117
申请日：2006-01-20
IPC分类号： H01L29/778
CPC分类号： H01L29/452 , H01L29/2003 , H01L29/42316 , H01L29/66462 , H01L29/7787
摘要： A semiconductor device 10 comprises a heterojunction between a lower semiconductor layer 26 made of p-type gallium nitride and an upper semiconductor layer 28 made of n-type AlGaN, wherein the upper semiconductor layer 28 has a larger band gap than the lower semiconductor layer 26. The semiconductor device 10 further comprises a drain electrode 32 formed on a portion of a top surface of the upper semiconductor layer 28, a source electrode 34 formed on a different portion of the top surface of the upper semiconductor layer 28, and a gate electrode 36 electrically connected to the lower semiconductor layer 26. The semiconductor device 10 can operate as normally-off.
摘要翻译： 半导体器件10包括由p型氮化镓制成的下半导体层26和由n型AlGaN制成的上半导体层28之间的异质结，其中上半导体层28具有比下半导体层26更大的带隙 。 半导体器件10还包括形成在上半导体层28的顶表面的一部分上的漏电极32，形成在上半导体层28的顶表面的不同部分上的源极34和栅电极36 电连接到下半导体层26。 半导体器件10可以正常工作。
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公开(公告)号：US20080128862A1
公开(公告)日：2008-06-05
申请号：US11667735
申请日：2005-11-14
CPC分类号： H01L29/7802 , H01L29/0649 , H01L29/0653 , H01L29/0692 , H01L29/0696 , H01L29/0843 , H01L29/0847 , H01L29/0891 , H01L29/2003 , H01L29/41 , H01L29/778 , H01L29/7788 , H01L29/8122
摘要： A semiconductor device is provided with a drain electrode 22, a semiconductor base plate 32, an electric current regulation layer 42 covering a part of a surface of the semiconductor base plate 32 and leaving a non-covered surface 55 at the surface of the semiconductor base plate 32, a semiconductor layer 50 covering a surface of the electric current regulation layer 42, and a source electrode 62 formed at a surface of the semiconductor layer 50. A drift region 56, a channel forming region 54, and a source region 52 are formed within the semiconductor layer 50. The drain electrode 22 is connected to a first terminal of a power source, and the source electrode 62 is connected to a second terminal of the power source. With this semiconductor layer 50, it is possible to increase withstand voltage or reduce the occurrence of current leakage.
摘要翻译： 半导体器件设置有漏电极22，半导体基板32，覆盖半导体基板32的一部分表面的电流调节层42，并在半导体基板的表面留下未被覆盖的表面55 板32，覆盖电流调节层42的表面的半导体层50和形成在半导体层50的表面的源电极62。 在半导体层50内形成有漂移区56，沟道形成区54和源极区52。 漏电极22连接到电源的第一端子，源电极62连接到电源的第二端子。 利用该半导体层50，可以提高耐压或减少电流泄漏的发生。
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公开(公告)号：US08008749B2
公开(公告)日：2011-08-30
申请号：US11667735
申请日：2005-11-14
IPC分类号： H01L29/20
CPC分类号： H01L29/7802 , H01L29/0649 , H01L29/0653 , H01L29/0692 , H01L29/0696 , H01L29/0843 , H01L29/0847 , H01L29/0891 , H01L29/2003 , H01L29/41 , H01L29/778 , H01L29/7788 , H01L29/8122
摘要： A semiconductor device is provided with a drain electrode 22, a semiconductor base plate 32, an electric current regulation layer 42 covering a part of a surface of the semiconductor base plate 32 and leaving a non-covered surface 55 at the surface of the semiconductor base plate 32, a semiconductor layer 50 covering a surface of the electric current regulation layer 42, and a source electrode 62 formed at a surface of the semiconductor layer 50. A drift region 56, a channel forming region 54, and a source region 52 are formed within the semiconductor layer 50. The drain electrode 22 is connected to a first terminal of a power source, and the source electrode 62 is connected to a second terminal of the power source. With this semiconductor layer 50, it is possible to increase withstand voltage or reduce the occurrence of current leakage.
摘要翻译： 半导体器件设置有漏电极22，半导体基板32，覆盖半导体基板32的一部分表面的电流调节层42，并在半导体基板的表面留下未被覆盖的表面55 板32，覆盖电流调节层42的表面的半导体层50和形成在半导体层50的表面的源电极62.漂移区56，沟道形成区54和源极区52是 形成在半导体层50内。漏电极22连接到电源的第一端子，源电极62连接到电源的第二端子。 利用该半导体层50，可以提高耐压或减少电流泄漏的发生。
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公开(公告)号：US07800130B2
公开(公告)日：2010-09-21
申请号：US11795117
申请日：2006-01-20
IPC分类号： H01L29/778
CPC分类号： H01L29/452 , H01L29/2003 , H01L29/42316 , H01L29/66462 , H01L29/7787
摘要： A semiconductor device 10 comprises a heterojunction between a lower semiconductor layer 26 made of p-type gallium nitride and an upper semiconductor layer 28 made of n-type AlGaN, wherein the upper semiconductor layer 28 has a larger band gap than the lower semiconductor layer 26. The semiconductor device 10 further comprises a drain electrode 32 formed on a portion of a top surface of the upper semiconductor layer 28, a source electrode 34 formed on a different portion of the top surface of the upper semiconductor layer 28, and a gate electrode 36 electrically connected to the lower semiconductor layer 26. The semiconductor device 10 can operate as normally-off.
