Method for the preparation of silicon carbide whiskers
    1.
    发明授权
    Method for the preparation of silicon carbide whiskers 失效
    碳化硅晶须的制备方法

    公开(公告)号:US4981666A

    公开(公告)日:1991-01-01

    申请号:US931667

    申请日:1986-11-17

    IPC分类号: C30B29/62 C30B25/00

    CPC分类号: C30B25/005 C30B29/36

    摘要: In place of the conventional silicon source materials used in the prior art method for the preparation of silicon carbide whiskers, the inventive method utilizes a hydrolysis product of a chlorosilane compound R.sub.a SiCl.sub.4-a or a chlorodisilane compound R.sub.b Si.sub.2 Cl.sub.6-b, in which R is a hydrogen atom or a monovalent hydrocarbon group, a is zero to 3 and b is 1 to 5, as the silicon source which is intimately mixed with a powder of carbon and the mixture is heated at 1400.degree. to 1700.degree. C. to give silicon carbide whiskers in a high conversion. Alternatively, the hydrolysis of the chloro(di)silane compound is performed in an aqueous medium in which a powder of carbon is dispersed in advance so that the hydrolysis product as formed is already a mixture with the carbon powder.

    摘要翻译: 本发明方法代替用于制备碳化硅晶须的现有技术方法中使用的常规硅源材料,其利用氯硅烷化合物RaSiCl4-a或氯二硅烷化合物RbSi2Cl6-b的水解产物,其中R为氢 原子或一价烃基,a为0〜3,b为1〜5,作为与碳粉充分混合的硅源,将混合物在1400〜1700℃下加热,得到碳化硅晶须 在高转换。 或者,氯(二)硅烷化合物的水解在预先分散有碳粉末的水性介质中进行,使得形成的水解产物已经是与碳粉末的混合物。

    Method for the preparation of a sintered body of silicon carbide
    2.
    发明授权
    Method for the preparation of a sintered body of silicon carbide 失效
    制备碳化硅烧结体的方法

    公开(公告)号:US5011639A

    公开(公告)日:1991-04-30

    申请号:US453038

    申请日:1989-12-12

    CPC分类号: H01L21/4807 C04B35/565

    摘要: A powdery mixture of a fine silicon carbide powder admixed with boron or a boron compound, e.g. boron carbide, titanium boride and boron oxide, as a sintering aid is compression-molded into a green body which is subjected to a sintering treatment into a sintered body. Different from conventional methods in which the sintering treatment is performed always in an atmosphere of an inert gas, e.g. argon, the sintering treatment in the inventive method is performed in an atmosphere of a rare gas containing 0.005-5% by volume of nitrogen. The sintered body of silicon carbide obtained by this method has an outstandingly high electric volume resistivity of 10.sup.10 to 10.sup.13 ohm.cm and a coefficient of thermal conductivity of 100-220 W/m.K.

    摘要翻译: 与硼或硼化合物混合的细碳化硅粉末的粉末混合物,例如 作为烧结助剂的碳化硼,硼化钛和氧化硼被压缩成型坯,其经历烧结处理成烧结体。 不同于常规方法,其中始终在惰性气体气氛中进行烧结处理,例如, 氩气中,本发明方法中的烧结处理在含有0.005-5体积%氮气的稀有气体的气氛中进行。 通过该方法获得的碳化硅烧结体具有极高的体积电阻率为1010至1013欧姆·厘米,导热系数为100-220W / m·K。

    Method for the preparation of a sintered body of silicon carbide
    4.
    发明授权
    Method for the preparation of a sintered body of silicon carbide 失效
    制备碳化硅烧结体的方法

    公开(公告)号:US4762810A

    公开(公告)日:1988-08-09

    申请号:US17818

    申请日:1987-02-24

    CPC分类号: C04B35/571

    摘要: Sintered bodies of silicon carbide having remarkably increased volume resistivity and thermal conductivity can be obtained by heating a green body shaped of a fine silicon carbide powder admixed with boron or a boron compound, e.g. boron carbide, titanium boride and boron oxide, as a sintering aid at 1800.degree. to 2200.degree. C. in the presence of or in the vicinity of a shaped body of a powdery mixture of a fine silicon carbide powder admixed with boron nitride in the same furnace. The improvements in the volume resistivity and thermal conductivity of the sintered body are particularly remarkable when the fine silicon carbide powder is a pyrolysis product of a methyl hydrogen silane compound such as tetramethyl disilane.

    摘要翻译: 可以通过加热与硼或硼化合物混合的细小碳化硅粉末的生坯体,例如通过加热形成具有显着增加的体积电阻率和导热性的碳化硅的烧结体。 碳化硼,硼化钛和氧化硼作为烧结助剂,在1800-2200℃下,在与其相同的氮化硼混合的细碳化硅粉末的粉末混合物的成形体存在下或其附近 炉。 当细碳化硅粉末是甲基氢硅烷化合物如四甲基乙硅烷的热解产物时,烧结体的体积电阻率和热导率的改善是特别显着的。

    Method for preparing hexamethyl cyclotrisilazane
    5.
    发明授权
    Method for preparing hexamethyl cyclotrisilazane 失效
    制备十六烷基环己烷的方法

