公开(公告)号：US20230207488A1

公开(公告)日：2023-06-29

申请号：US17976409

申请日：2022-10-28

Applicant: Micron Technology, Inc.

Inventor： Faxing Che ,  Hong Wan Ng ,  Yeow Chon Ong ,  Wei Yu ,  Ling Pan ,  Lin Bu

IPC: H01L23/00 ,  H01L25/00 ,  H01L25/065 ,  H01L23/498

CPC classification number: H01L23/562 ,  H01L25/50 ,  H01L25/0652 ,  H01L23/49816 ,  H01L23/49838 ,  H01L2924/1438 ,  H01L2924/182 ,  H01L24/48 ,  H01L24/32 ,  H01L2224/48011 ,  H01L2224/48091 ,  H01L2224/48221 ,  H01L24/73 ,  H01L2224/73265 ,  H01L2224/73215 ,  H01L2224/48145 ,  H01L2224/32145 ,  H01L2224/32245

Abstract: A semiconductor package assembly includes a substrate, a die stack including at least a bottom die, an inert top spacer, and at least a first inert base spacer. The inert top and base spacers are exclusive of any circuits. A top surface of the inert top spacer is directly attached to a bottom surface of the bottom die in the die stack. A top surface of the first inert base spacer is directly attached to a bottom surface of the inert top spacer and a bottom surface of the first inert base spacer is directly attached to the substrate. The footprint of the inert base spacer is smaller than the footprint of the inert top spacer. In some embodiments, the footprint of the inert base spacer is positioned entirely within the footprint of the inert top spacer.

公开(公告)号：US20240038704A1

公开(公告)日：2024-02-01

申请号：US17874206

申请日：2022-07-26

Applicant: Micron Technology, Inc.

Inventor： Faxing Che ,  Hong Wan Ng ,  Yeow Chon Ong

IPC: H01L23/00

CPC classification number: H01L24/13 ,  H01L24/16 ,  H01L24/11 ,  H01L24/81 ,  H01L2224/81815 ,  H01L2224/81203 ,  H01L2924/37001 ,  H01L2924/3512 ,  H01L2224/16148 ,  H01L2224/16221 ,  H01L2224/11462 ,  H01L2224/13007 ,  H01L2224/13014 ,  H01L2224/13017 ,  H01L2224/13019 ,  H01L2224/13076 ,  H01L2224/13147 ,  H01L2224/13541 ,  H01L2224/1355 ,  H01L2224/13655 ,  H01L2224/1369 ,  H01L2224/13582

Abstract: In some embodiments, a semiconductor device assembly can include a first semiconductor die, a second semiconductor die, and an interconnection structure therebetween. The interconnection structure can directly electrically couple the first and the second semiconductor dies. The interconnection structure can include an inner metallic pillar, an outer metallic shell, a continuous metallic bridging layer, and a dielectric liner. The outer metallic shell can surround and be spaced from the inner metallic pillar, the continuous metallic bridging layer can be over and connected with the inner metallic pillar and the outer metallic shell, and the dielectric liner can be between the inner metallic pillar and the outer metallic shell. In some embodiments, the second semiconductor die can be excluded and the interconnection structure can solely be coupled to the first semiconductor die.

公开(公告)号：US20240047285A1

公开(公告)日：2024-02-08

申请号：US17883153

申请日：2022-08-08

Applicant: Micron Technology, Inc.

Inventor： Faxing Che ,  Wei Yu ,  Yeow Chon Ong ,  Shin Yueh Yang ,  Hong Wan Ng

IPC: H01L23/14 ,  H01L21/52

CPC classification number: H01L23/14 ,  H01L21/52

Abstract: A semiconductor device assembly includes a semiconductor die, a substrate, and a spacer directly coupled to the substrate. The spacer includes a flexible main body and a support structure embedded in the flexible main body, wherein the support structure has a higher stiffness than the flexible main body. The spacer carries the semiconductor die. The flexible main body of the spacer mitigates the effects of thermomechanical stress, for example caused by a mismatch between the coefficient of thermal expansion of the semiconductor die and the substrate. The embedded support structure provides strength needed to support the semiconductor die during assembly.

公开(公告)号：US20240063141A1

公开(公告)日：2024-02-22

申请号：US17891535

申请日：2022-08-19

Applicant: Micron Technology, Inc.

Inventor： Faxing Che ,  Yeow Chon Ong

IPC: H01L23/00 ,  H01L23/498

CPC classification number: H01L23/562 ,  H01L23/49811 ,  H01L23/49838

Abstract: A semiconductor package can include a substrate having bonded thereto an array of solder joints. Each of the solder joints in the array can have a first surface area and a first shape. The semiconductor package can further include at least one differently-sized solder joint having a second surface area larger than the first surface area. The differently-sized solder joint can have a second shape different from the first shape. Other systems, methods and apparatuses are described.