MEASUREMENT UNIT
    1.
    发明公开
    MEASUREMENT UNIT 审中-公开

    公开(公告)号:US20240302409A1

    公开(公告)日:2024-09-12

    申请号:US18666102

    申请日:2024-05-16

    CPC classification number: G01R1/06722 G01R1/06733 G01R1/073 H01B11/1895

    Abstract: A measurement unit includes: a ground portion forming a part of a line configured to provide continuity for grounding electric potential, the ground portion including a surface forming a plane at one end of the ground portion; a signal portion forming a part of a line configured to provide continuity for a signal for measurement, the signal portion including an end portion configured to come out in a plane that is same as the plane of the ground portion; an insulative dielectric portion provided between the ground portion and the signal portion; an electrically conductive first contact probe configured to expand and contract along a longitudinal axis, the first contact probe coming into contact with the signal portion; and an electrically conductive second contact probe configured to expand and contract along a longitudinal axis, the second contact probe coming into contact with the ground portion.

    MEASUREMENT UNIT
    2.
    发明申请

    公开(公告)号:US20220196704A1

    公开(公告)日:2022-06-23

    申请号:US17547400

    申请日:2021-12-10

    Abstract: A measurement unit includes: a ground portion forming a part of a line configured to provide continuity for grounding electric potential, the ground portion including a surface forming a plane at one end of the ground portion; a signal portion forming a part of a line configured to provide continuity for a signal for measurement, the signal portion including an end portion configured to come out in a plane that is same as the plane of the ground portion; an insulative dielectric portion provided between the ground portion and the signal portion; an electrically conductive first contact probe configured to expand and contract along a longitudinal axis, the first contact probe coming into contact with the signal portion; and an electrically conductive second contact probe configured to expand and contract along a longitudinal axis, the second contact probe coming into contact with the ground portion.

    Coil spring assembly
    3.
    发明授权

    公开(公告)号:US11339844B2

    公开(公告)日:2022-05-24

    申请号:US16982738

    申请日:2019-03-26

    Abstract: A seat member has a seat portion, a receiving surface of which comes into contact with a bearing surface of an end turn portion, a mounting shaft portion protruded from the receiving surface of the seat portion, and an enlarged diameter portion formed at the front end of the mounting shaft portion for guiding press-fitting, in a cross section along an axial direction of a coil spring, an outer diameter of the enlarged diameter portion is set larger than an inner diameter of the end turn portion and an axial length of the enlarged diameter portion is set so that at least a maximum diagonal length of the seat member is larger than an inter-element wire distance.

    CONTACT PROBE AND SIGNAL TRANSMISSION METHOD

    公开(公告)号:US20220146552A1

    公开(公告)日:2022-05-12

    申请号:US17437152

    申请日:2020-03-12

    Abstract: A contact probe includes a first plunger, a second plunger, a coil spring, and a pipe; the first plunger includes a first slide portion that slides along the inner periphery of the pipe; the second plunger includes a second slide portion that slides along the inner periphery of the pipe; and the coil spring includes: a first attachment portion that is attached to the first plunger and tightly wound; a second attachment portion that is attached to the second plunger and tightly wound; a coarsely wound portion; a first contact portion including one end connected to the first attachment portion and another end connected to the coarsely wound portion and contacting the pipe; and a second contact portion including one end connected to the coarsely wound portion and another end connected to the second attachment portion and contacting to the pipe.

    CONTACT PROBE, PROBE HOLDER AND PROBE UNIT

    公开(公告)号:US20250035699A1

    公开(公告)日:2025-01-30

    申请号:US18911750

    申请日:2024-10-10

    Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.

    PROBE CARD
    6.
    发明公开
    PROBE CARD 审中-公开

    公开(公告)号:US20240353445A1

    公开(公告)日:2024-10-24

    申请号:US18761394

    申请日:2024-07-02

    CPC classification number: G01R1/07342 G01R1/07314 H01L22/00

    Abstract: A probe card includes: a plurality of conductive contact probes; a probe head configured to accommodate ends of the plurality of contact probes; a laminated member laminated on the probe head on a side opposite to a side of the probe head; and a fastening member including a screw and a nut configured to fasten the probe head and the laminated member to each other, the screw including a head provided on the side of the probe head in which the contact probes extend outwardly, and a shaft inserted through the probe head and the laminated member, the shaft extending and having a diameter smaller than a diameter of the head. The shaft is fixed to the probe head, is threadedly connected to the nut on an end side opposite to the head side, and is configured to fasten the probe head and the laminated member to each other.

    Probe card
    7.
    发明授权

    公开(公告)号:US12092660B2

    公开(公告)日:2024-09-17

    申请号:US17909593

    申请日:2021-03-02

    CPC classification number: G01R1/07342 G01R1/07314 H01L22/00

    Abstract: A probe card includes: a plurality of conductive contact probes; a probe head configured to accommodate ends of the plurality of contact probes; a laminated member laminated on the probe head on a side opposite to a side of the probe head; and a fastening member including a screw and a nut configured to fasten the probe head and the laminated member to each other, the screw including a head provided on the side of the probe head in which the contact probes extend outwardly, and a shaft inserted through the probe head and the laminated member, the shaft extending and having a diameter smaller than a diameter of the head. The shaft is fixed to the probe head, is threadedly connected to the nut on an end side opposite to the head side, and is configured to fasten the probe head and the laminated member to each other.

    PROBE UNIT
    8.
    发明申请

    公开(公告)号:US20230138105A1

    公开(公告)日:2023-05-04

    申请号:US17911827

    申请日:2021-03-17

    Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.

    PROBE UNIT
    9.
    发明申请

    公开(公告)号:US20220018877A1

    公开(公告)日:2022-01-20

    申请号:US17294844

    申请日:2019-11-26

    Abstract: A probe unit includes: a first contact probe configured to come in contact with a signal electrode; a second contact probe configured to come in contact with a ground electrode; a probe holder including a first holder hole through which the first contact probe passes, and a second holder hole through which the second contact probe passes; and a conductive floating member including a first through hole to which the first contact probe is inserted and the signal electrode is inserted, and a second through hole to which the second contact probe is inserted and the ground electrode is inserted. The probe holder is configured such that at least an inner circumferential surface of the first holder hole has an insulating property, and the probe unit has a coaxial structure in which central axes of the first contact probe and the first through hole are aligned with each other.

    PRESSING STRUCTURE AND PRESSING UNIT
    10.
    发明申请

    公开(公告)号:US20200088257A1

    公开(公告)日:2020-03-19

    申请号:US16466833

    申请日:2017-12-06

    Abstract: A pressing structure is arranged between a first pressed body and a second pressed body opposite to the first pressed body and presses the first pressed body and second pressed body. The pressing structure includes a spring member including: a base portion formed of a single strip-like member and having a curved principal surface; two extended portions extending respectively from end portions of the base portion and curved in a form inverse of a curving form of the base portion; and two bent portions extending respectively from end portions of the two extended portions, the end portions being at sides opposite to sides connected to the base portion, the two bent portions being curved in a form inverse of the curving form of the extended portions; and the maximum thickness of the extended portions and bent portions is smaller than the maximum thickness of the base portion.

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