    公开(公告)号:US5075474A

    公开(公告)日:1991-12-24

    申请号:US679199

    申请日:1991-04-02

    IPC分类号: B01J31/02 C07F7/10 C07F7/21

    CPC分类号: C07F7/21

    摘要: According to the method for preparing hexamethyl cyclotrisilazane of the present invention, hexamethyl cyclotrisilazane can be obtained by heating a linear or cyclic silazane compound represented by the following general formula:--(Me.sub.2 SiNH).sub.n --(wherein Me represents a methyl group and n is an integer of not less than 4) in the presence of at least one catalytic compound selected from the group consisting of ammonium salts of arylsulfonic acids and/or aminoarylsulfonic acids and the resulting hexamethyl cyclotrisilazane represented by the formula: --Me.sub.2 SiNH).sub.3 -- can be recovered by distilling off the same outside the reaction system. According to the method of the present invention, highly pure hexamethyl cyclotrisilazane can be industrially prepared in good efficiency and in a high yield. In particular, if octamethyl cyclotetrasilazane which can be industrially prepared from cheap dimethyldichlorosilane is used as a starting material, hexamethyl cyclotrisilazane can also be prepared at a low cost. Thus, the method of the present invention has enough practical value in the organic silicon industries.

    Manufacturing method and apparatus for semiconductor device
    7.
    发明授权
    Manufacturing method and apparatus for semiconductor device 失效
    半导体器件的制造方法和装置

    公开(公告)号:US06174650B1

    公开(公告)日:2001-01-16

    申请号:US09010830

    申请日:1998-01-22

    IPC分类号: G03F700

    摘要: In a clean room, after conducting a surface treatment on the surface of a semiconductor substrate with 4-trimethylsiloxy-3-penten-2-one, the treated surface of the semiconductor substrate is coated with a chemically amplified resist, thereby forming a first resist film. Then, the first resist film is successively subjected to exposure, PEB and development, thereby forming a first resist pattern of the chemically amplified resist. Next, in the same clean room, after conducting a surface treatment on the surface of the semiconductor substrate with 4-dimethyl-n-hexylsiloxy-3-penten-2-one, the treated surface of the semiconductor substrate is coated with a non-chemically amplified resist, thereby forming a second resist film. Then, the second resist film is successively subjected to the exposure, the PEB and the development, thereby forming a second resist pattern of the non-chemically amplified resist.

    摘要翻译: 在洁净室中,在用4-三甲基甲硅烷氧基-3-戊烯-2-酮在半导体衬底的表面进行表面处理后,用化学放大抗蚀剂涂覆半导体衬底的处理表面,从而形成第一抗蚀剂 电影。 然后,依次对第一抗蚀剂膜进行曝光,PEB显影,形成化学放大抗蚀剂的第一抗蚀剂图案。 接下来,在相同的洁净室中,在用4-二甲基 - 正己基甲硅烷氧基-3-戊烯-2-酮在半导体基板的表面上进行表面处理后, 化学放大抗蚀剂,从而形成第二抗蚀剂膜。 然后,第二抗蚀剂膜依次经受曝光,PEB和显影,由此形成非化学放大抗蚀剂的第二抗蚀剂图案。

    Silazane-based, heat resistant, dielectric coating compositions
    8.
    发明授权
    Silazane-based, heat resistant, dielectric coating compositions 失效
    硅氮烷,耐热,介电涂料组合物

    公开(公告)号:US5393815A

    公开(公告)日:1995-02-28

    申请号:US95353

    申请日:1993-07-20

    CPC分类号: H01B3/46 C09D183/16

    摘要: By blending a silazane with an organic silicon polymer such as polycarbosilane and polysilazane and inorganic powder such as alumina and silica, there is obtained a coating composition which can be applied and baked onto metallic and non-metallic substrates to form dielectric coatings which are improved in many properties including substrate adhesion, hardness, electrical insulation, heat resistance, water resistance, and chemical resistance.

    摘要翻译: 通过将硅氮烷与有机硅聚合物如聚碳硅烷和聚硅氮烷以及无机粉末如氧化铝和二氧化硅共混,得到一种涂料组合物,可以在金属和非金属基材上涂覆和烘烤以形成电介质涂层, 许多性质包括基底粘附性,硬度,电绝缘性,耐热性,耐水性和耐化学性。

    Pattern formation method and surface treating agent
    9.
    发明授权
    Pattern formation method and surface treating agent 失效
    图案形成方法和表面处理剂

    公开(公告)号:US06258972B1

    公开(公告)日:2001-07-10

    申请号:US08691124

    申请日:1996-08-01

    IPC分类号: C07E708

    CPC分类号: G03F7/0751

    摘要: To the surface of a semiconductor substrate made of silicon, isopropenoxytrimethylsilane is supplied as a surface treating agent to render the surface of the semiconductor substrate hydrophobic and increase adhesion to the semiconductor substrate. Thus, Si(CH3)3 (trimethylsilyl group) is substituted for the hydrogen atom of an OH group on the surface of the semiconductor substrate, resulting in (CH3)2CO (acetone). Subsequently, a chemically amplified resist is applied to the surface of the semiconductor substrate and exposed to light by using a desired mask, followed sequentially by PEB and development for forming a pattern. Since the surface treating agent does not generate ammonia, there can be formed a pattern in excellent configuration with no insoluble skin layer formed thereon.

    摘要翻译: 向由硅制成的半导体衬底的表面提供异丙烯氧基三甲基硅烷作为表面处理剂,使半导体衬底的表面疏水化并增加对半导体衬底的粘合性。 因此,将Si(CH 3)3(三甲基甲硅烷基)取代为半导体衬底的表面上的OH基的氢原子,得到(CH 3)2 CO(丙酮)。 随后,通过使用所需的掩模将化学放大型抗蚀剂施加到半导体衬底的表面并暴露于光,然后依次由PEB和显影形成图案。 由于表面处理剂不产生氨,因此可以形成具有优异构型的图案,其上不形成不溶性表皮层。