摘要翻译： 半导体器件10包括由p型氮化镓制成的下半导体层26和由n型AlGaN制成的上半导体层28之间的异质结，其中上半导体层28具有比下半导体层26更大的带隙 半导体器件10还包括形成在上半导体层28的顶表面的一部分上的漏极32，形成在上半导体层28的顶表面的不同部分上的源极34和栅电极 36电连接到下半导体层26.半导体器件10可以正常工作。
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公开(公告)号：US20080073652A1
公开(公告)日：2008-03-27
申请号：US11632665
申请日：2005-06-22
申请人： Masahiro Sugimoto , Tetsu Kachi , Yoshitaka Nakano , Tsutomu Uesugi , Hiroyuki Ueda , Narumasa Soejima
发明人： Masahiro Sugimoto , Tetsu Kachi , Yoshitaka Nakano , Tsutomu Uesugi , Hiroyuki Ueda , Narumasa Soejima
IPC分类号： H01L29/205 , H01L21/338 , H01L29/778
CPC分类号： H01L29/778 , H01L21/28 , H01L29/2003 , H01L29/66431 , H01L29/66462 , H01L29/7787
摘要： The semiconductor device has a stacked structure in which a p-GaN layer 32, an SI-GaN layer 62, and an AlGaN layer 34 are stacked, and has a gate electrode 44 that is formed at a top surface side of the AlGaN layer 34. A band gap of the AlGaN layer 34 is wider than a band gap of the p-GaN layer 32 and the SI-GaN layer 62. Moreover, impurity concentration of the SI-GaN layer 62 is less than 1×1017 cm−3. The semiconductor devices comprising III-V semiconductors that have a stable normally-off operation are realized.
摘要翻译： 半导体器件具有层叠p-GaN层32，SI-GaN层62和AlGaN层34的堆叠结构，并且具有形成在AlGaN层34的顶面侧的栅电极44 AlGaN层34的带隙比p-GaN层32和SI-GaN层62的带隙宽。另外，SI-GaN层62的杂质浓度小于1×10 17 / SUP> cm 3 -3。 实现了具有稳定的常关断操作的包括III-V半导体的半导体器件。
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公开(公告)号：US20100044753A1
公开(公告)日：2010-02-25
申请号：US12544451
申请日：2009-08-20
IPC分类号： H01L29/205 , H01L29/78
CPC分类号： H01L29/2003 , H01L21/28264 , H01L29/41766 , H01L29/512 , H01L29/513 , H01L29/517 , H01L29/7787 , H01L29/7788
摘要： A nitride semiconductor device 2 comprises a nitride semiconductor layer 10. A gate insulating film 16 is formed on the surface of the nitride semiconductor layer 10. The gate insulating film 16 includes a portion composed of an aluminum nitride film 15 and a portion composed of an insulating material 14 that contains at least one of oxygen or silicon. A region W2 of the nitride semiconductor layer 10 facing the aluminum nitride film 15 is included in a region W1 of the nitride semiconductor layer 10 facing a gate electrode 18. The nitride semiconductor device 2 may further comprise a nitride semiconductor lower layer 8. The nitride semiconductor layer 10 may be stacked on the surface of the nitride semiconductor lower layer 8. The nitride semiconductor layer 10 may have a larger band gap than that of the nitride semiconductor lower layer 8 and have a heterojunction formed there between.
摘要翻译： 氮化物半导体器件2包括氮化物半导体层10.栅极绝缘膜16形成在氮化物半导体层10的表面上。栅极绝缘膜16包括由氮化铝膜15构成的部分和由 包含氧或硅中的至少一种的绝缘材料14。 面向氮化铝膜15的氮化物半导体层10的区域W2包含在氮化物半导体层10的面向栅极电极18的区域W1中。氮化物半导体器件2还可以包括氮化物半导体下层8.氮化物半导体层 半导体层10可以堆叠在氮化物半导体下层8的表面上。氮化物半导体层10可以具有比氮化物半导体下层8更大的带隙，并且在其间形成异质结。
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10.发明授权Nitride semiconductor device including gate insulating portion containing AIN 有权氮化物半导体器件包括含有AIN的栅极绝缘部分公开(公告)号：US08222675B2
公开(公告)日：2012-07-17
申请号：US12544451
申请日：2009-08-20
IPC分类号： H01L29/778
CPC分类号： H01L29/2003 , H01L21/28264 , H01L29/41766 , H01L29/512 , H01L29/513 , H01L29/517 , H01L29/7787 , H01L29/7788
摘要： A nitride semiconductor device 2 comprises a nitride semiconductor layer 10. A gate insulating film 16 is formed on the surface of the nitride semiconductor layer 10. The gate insulating film 16 includes a portion composed of an aluminum nitride film 15 and a portion composed of an insulating material 14 that contains at least one of oxygen or silicon. A region W2 of the nitride semiconductor layer 10 facing the aluminum nitride film 15 is included in a region W1 of the nitride semiconductor layer 10 facing a gate electrode 18. The nitride semiconductor device 2 may further comprise a nitride semiconductor lower layer 8. The nitride semiconductor layer 10 may be stacked on the surface of the nitride semiconductor lower layer 8. The nitride semiconductor layer 10 may have a larger band gap than that of the nitride semiconductor lower layer 8 and have a heterojunction formed there between.
摘要翻译： 氮化物半导体器件2包括氮化物半导体层10.栅极绝缘膜16形成在氮化物半导体层10的表面上。栅极绝缘膜16包括由氮化铝膜15构成的部分和由 包含氧或硅中的至少一种的绝缘材料14。 面向氮化铝膜15的氮化物半导体层10的区域W2包含在氮化物半导体层10的面向栅极电极18的区域W1中。氮化物半导体器件2还可以包括氮化物半导体下层8.氮化物半导体层 半导体层10可以堆叠在氮化物半导体下层8的表面上。氮化物半导体层10可以具有比氮化物半导体下层8更大的带隙，并且在其间形成异质结。
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