摘要:
A semiconductor device includes a first semiconductor chip and a second semiconductor chip stacked on the first semiconductor chip. The second semiconductor chip includes a high-speed serial I/F circuit which transfers serial data between the high-speed serial I/F circuit and an external device through a serial bus, and transfers parallel data between the high-speed serial I/F circuit and an internal circuit included in the first semiconductor chip. A physical layer circuit of the high-speed serial I/F circuit is disposed on a first side of the second semiconductor chip which is the short side, and a logic circuit is disposed on a third side opposite to the first side.
摘要:
A semiconductor device includes a first semiconductor chip and a second semiconductor chip stacked on the first semiconductor chip. The second semiconductor chip includes a high-speed serial I/F circuit which transfers serial data between the high-speed serial I/F circuit and an external device through a serial bus, and transfers parallel data between the high-speed serial I/F circuit and an internal circuit included in the first semiconductor chip. A physical layer circuit of the high-speed serial I/F circuit is disposed on a first side of the second semiconductor chip which is the short side, and a logic circuit is disposed on a third side opposite to the first side.
摘要:
A semiconductor device includes a first semiconductor chip, and a second semiconductor chip which includes a high-speed serial I/F circuit which transfers serial data between the high-speed serial I/F circuit and an external device through a serial bus and is stacked on the first semiconductor chip. A pad region in which pads (electrodes) for connecting the external device and the high-speed serial I/F circuit are disposed is provided along a first side of the second semiconductor chip which is the short side. A pad region in which pads for connecting an internal circuit included in the first semiconductor chip and the high-speed serial I/F circuit are disposed is provided along a second side of the second semiconductor chip which is the long side.
摘要:
A semiconductor device includes a first semiconductor chip, and a second semiconductor chip which includes a high-speed serial I/F circuit which transfers serial data between the high-speed serial I/F circuit and an external device through a serial bus and is stacked on the first semiconductor chip. A pad region in which pads (electrodes) for connecting the external device and the high-speed serial I/F circuit are disposed is provided along a first side of the second semiconductor chip which is the short side. A pad region in which pads for connecting an internal circuit included in the first semiconductor chip and the high-speed serial I/F circuit are disposed is provided along a second side of the second semiconductor chip which is the long side.
摘要:
A semiconductor device includes a first semiconductor chip, and a second semiconductor chip which includes a high-speed serial I/F circuit which transfers serial data between the high-speed serial I/F circuit and an external device through a serial bus and is stacked on the first semiconductor chip. A pad region in which pads (electrodes) for connecting the external device and the high-speed serial I/F circuit are disposed is provided along a first side of the second semiconductor chip which is the short side. A pad region in which pads for connecting an internal circuit included in the first semiconductor chip and the high-speed serial I/F circuit are disposed is provided along a second side of the second semiconductor chip which is the long side.
摘要:
A semiconductor device includes a first semiconductor chip, and a second semiconductor chip which includes a high-speed serial I/F circuit which transfers serial data between the high-speed serial I/F circuit and an external device through a serial bus and is stacked on the first semiconductor chip. A pad region in which pads (electrodes) for connecting the external device and the high-speed serial I/F circuit are disposed is provided along a first side of the second semiconductor chip which is the short side. A pad region in which pads for connecting an internal circuit included in the first semiconductor chip and the high-speed serial I/F circuit are disposed is provided along a second side of the second semiconductor chip which is the long side.
摘要:
A clock signal correction circuit which corrects duty cycle distortions of a clock signal in a simple and accurate way. A frequency divider divides the frequency of a given input clock signal by a natural number n, thereby producing a divided clock signal. The phase of this divided clock signal is identified by a phase detector. By adding an appropriate delay to the divided clock signal according to the identified signal phase, a delay unit produces a delayed divided clock signal. A logical operator creates an output clock signal by performing a logical operation on the original divided clock signal and the delayed divided clock signal.
摘要:
According to the present invention, a first voltage is generated at a drain of a first MESFET by a first stage circuit that includes a plurality of diode elements and the first MESFET with its gate and drain connected together provided between power sources. The first voltage is applied to a gate of a second MESFET that performs a source follower operation so that a constant second voltage, which is lower by the equivalent of a threshold voltage than the first voltage, is generated at the source. A third MESFET with a diode connection is provided between the second voltage source and a lower power source, and a bias voltage is generated at the drain terminal of the third MESFET. The bias voltage is supplied to the gate of a constant-current transistor, the source of which is connected to the lower power source. The current of the constant-current transistor is supplied to an SCFL circuit, the source of which is connected for common use.
摘要:
A non-volatile memory device is provided, which includes a first block for storing a first data group including a test data, a second block for storing a second data group including a complementary data to the first data group, a differential sense amplifier for generating an output value based on a difference between two input signals, a diagnostic circuit for performing a failure diagnosis using a value from the differential sense amplifier, and a control circuit which performs control such that a signal based on the test data and the complementary data is set to the input signal of the differential sense amplifier and the diagnostic circuit executes a failure diagnosis of the differential sense amplifier. The non-volatile memory device performs a failure diagnosis with high reliability capable of distinguishing between a failure of sense amplifier and a failure of a memory cell.
摘要:
A signal judgement circuit making a judgement on a signal includes: an error signal generation circuit receiving signals via at least four signal lines and outputting an error signal when, of all the received signals, the number of signals taking on a same value does not exceed half of the number of the received signals; and an output selection circuit selecting any one of the received signals and outputting the selected signal.