公开(公告)号：US5229962A

公开(公告)日：1993-07-20

申请号：US714447

申请日：1991-06-13

申请人： Perng-Fei Yuh ,  Eric Hanson

发明人： Perng-Fei Yuh ,  Eric Hanson

IPC分类号： G11C11/44 ,  H03K3/38

CPC分类号： H03K3/38 ,  G11C11/44

摘要： A buffered nondestructive-readout Josephson memory cell comprises only three gates and is free of the half-select problem associated with Josephson memories, for both write and read operations. The basic memory cell unit comprises a first interferometer gate and an associated inductor defining a memory storage loop and a second interferometer gate that, together with a second inductor, defines a second loop in which a current pulse can be established only when a circulating current exists in the first loop. A third gate, responsive to a sense line and to the current pulse in the second loop, provides a voltage output which changes based upon whether a "1" or a "0" has been stored in the storage loop. For fabricating a bit-accessible memory, the third gate is further connected in closed circuit relationship with a third inductor which is magnetically coupled with the first gate.

摘要翻译： 缓冲非破坏性读出约瑟夫逊存储器单元仅包含三个门，并且与写入和读取操作两者都不存在与约瑟夫逊存储器相关的半选择问题。 基本存储单元单元包括第一干涉仪栅极和限定存储器存储环路的相关电感器和第二干涉仪栅极，第二干涉仪栅极与第二电感器一起限定第二环路，其中仅当存在循环电流时才能建立电流脉冲 在第一个循环。 响应于感测线路和第二回路中的当前脉冲的第三门提供了基于存储回路中是否存储“1”或“0”而改变的电压输出。 为了制造可位置存储器，第三栅极进一步以与第一栅极磁耦合的第三电感器的闭路关系连接。

公开(公告)号：US08217684B2

公开(公告)日：2012-07-10

申请号：US12925004

申请日：2010-10-12

申请人： Perng-Fei Yuh ,  Pokang Wang ,  Lejan Pu ,  Minh Tran ,  Chao-Hung Chang

发明人： Perng-Fei Yuh ,  Pokang Wang ,  Lejan Pu ,  Minh Tran ,  Chao-Hung Chang

IPC分类号： H03B1/00

CPC分类号： G05F3/26 ,  G11C11/16 ,  G11C29/021 ,  G11C29/028

摘要： Systems and methods for realizing current drivers without current or voltage feedback for devices that require accurate current drive with zero standby current has been disclosed. In a preferred embodiment of the invention this current driver is applied for write circuits for MRAMs. A fast and accurate reference current is generated by diode voltage divided by resistor without any feedback. The diode current is not fed back from the reference current. The diode current is generated from a regulated voltage. Temperature compensation of the write current is inherently built in the diode current reference. Fine-tuning of the temperature coefficient is achieved by mixing poly and diffusion resistors. A switch inserted in the current driver can turn on the driver fast and without a need for standby current. Leading boost in the current driver can fast charge the large coupling capacitance of word and bit lines and speed up write timing.

摘要翻译： 已经公开了用于实现没有电流或电压反馈的电流驱动器的系统和方法，用于需要具有零待机电流的精确电流驱动的装置。 在本发明的优选实施例中，该电流驱动器被应用于MRAM的写入电路。 通过二极管电压除以电阻而没有任何反馈产生快速准确的参考电流。 二极管电流不从参考电流反馈。 二极管电流由调节电压产生。 写入电流的温度补偿固有地内置在二极管电流参考中。 通过混合多聚电阻和扩散电阻来实现温度系数的微调。 插入当前驱动程序的开关可快速打开驱动器，无需待机电流。 当前驱动器的领先提升可以快速充电字和位线的大耦合电容，并加快写时序。

公开(公告)号：US5023879A

公开(公告)日：1991-06-11

申请号：US514853

申请日：1990-04-26

申请人： Kang L. Wang ,  Perng-Fei Yuh

发明人： Kang L. Wang ,  Perng-Fei Yuh

IPC分类号： H01S5/04 ,  H01S5/30 ,  H01S5/343

CPC分类号： B82Y20/00 ,  H01S5/30 ,  H01S5/34313 ,  H01S5/041 ,  H01S5/3432

摘要： An optically pumped semiconductor laser comprises multiple asymmetric quantum well structures. Using the structures described herein, the selection rules for additional optical transitions can be made possible and three or four level lasers can be obtained. A population inversion can be achieved by optical pumping for lasing for those not allowed in a simple quantum well.

