Apparatus for fabricating a display device
    2.
    发明申请
    Apparatus for fabricating a display device 审中-公开
    用于制造显示装置的装置

    公开(公告)号:US20070041410A1

    公开(公告)日:2007-02-22

    申请号:US11588387

    申请日:2006-10-27

    IPC分类号: H01S3/10 G02B27/10

    摘要: Apparatus for fabricating a display device includes a stage capable of mounting an insulating substrate of the display device and moving the insulating substrate, linear scales which detect a position or moving distance of the substrate, a laser oscillator which generates continuous-waves laser light, a modulator which turns ON/OFF the continuous-wave laser light, a beam forming optic which shapes the continuous-wave laser light passing through the modulator into a linear or rectangular form, an objective lens which projects the at least one of the laser light on the insulating substrate so as to irradiate the insulating substrate with the laser light. The controller counts signals generated by the linear scales for every movement of the stage for a given distance, causes the modulator to turn the generated continuous-wave laser light in an ON state at time when a position of the insulating substrate on which the laser light irradiation is to be started reaches an area on which the laser light is projected, and causes the modulator to turn the generated continuous-wave laser light in an OFF state at another time.

    摘要翻译: 用于制造显示装置的装置包括能够安装显示装置的绝缘基板并移动绝缘基板的台,检测基板的位置或移动距离的线性标尺,产生连续波激光的激光振荡器, 将连续波激光切换为ON / OFF的调制器,将通过调制器的连续波激光成形为直线或矩形的光束形成光学器件,将至少一个激光投射到的物镜 绝缘基板,以激光照射绝缘基板。 控制器对于给定距离的级的每次移动来对由线性标尺产生的信号进行计数,使得调制器将产生的连续波激光在其上的激光的绝缘基板的位置处于接通状态 照射开始到达投射激光的区域,并且使得调制器在另一时间将所产生的连续波激光转为OFF状态。

    Semiconductor thin film manufacturing method
    7.
    发明申请
    Semiconductor thin film manufacturing method 有权
    半导体薄膜制造方法

    公开(公告)号:US20050214959A1

    公开(公告)日:2005-09-29

    申请号:US11030065

    申请日:2005-01-07

    摘要: A method of forming a semiconductor thin film. includes a highly sensitive inspection method for detecting lateral crystals and a crystallizing method. In the crystallizing method, the time-based pulse width of a laser SXL is modulated and an approximate band-like crystal silicon film SPSI is formed in a desired region while scanning the substrate SUB1 bidirectionally in the X and −X directions. In the inspection method, an inspection beam PRO1 is irradiated to the substrate just after the laser SXL is turned off. A protrusion TOKI will be formed on the silicon film portion where the laser SXL is turned off if the state of the silicon film is that of a lateral crystal SPSI. The inspection beam PRO1 is scattered by the protrusion TOKI and observed by a detector. If the state of the silicon film is granular crystal GGSI or aggregated film AGSI, such a protrusion TOKI is not observed.

    摘要翻译: 一种形成半导体薄膜的方法。 包括用于检测横向晶体的高灵敏度检查方法和结晶方法。 在结晶方法中,激光SXL的时间脉冲宽度被调制,并且在X和-X方向双向扫描衬底SUB 1的同时,在所需区域中形成近似带状晶体硅膜SPSI。 在检查方法中,在激光SXL关闭之后,将检查光束PRO 1照射到基板。 如果硅膜的状态是横向晶体SPSI的状态,则在硅膜部分上形成突起TOKI,其中激光SXL截止。 检测光束PRO 1由突出部TOKI散射并由检测器观测。 如果硅膜的状态是粒状晶体GGSI或聚集膜AGSI,则不观察到这样的突起TOKI。

    Semiconductor thin film manufacturing method
    8.
    发明授权
    Semiconductor thin film manufacturing method 有权
    半导体薄膜制造方法

    公开(公告)号:US07981701B2

    公开(公告)日:2011-07-19

    申请号:US11030065

    申请日:2005-01-07

    IPC分类号: H01L21/00

    摘要: A method of forming a semiconductor thin film includes a highly sensitive inspection method for detecting lateral crystals and a crystallizing method. In the crystallizing method, the time-based pulse width of a laser SXL is modulated and an approximate band-like crystal silicon film SPSI is formed in a desired region while scanning the substrate SUB1 bidirectionally in the X and −X directions. In the inspection method, an inspection beam PRO1 is irradiated to the substrate just after the laser SXL is turned off. A protrusion TOKI will be formed on the silicon film portion where the laser SXL is turned off if the state of the silicon film is that of a lateral crystal SPSI. The inspection beam PRO1 is scattered by the protrusion TOKI and observed by a detector. If the state of the silicon film is granular crystal GGSI or aggregated film AGSI, such a protrusion TOKI is not observed.

    摘要翻译: 形成半导体薄膜的方法包括用于检测横向晶体的高灵敏度检测方法和结晶方法。 在结晶方法中,激光SXL的基于时间的脉冲宽度被调制,并且在X和-X方向双向扫描衬底SUB1的同时,在所需区域中形成近似带状晶体硅膜SPSI。 在检查方法中,在激光SXL关闭之后,将检查光束PRO1照射到基板。 如果硅膜的状态是横向晶体SPSI的状态,则在硅膜部分上形成突起TOKI,其中激光SXL截止。 检测光束PRO1由突出部TOKI散射并由检测器观测。 如果硅膜的状态是粒状晶体GGSI或聚集膜AGSI,则不观察到这样的突起TOKI。

    Laser annealing apparatus and annealing method of semiconductor thin film using the same
    9.
    发明授权
    Laser annealing apparatus and annealing method of semiconductor thin film using the same 有权
    激光退火装置及使用其的半导体薄膜的退火方法

    公开(公告)号:US07397831B2

    公开(公告)日:2008-07-08

    申请号:US10986936

    申请日:2004-11-15

    IPC分类号: H01S3/00

    摘要: A laser beam temporally modulated in amplitude by a modulator and shaped into a long and narrow shape by a beam shaper is rotated around the optical axis of an image rotator inserted between the beam shaper and a substrate. Thus, the longitudinal direction of the laser beam having the long and narrow shape is rotated around the optical axis on the substrate. In order to perform annealing in a plurality of directions on the substrate, the laser beam shaped into the long and narrow shape is rotated on the substrate while a stage mounted with the substrate is moved only in two directions, that is, X- and Y-directions.In such a manner, the substrate can be scanned at a high speed with a continuous wave laser beam modulated temporally in amplitude and shaped into a long and narrow shape, without rotating the substrate. Thus, a semiconductor film can be annealed.

    摘要翻译: 通过调制器暂时调制振幅的激光束并通过光束整形器成形为长而窄的形状围绕插入在光束整形器和基板之间的图像旋转器的光轴旋转。 因此,具有长而窄形状的激光束的纵向方向围绕基板上的光轴旋转。 为了在基板上沿多个方向进行退火,将形成为长而窄的形状的激光束在基板上旋转,而安装有基板的台仅沿两个方向移动,即,X轴和Y轴 方向 以这样一种方式,可以用波长时间上调制并成形为长而窄的连续波激光束高速扫描基板,而不旋转基板。 因此,半导体膜可以退火。