公开(公告)号：US20050231733A1

公开(公告)日：2005-10-20

申请号：US10301030

申请日：2003-03-04

Applicant: Paul Pfaff ,  Michael Mauck

Inventor： Paul Pfaff ,  Michael Mauck

IPC: G01B9/02 ,  G01B11/24 ,  G01N21/17 ,  G01N21/23 ,  H01L21/66

CPC classification number: G01B11/2441 ,  G01N21/1717 ,  G01N21/23 ,  G01N2021/1721 ,  H01L22/12

Abstract: A non-invasive testing system.

Abstract translation: 非侵入性检测系统。

公开(公告)号：US20060289793A1

公开(公告)日：2006-12-28

申请号：US11454967

申请日：2006-06-15

Applicant: Michael Mauck

Inventor： Michael Mauck

IPC: G01N23/00

CPC classification number: G01N23/04 ,  G21K1/093 ,  H01J37/147 ,  H01J37/3005 ,  H01J37/3007 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/887 ,  Y10S977/89

Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

公开(公告)号：US20080258073A1

公开(公告)日：2008-10-23

申请号：US12154956

申请日：2008-05-27

Applicant: Michael Mauck

Inventor： Michael Mauck

IPC: H01J3/26

CPC classification number: G01N23/04 ,  G21K1/093 ,  H01J37/147 ,  H01J37/3005 ,  H01J37/3007 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/887 ,  Y10S977/89

Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

Abstract translation: 一种用于连接至少两束带电粒子的系统，包括将第一光束沿着第一轴线引导到场中。 沿着第二轴将第二光束引导到场中。 第一和第二光束通过场和第一和第二光束之间的相互作用转动成沿着第三轴指向的第三光束。

公开(公告)号：US07078852B2

公开(公告)日：2006-07-18

申请号：US11084409

申请日：2005-03-17

Applicant: Michael Mauck

Inventor： Michael Mauck

IPC: H05H7/06

CPC classification number: G01N23/04 ,  G21K1/093 ,  H01J37/147 ,  H01J37/3005 ,  H01J37/3007 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/887 ,  Y10S977/89

Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

公开(公告)号：US06522056B1

公开(公告)日：2003-02-18

申请号：US09608908

申请日：2000-06-30

Applicant: Michael Mauck

Inventor： Michael Mauck

IPC: H05H706

CPC classification number: G01N23/04 ,  G21K1/093 ,  H01J37/147 ,  H01J37/3005 ,  H01J37/3007 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/887 ,  Y10S977/89

Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

公开(公告)号：US07381949B2

公开(公告)日：2008-06-03

申请号：US11454967

申请日：2006-06-15

Applicant: Michael Mauck

Inventor： Michael Mauck

IPC: B01D59/44

CPC classification number: G01N23/04 ,  G21K1/093 ,  H01J37/147 ,  H01J37/3005 ,  H01J37/3007 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/887 ,  Y10S977/89

Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

公开(公告)号：US20050161616A1

公开(公告)日：2005-07-28

申请号：US11084409

申请日：2005-03-17

Applicant: Michael Mauck

Inventor： Michael Mauck

IPC: G21K1/00 ,  C23C14/54 ,  G21K1/093 ,  G21K5/04 ,  H01J3/07 ,  H01J37/04 ,  H01J37/147 ,  H01J37/153 ,  H01J37/21 ,  H01J37/30 ,  H01J37/317 ,  H01L21/027 ,  G01J1/00 ,  G01N23/00 ,  H01J37/08

CPC classification number: G01N23/04 ,  G21K1/093 ,  H01J37/147 ,  H01J37/3005 ,  H01J37/3007 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/887 ,  Y10S977/89

Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

公开(公告)号：US06611087B2

公开(公告)日：2003-08-26

申请号：US10213828

申请日：2002-08-06

Applicant: Michael Mauck

Inventor： Michael Mauck

IPC: H05H706

CPC classification number: G01N23/04 ,  G21K1/093 ,  H01J37/147 ,  H01J37/3005 ,  H01J37/3007 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/887 ,  Y10S977/89

Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

公开(公告)号：US07206078B2

公开(公告)日：2007-04-17

申请号：US10301030

申请日：2002-11-20

Applicant: Paul Pfaff ,  Michael Mauck

Inventor： Paul Pfaff ,  Michael Mauck

IPC: G01N21/24 ,  G01N21/43

CPC classification number: G01B11/2441 ,  G01N21/1717 ,  G01N21/23 ,  G01N2021/1721 ,  H01L22/12

Abstract: A noninvasive testing system using a method of testing a device under test by providing a beam of light from a light source having a first wavelength, and in a first beam instance imposing the beam of light on a test device when the test device has a first state of refractive indexes, and in a second beam instance imposing the beam of light on the test device when the test device has a second state of refractive indexes, in both instances the beam of light being imposed on the test device over a spatial region within the test device substantially greater than the first wavelength. Data resulting from the interference of the first beam instance and the second beam instance within the device under test is obtained representative of the voltages within the region. The first state of refractive indexes is at a first voltage potential, and the second state of refractive indexes is at a second voltage potential different from the first voltage potential.

Abstract translation: 一种无创测试系统，其使用通过从具有第一波长的光源提供光束并且在测试装置具有第一波长的第一波束实例中将光束强加在测试装置上时，测试被测器件的方法 并且在第二光束实例中，当测试装置具有第二折射率时，在测试装置上施加光束的第二光束实例中，在两种情况下，光束被施加在测试装置上的空间区域内 所述测试装置基本上大于所述第一波长。 获得由第一光束实例和被测器件内的第二光束实例的干涉产生的数据代表该区域内的电压。 折射率的第一状态处于第一电压电位，并且第二折射率状态处于不同于第一电压电位的第二电压电位。

公开(公告)号：US06906453B2

公开(公告)日：2005-06-14

申请号：US10842899

申请日：2004-05-10

Applicant: Michael Mauck

Inventor： Michael Mauck

IPC: G21K1/00 ,  C23C14/54 ,  G21K1/093 ,  G21K5/04 ,  H01J3/07 ,  H01J37/04 ,  H01J37/147 ,  H01J37/153 ,  H01J37/21 ,  H01J37/30 ,  H01J37/317 ,  H01L21/027 ,  H05H7/06

CPC classification number: G01N23/04 ,  G21K1/093 ,  H01J37/147 ,  H01J37/3005 ,  H01J37/3007 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/887 ,  Y10S977/89

Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

Abstract translation: 一种用于连接至少两束带电粒子的系统，包括将第一光束沿着第一轴线引导到场中。 沿着第二轴将第二光束引导到场中。 第一和第二光束通过场和第一和第二光束之间的相互作用转动成沿着第三轴指向的第三光束。