摘要翻译： 光泵浦半导体激光器包括多个非对称量子阱结构。 使用本文所述的结构，可以实现用于附加光学转换的选择规则，并且可以获得三个或四个等级的激光器。 通过对于在简单量子阱中不允许的激光进行激光的光泵浦，可以实现种群反演。

公开(公告)号：US07609543B2

公开(公告)日：2009-10-27

申请号：US11904434

申请日：2007-09-27

申请人： Hsu Kai Yang ,  Lejan Pu ,  Perng-Fei Yuh ,  Po-Kang Wang

发明人： Hsu Kai Yang ,  Lejan Pu ,  Perng-Fei Yuh ,  Po-Kang Wang

IPC分类号： G11C11/00

CPC分类号： G11C11/16 ,  G11C29/06 ,  G11C29/08 ,  G11C29/12005

摘要： Voltage and current stress for magnetic random access memory (MRAM) cells can weed out potential early failure cells. Method and circuit implementation of such a stress test for a MRAM comprise coupling a stress test circuit to the read bus of the MRAM and stressing the Magnetic Tunnel Junctions (MTJS) by tying them to ground by activating isolation transistors associated with them. Read word lines control which MTJs are stressed Both the method and implementation can be used for any memory cells based on resistance differences, such as Phase RAM or Spin Valve MRAM.

摘要翻译： 磁性随机存取存储器（MRAM）电池的电压和电流应力可以消除潜在的早期故障电池。 用于MRAM的这种应力测试的方法和电路实现包括将应力测试电路耦合到MRAM的读总线，并通过激活与它们相关联的隔离晶体管将它们绑定到地来强调磁隧道接合点（MTJS）。 读取字线控制哪些MTJ受到压力这两种方法和实现都可以用于基于电阻差异的任何存储单元，如相位RAM或自旋阀MRAM。

公开(公告)号：US20090086531A1

公开(公告)日：2009-04-02

申请号：US11904434

申请日：2007-09-27

申请人： Hsu Kai Yang ,  Lejan Pu ,  Perng-Fei Yuh ,  Po-Kang Wang

发明人： Hsu Kai Yang ,  Lejan Pu ,  Perng-Fei Yuh ,  Po-Kang Wang

IPC分类号： G11C11/00 ,  G11C29/00

CPC分类号： G11C11/16 ,  G11C29/06 ,  G11C29/08 ,  G11C29/12005

摘要： Voltage and current stress for magnetic random access memory (MRAM) cells can weed out potential early failure cells. Method and circuit implementation of such a stress test for a MRAM comprise coupling a stress test circuit to the read bus of the MRAM and stressing the Magnetic Tunnel Junctions (MTJS) by tying them to ground by activating isolation transistors associated with them. Read word lines control which MTJs are stressed Both the method and implementation can be used for any memory cells based on resistance differences, such as Phase RAM or Spin Valve MRAM.

公开(公告)号：US08693273B2

公开(公告)日：2014-04-08

申请号：US13345116

申请日：2012-01-06

申请人： Perng-Fei Yuh ,  Po-Kang Wang ,  Lejan Pu

发明人： Perng-Fei Yuh ,  Po-Kang Wang ,  Lejan Pu

IPC分类号： G11C7/02

CPC分类号： G11C7/06 ,  G11C11/1673 ,  G11C2207/063

摘要： A sense amplifier comprising a reference current developed from a programmed and a non-programmed reference cell is used to read a signal from a magnetic random access memory (MRAM) comprising magnetic tunnel junction (MTJ) cells. The average current is determined from reference cells in as few as one sense amplifier and as many as n sense amplifiers, and is an average current between the programmed reference cell and the non-programmed reference cell that approximates the mid point between the two states. The sense amplifier can be fully differential or a non differential sense amplifier.

摘要翻译： 包括从编程和非编程参考单元产生的参考电流的读出放大器用于从包括磁性隧道结（MTJ）单元的磁性随机存取存储器（MRAM）中读取信号。 平均电流由少于1个读出放大器和多达n个读出放大器的参考单元确定，并且是编程参考单元和非编程参考单元之间的平均电流，其近似于两个状态之间的中点。 读出放大器可以是全差分或非差分读出放大器。

公开(公告)号：US20130176773A1

公开(公告)日：2013-07-11

申请号：US13345116

申请日：2012-01-06

申请人： Perng-Fei Yuh ,  Pokang Wang ,  Lejan Pu

发明人： Perng-Fei Yuh ,  Pokang Wang ,  Lejan Pu

IPC分类号： G11C11/02 ,  G11C7/06

CPC分类号： G11C7/06 ,  G11C11/1673 ,  G11C2207/063

摘要： A sense amplifier comprising a reference current developed from a programmed and a non-programmed reference cell is used to read a signal from a magnetic random access memory (MRAM) comprising magnetic tunnel junction (MTJ) cells. The average current is determined from reference cells in as few as one sense amplifier and as many as n sense amplifiers, and is an average current between the programmed reference cell and the non-programmed reference cell that approximates the mid point between the two states. The sense amplifier can be fully differential or a non differential sense amplifier.

