摘要:
According to this invention, there is provided a semiconductor static data memorizing apparatus including, a first power supply terminal, a second power supply terminal, a first TFT (thin film transistor), the first TFT having a first conductivity type, one terminal connected to the first power supply terminal, and the other terminal connected to a first data storage node for memorizing the second data, a second TFT, the TFT having the first conductivity type, one terminal connected to the first power supply terminal, and the other terminal connected to a second data storage node for memorizing the data, a third TFT, the third TFT having a second conductivity type, one terminal connected to the second power supply terminal, and the other terminal connected to the first data storage node, and a fourth TFT, the fourth TFT having the second conductivity type, one terminal connected to the second power supply terminal, and the other terminal connected to the second data storage node, wherein a gate of the first TFT is connected to the second memory node, and a gate of the second TFT is connected to the first data storage node, such that a flip-flip circuit is formed by the first power supply terminal, the second power supply terminal, the first TFT, the second TFT, the third TFT, and the fourth TFT, and further including data bit lines which are inverted with respect to each other, a first switching device for performing a switching operation between one of the bit lines and the first data storage node, a second switching device for performing a switching operation between the other of the data bit lines and the second data memory, and a word line device, connected to gates of the first and second switching devices, for controlling operations of the first and second switching devices.
摘要:
SRAM comprises a word line driving circuit selecting a predetermined number of word lines in accordance with an input address at the time of a normal operation, and simultaneously selecting all word lines or word lines, which are more than the number of word lines to be selected at the time of the normal operation, at the time of a voltage stress applying test, and a bit line load circuit applying a predetermined bias voltage to said pair of bit lines at the time of the normal operation, and controlling the bias voltage not to be applied to at least one of said pair of bit lines or applying the bias voltage, which is lower than the bias voltage at the time of the normal operation, at the time of the voltage stress test.
摘要:
In a static memory, a memory cell is constituted by only the same-channel MOSFETs. With the MOSFETs of the same channel, no well isolation region is required, and a cell size can be decreased. Moreover, the high potential side power source of a flip-flop can be used as a read word line. Thus the read word line can be driven by an ECL logic circuit.
摘要:
A static random access memory comprising a semiconductor substrate, a well region formed in the substrate and containing at least one memory cell, and a power-supply terminal connected to the well region, for applying a given bias voltage to the well region.
摘要:
A static random access memory comprising a memory cell array, a plurality of peripheral circuits, first and second power-supply voltage lines, a bonding pad, and a level-shifting circuit. The array has static memory cells each having resistors functioning as load elements. The peripheral circuits control the writing of data into, and the reading of data from, the static memory cells. The first power-supply voltage line applies a first power-supply voltage to the peripheral circuits. The bonding pad is connected to the first power-supply voltage line. The second power-supply voltage line applies a second power-supply voltage to the static memory cells. The level-shifting means is connected between the first and second power-supply voltage lines, for shifting the level of the first power-supply voltage and applying the level-shifted voltage to the static memory cells via said second power-supply voltage line.
摘要:
An address transition detecting circuit detects on address transition signal generated during the writing of input data into a static random access memory (SRAM) and generates an address detection signal as a monostable pulse of a predetermined length. A bit line precharge and equalize signals generating circuit generates, in synchronization with the address transition detection signal and an input signal on a write data line, a bit line precharge signal and bit line equalize signal which are supplied to their columns in memory. At a time of reading, the bit line precharge and equalize signals generating circuit supplies a high level potential to paired data lines to prevent a data entry from being made into the paired write data lines by a resetting operation. At a time of writing, a write data buffer circuit supplies complementary data to the paired write data lines and prevents a data signal entry from being made by a presetting operation onto the paired write data lines, for a predetermined period of time, in synchronization with the address transition detection signal. It is, therefore, possible to prevent an input signal entry for a predetermined period of time by a resetting operation and hence prevent a write error.
摘要:
According to the present invention, there is provided a semiconductor device including a power supply circuit which receives an external power supply voltage supplied, and outputs an internal power supply voltage not higher than the external power supply voltage; a system module which receives the internal power supply voltage, and performs a predetermined operation; and a performance monitor circuit which measures a processing speed of said system module when the internal power supply voltage is applied, and, on the basis of the processing speed, outputs a first control signal which requests to set the external power supply voltage at a first level, and a second control signal which requests said power supply circuit to set the internal power supply voltage at a second level. The power supply circuit outputs the internal power supply voltage having the second level on the basis of the second control signal applied thereto.
摘要:
A semiconductor device of the present invention includes a bipolar transistor and MOS transistors which are formed on the same semiconductor substrate. The bipolar transistor is heterojunction transistor having a hetero junction. The hetero-bipolar transistor is a bipolar transistor of double-hetero structure in which a material used for forming the base region thereof has a band gap narrower than a material used for forming the emitter and collector regions thereof.
摘要:
Memory cell arranged in a matrix configuration are selected by a particular word line to supply the stored data to particular bit lines. The row address decoder selects a particular word line based on the address signal, while the column address decoder selects particular bit lines based on the address signal. Each of the row address decoder and column address decoder contains a first decoder for decoding the address signal, a delay circuit for delaying the output from the first decoder when data is written into the memory cell, and a second decoder for receiving the output signals from the first decoder and delay circuit and based on these signals, selecting either a particular word line or particular bit lines.
摘要:
In a selected column, a pull-up transistor pair is not selected but, instead, a transmission gate transistor pair is selected. In the read mode, the transmission gate transistor pair serves as pull-up loads between the bit line pair. However, the transmission gate transistor pair is kept off until the voltage across the bit line pair is decreased from the power supply potential level to the threshold voltage level of the transmission gate transistors. Therefore, no DC current path is formed in the bit line pair when the voltage across the bit line pair is within a range from a voltage equal to the power supply potential level to a potential lower than the power supply potential by an amount equal to the threshold voltage level, and the rate of increase of a potential difference across the bit line pair is determined by a pull-in current of the memory cell. Therefore, a high-speed sense operation can be realized. In the write mode, the transmission gate transistor pair serves a bit line pull-up function. Since no normally-ON bit line load transistor is arranged, no direct current path including the bit line pair is present, and hence, low power consumption can be achieved.