Abstract:
A conductive multi-touch touch-sensitive panel includes two intersecting but electrically isolated arrays of linear conductors which can be brought into electrical contact by touching the panel. A display element may be positioned beneath the two arrays of linear conductors to provide a touchscreen panel. A touch to a cover plate or member causes one or more linear conductors in one array to contact one or more linear conductors in the other array. The location of a touch to the panel can be detected by individually or sequentially applying an electrical signal, such as a voltage or current, to each linear conductor in one array while sensing voltage or current on each of the linear conductors in the other array.
Abstract:
A time-analog-to-digital converter (TAD) utilizes a time-to-digital approach for analog-to-digital conversion. The TAD includes two voltage-to-delay converters (VDCs), e.g., CMOS inverter chains, in order to increase the dynamic range of the TAD. Each VDC can handle a different range of input voltages. Comparators compare the input signal voltage to reference voltages corresponding to the different ranges of input voltage and a selector selects one of the VDC line outputs based on the range in which the input signal lies. A filter estimates the input signal voltage from a delay signal from the selected output.
Abstract:
Delay circuits capable of providing delays closely matching propagation delays of synchronous circuits are described. In one design, an apparatus includes a synchronous circuit and a delay circuit. The synchronous circuit includes a forward path from a data input to a data output. The synchronous circuit receives input data and provides output data with a propagation delay. The delay circuit receives an input signal and provides a delayed input signal having a delay matching the propagation delay of the synchronous circuit. The delay circuit includes at least two logic gates in the forward path of the synchronous circuit. The synchronous and delay circuits may be implemented based on the same or similar circuit architecture. The delay circuit may be based on a replica of the synchronous circuit, with the replica having feedback loops broken and clock input coupled to appropriate logic value to always enable the delay circuit.
Abstract:
Delay circuits capable of providing delays closely matching propagation delays of synchronous circuits are described. In one design, an apparatus includes a synchronous circuit and a delay circuit. The synchronous circuit includes a forward path from a data input to a data output. The synchronous circuit receives input data and provides output data with a propagation delay. The delay circuit receives an input signal and provides a delayed input signal having a delay matching the propagation delay of the synchronous circuit. The delay circuit includes at least two logic gates in the forward path of the synchronous circuit. The synchronous and delay circuits may be implemented based on the same or similar circuit architecture. The delay circuit may be based on a replica of the synchronous circuit, with the replica having feedback loops broken and clock input coupled to appropriate logic value to always enable the delay circuit.
Abstract:
A method and apparatus for boosting the gate voltages of a CMOS switch used in an integrated circuit designed in a sub-micron CMOS process is disclosed. The CMOS switch is coupled to Vin and Vout nodes, and contains PMOS and NMOS gates. Two boosting circuits are used to change the voltage on the PMOS and NMOS gates, respectively. The voltage at the NMOS gate is boosted from VDD to (VDD+K×VDD). The voltage at the PMOS gate is decreased from VGND to (VGND−k×VGND). The factor k is chosen such that Vout can be sampled through the entire range of Vin=VGND to VDD, even where VDD approaches the sum of the absolute values of the threshold voltages of the respective PMOS and NMOS transistors.
Abstract:
A method and apparatus for boosting the gate voltages of a CMOS switch used in an integrated circuit designed in a sub-micron CMOS process is disclosed. The CMOS switch is coupled to Vin and Vout nodes, and contains PMOS and NMOS gates. Two boosting circuits are used to change the voltage on the PMOS and NMOS gates, respectively. The voltage at the NMOS gate is boosted from VDD to (VDD+K×VDD). The voltage at the PMOS gate is decreased from VGND to (VGND−k×VGND). The factor k is chosen such that Vout can be sampled through the entire range of Vin=VGND to VDD, even where VDD approaches the sum of the absolute values of the threshold voltages of the respective PMOS and NMOS transistors.
Abstract:
An error correction circuit for use with an analog-to-digital converter (ADC) comprising correction capacitance switching means coupled to the correction capacitance means. The switching means being coupled to ground and to a plurality of reference voltages and being arranged to a couple a bottom plate of the correction capacitance means to ground during a sample phase of the ADC and to one of a plurality of reference voltages during a hold phase of the ADC.
Abstract:
An error correction circuit for use with an analog-to-digital converter (ADC) comprising correction capacitance means and switching means coupled to the correction capacitance means. The switching means being coupled to ground and to a plurality of reference voltages and being arranged to couple a bottom plate of the correction capacitance means to ground during a sample phase of the ADC and to one of a plurality of reference voltages during a hold phase of the ADC.
Abstract:
While taking X-Y coordinate measurements to determine the location of a point of contact on a touch screen, a controller circuit drives the touch screen with a selectable voltage. Voltages output from the touch screen are converted by an ADC into the X-coordinate and Y-coordinate values. The ADC has a convertible input voltage range. If only a low touch screen detection resolution is required, then the voltage with which the touch screen is driven is made to be substantially less than the convertible input voltage range. Only a portion of the convertible input range is usable, but this is adequate for the application and power consumption is reduced. If a higher touch screen detection resolution is required, then the touch screen is driven with a higher voltage. Power consumption is increased, but more or all of the convertible input voltage range of the ADC is then usable.
Abstract:
A programmable delay circuit capable of providing a delay with integer and fractional time resolution is described. In one exemplary design, an apparatus includes first and second delay circuits. The first delay circuit provides a first delay of an integer number of time units. The second delay circuit couples to the first delay circuit and provides a second delay of a fraction of one time unit. The first delay circuit may include multiple unit delay cells coupled in series. Each unit delay cell may provide a delay of one time unit when enabled. The second delay circuit may have first and second paths. The first path may provide a shorter delay when selected, and the second path may provide a longer delay when selected. The second path may be coupled to at least one dummy logic gate that provides extra loading to obtain the longer delay for the second path.