摘要翻译： 包括从编程和非编程参考单元产生的参考电流的读出放大器用于从包括磁性隧道结（MTJ）单元的磁性随机存取存储器（MRAM）读取信号。 平均电流由少于1个读出放大器和多达n个读出放大器的参考单元确定，并且是编程参考单元和非编程参考单元之间的平均电流，其近似于两个状态之间的中点。 读出放大器可以是全差分或非差分读出放大器。

公开(公告)号：US20120086476A1

公开(公告)日：2012-04-12

申请号：US12925004

申请日：2010-10-12

申请人： Perng-Fei Yuh ,  Pokang Wang ,  Lejan Pu ,  Minh Tran ,  Chao-Hung Chang

发明人： Perng-Fei Yuh ,  Pokang Wang ,  Lejan Pu ,  Minh Tran ,  Chao-Hung Chang

IPC分类号： H03K3/00

CPC分类号： G05F3/26 ,  G11C11/16 ,  G11C29/021 ,  G11C29/028

摘要： Systems and methods for realizing current drivers without current or voltage feedback for devices that require accurate current drive with zero standby current has been disclosed. In a preferred embodiment of the invention this current driver is applied for write circuits for MRAMs. A fast and accurate reference current is generated by diode voltage divided by resistor without any feedback. The diode current is not fed back from the reference current. The diode current is generated from a regulated voltage. Temperature compensation of the write current is inherently built in the diode current reference. Fine-tuning of the temperature coefficient is achieved by mixing poly and diffusion resistors. A switch inserted in the current driver can turn on the driver fast and without a need for standby current. Leading boost in the current driver can fast charge the large coupling capacitance of word and bit lines and speed up write timing.

公开(公告)号：US08488357B2

公开(公告)日：2013-07-16

申请号：US12925492

申请日：2010-10-22

申请人： Toshio Sunaga ,  Lejan Pu ,  Perng-Fei Yuh ,  Chao-Hung Chang

发明人： Toshio Sunaga ,  Lejan Pu ,  Perng-Fei Yuh ,  Chao-Hung Chang

IPC分类号： G11C5/08

CPC分类号： G11C5/063 ,  G11C7/14 ,  G11C8/12 ,  G11C11/1655 ,  G11C11/1657 ,  G11C11/1673 ,  G11C11/1675

摘要： Systems and methods for realizing reference currents to improve reliability of sensing operations of segmented semiconductor memory arrays have been achieved. Preferred embodiments of the invention comprise MRAM arrays but the invention could be applied to any other memories requiring access on small, segmented arrays. All embodiments of the invention comprise a folded bit lines scheme, either in adjacent bit lines or in segment-to-segment folded bit lines. In two embodiments alternate strapping of Poly-Si Word Lines in every second segment is achieved by metal layer of Read Word Line and Write Select Line. An embodiment has stored 1 and 0 cells on both sides of a selected segment to be read.

摘要翻译： 已经实现了用于实现参考电流以提高分段半导体存储器阵列的感测操作的可靠性的系统和方法。 本发明的优选实施例包括MRAM阵列，但是本发明可以应用于需要在小的分段阵列上访问的任何其他存储器。 本发明的所有实施例包括在相邻位线中或在段到段折叠的位线中的折叠位线方案。 在两个实施例中，通过读取字线和写入选择线的金属层实现了每个第二段中的多晶硅字线的交替捆扎。 一个实施例在要读取的所选择的段的两侧上存储了1个和0个单元。

公开(公告)号：US20120099358A1

公开(公告)日：2012-04-26

申请号：US12925492

申请日：2010-10-22

申请人： Toshio Sunaga ,  Lejan Pu ,  Perng-Fei Yuh ,  Chao-Hung Chang

发明人： Toshio Sunaga ,  Lejan Pu ,  Perng-Fei Yuh ,  Chao-Hung Chang

IPC分类号： G11C5/08 ,  G11C5/06

CPC分类号： G11C5/063 ,  G11C7/14 ,  G11C8/12 ,  G11C11/1655 ,  G11C11/1657 ,  G11C11/1673 ,  G11C11/1675

摘要： Systems and methods for realizing reference currents to improve reliability of sensing operations of segmented semiconductor memory arrays have been achieved. Preferred embodiments of the invention comprise MRAM arrays but the invention could be applied to any other memories requiring access on small, segmented arrays. All embodiments of the invention comprise a folded bit lines scheme, either in adjacent bit lines or in segment-to-segment folded bit lines. In two embodiments alternate strapping of Poly-Si Word Lines in every second segment is achieved by metal layer of Read Word Line and Write Select Line. An embodiment has stored 1 and 0 cells on both sides of a selected segment to be read.

摘要翻译： 已经实现了用于实现参考电流以提高分段半导体存储器阵列的感测操作的可靠性的系统和方法。 本发明的优选实施例包括MRAM阵列，但是本发明可以应用于需要在小的分段阵列上访问的任何其他存储器。 本发明的所有实施例包括在相邻位线中或在段到段折叠的位线中的折叠位线方案。 在两个实施例中，通过读取字线和写入选择线的金属层实现了每个第二段中的多晶硅字线的交替捆扎。 一个实施例在要读取的所选择的段的两侧上存储了1个和0个单元。