摘要:
An oven wall three-dimensional profile data (701) representing concave and convex amounts on all over oven walls (14R, 14L) at a right side and left side of a coking chamber (11) is generated by using image signals obtained by a wall surface observation apparatus (200). A resistance index “k” in which a resistance received by pushed coke (15) resulting from a rising gradient existing on the oven wall (14) is indexed is asked by using the oven wall three-dimensional profile data (701). It can be verified that there is a correlation between this resistance index “k” and a pushing load. Accordingly, it is possible to quantitatively evaluate a state of the oven wall (14) affecting on the pushing load.
摘要:
An oven wall three-dimensional profile data (701) representing concave and convex amounts on all over oven walls (14R, 14L) at a right side and left side of a coking chamber (11) is generated by using image signals obtained by a wall surface observation apparatus (200). A resistance index “k” in which a resistance received by pushed coke (15) resulting from a rising gradient existing on the oven wall (14) is indexed is asked by using the oven wall three-dimensional profile data (701). It can be verified that there is a correlation between this resistance index “k” and a pushing load. Accordingly, it is possible to quantitatively evaluate a state of the oven wall (14) affecting on the pushing load.
摘要:
An image sensor in which each pixel includes a first sub-pixel including a first semiconductor layer, a second sub-pixel including a second semiconductor layer having a polarity different from a polarity of the first semiconductor layer, a third semiconductor layer having a polarity equal to the polarity of the first semiconductor layer, and a microlens, and which includes a plurality of pixels in which the first semiconductor is included in the second semiconductor layer, and the second semiconductor layer is included in the third semiconductor layer, wherein a center of gravity position of a light-receiving surface defining the first semiconductor layer is different from a center of gravity position of a light-receiving surface defining both the first semiconductor layer and the second semiconductor layer.
摘要:
A solid-state image sensor which comprises a pixel group in which unit pixels each including a microlens and a plurality of photo-electric converters are arrayed two-dimensionally, wherein a shielding unit that shields part of all of a plurality of photo-electric converters corresponding to a single microlens is provided in a portion of the unit pixels.
摘要:
According to one embodiment, a semiconductor memory device includes a plurality of blocks in a memory cell, each of the blocks acting as an erasure unit of data, the block including a plurality of pages, each of the pages including a plurality of memory cell transistors, each of the memory cell transistors being configured to be an erasure state or a first retention state based on a threshold voltage of the memory cell transistor, and a controller searching data in the block with respect to, writing a first flag denoting effective into a prescribed page of the block with the erasure state, and writing the first flag denoting non-effective into a prescribed page of the block with the first retention state, reading out the prescribed page of the block with the first retention state, and determining that the block is writable when the first flag denotes effective.
摘要:
A nonvolatile semiconductor memory device including a memory cell configured to store data and a resistor element provided around the memory cell. The memory cell includes a charge storage layer provided above a substrate, a first semiconductor layer formed on a top surface of the charge storage layer via an insulating layer, and a first low resistive layer formed on a top surface of the first semiconductor layer and having resistance lower than that of the first semiconductor layer. The resistor element includes a second semiconductor layer formed on the same layer as the first semiconductor layer, and a second low resistive layer formed on the same layer as the first low resistive layer and on a top surface of the second semiconductor layer, having resistance lower than that of the second semiconductor layer.
摘要:
According to one embodiment, a semiconductor device includes at least one semiconductor region provided in a semiconductor substrate, and a capacitor group including a plurality of capacitors provided in the semiconductor region, each capacitor including a capacitor insulating film provided on the semiconductor region, a capacitor electrode provided on the capacitor insulating film, and at least one diffusion layer provided in the semiconductor region adjacent to the capacitor electrode.
摘要:
A display apparatus includes a light emitting device emitting red light, a light emitting device emitting green light, and a light emitting device emitting blue light. The display apparatus includes a circular polarizer provided on the light extraction side of the light emitting devices. Each light emitting device includes a periodic structure for extracting light from the light extraction side of the light emitting device, the light being generated in a light emitting layer and guided in the in-plane direction of a substrate. Each period of the periodic structure of the light emitting devices is identical, and the period of the periodic structure is more than 200 nm and 380 nm or less.
摘要:
An image sensor in which each pixel includes a first sub-pixel including a first semiconductor layer, a second sub-pixel including a second semiconductor layer having a polarity different from a polarity of the first semiconductor layer, a third semiconductor layer having a polarity equal to the polarity of the first semiconductor layer, and a microlens, and which includes a plurality of pixels in which the first semiconductor is included in the second semiconductor layer, and the second semiconductor layer is included in the third semiconductor layer, wherein a center of gravity position of a light-receiving surface defining the first semiconductor layer is different from a center of gravity position of a light-receiving surface defining both the first semiconductor layer and the second semiconductor layer.
摘要:
The capacitance of a charge-accumulating layer of an imaging pixel is made different from that of a charge-accumulating layer of a focusing pixel, thereby reducing the difference in saturation capacitance due to the difference between the light-reception efficiencies of the imaging pixel and the focusing pixel. The ratio between the capacitance of the charge-accumulating layer of the imaging pixel and that of the charge-accumulating layer of the focusing pixel is determined in consideration of a variation in ratio between the light-reception efficiencies of the imaging pixel and the focusing pixel with a change in at least one of the exit pupil distance and the aperture value.