摘要:
An electronic imaging system is disclosed, for assessing the intensity of colorimetric, fluorescent or luminescent signal in a matrix consisting of wells, microwells, hybridization dot blots on membranes, gels, or other specimens. The system includes a very sensitive area CCD detector, a fast, telecentric lens with epi-illumination, a reflective/transmissive illumination system, an illumination wavelength selection device, and a light-tight chamber. A computer and image analysis software are used to control the hardware, correct and calibrate the images, and detect and quantify targets within the images.
摘要:
An electronic imaging system is disclosed, for assessing the intensity of calorimetric, fluorescent or luminescent signal in a matrix consisting of wells, microwells, hybridization dot blots on membranes, gels, or other specimens. The system includes a very sensitive area CCD detector, a fast, telecentric lens with epi-illumination, a reflective/transmissive illumination system, an illumination wavelength selection device, and a light-tight chamber. A computer and image analysis software are used to control the hardware, correct and calibrate the images, and detect and quantify targets within the images.
摘要:
An electronic imaging system is disclosed, for assessing the intensity of calorimetric, fluorescent or luminescent signal in a matrix consisting of wells, microwells, hybridization dot blots on membranes, gels, or other specimens. The system includes a very sensitive area CCD detector, a fast, telecentric lens with epi-illumination, a reflective/transmissive illumination system, an illumination wavelength selection device, and a light-tight chamber. A computer and image analysis software are used to control the hardware, correct and calibrate the images, and detect and quantify targets within the images.
摘要:
An electronic imaging system is disclosed, for assessing the intensity of colorimetric, fluorescent or luminescent signal in a matrix consisting of wells, microwells, hybridization dot blots on membranes, gels, or other specimens. The system includes a very sensitive area CCD detector, a fast, telecentric lens with epi-illumination, a reflective/transmissive illumination system, an illumination wavelength selection device, and a light-tight chamber. A computer and image analysis software are used to control the hardware, correct and calibrate the images, and detect and quantify targets within the images.
摘要:
A method and apparatus are disclosed for use in an area digital imaging system for assays to extract targets on a specimen containing an array of targets that may not be arranged in perfect regularity. A matrix is defined of nominal target locations including a probe template of predefined, two-dimensional size and shape at each of a plurality of fixed, predefined grid points on the specimen, and a determination is made of the most probable location of the probe template corresponding to a specific target by sensing both pixel intensity and the spatial distribution of pixel intensities in an image of the specimen at a plurality of locations in the vicinity of a nominal target location.
摘要:
The present invention relates to a high scattering smectic liquid crystal material and display device using the same. In the present invention, a series of smectic A phase liquid crystals having compact arrangement of crystal domains or a series of smectic liquid crystal mixed materials having a degree of order higher than that of the smectic A phase and an optical texture different from that of the smectic A phase are obtained by mixing a smectic liquid crystal with an organic compound having a high optical anisotropy (Δn) or mixing different types of smectic phases. When used in a smectic stable state liquid crystal display pattern, these materials have high scattering properties and can effectively improve the contrast of a smectic liquid crystal display device. The present invention also improves contrast when it used in a reflective smectic liquid crystal display device.
摘要:
A thermal cycler for a microfluidic device includes a controller operable to provide a series of electrical signals, a heat sink, and a heating element in thermal communication with the heat sink and operable to receive the series of electrical signals from the controller. The thermal cycler also includes a thermal chuck in thermal communication with the heating element. The thermal chuck comprises a heating surface operable to make thermal contact with the microfluidic device. The heating surface is characterized by a temperature ramp rate between 2.5 degrees Celsius per second and 5.5 degrees Celsius per second and a temperature difference between a first portion of the heating surface supporting a first portion of the microfluidic device and a second portion of the heating surface supporting a second portion of the microfluidic device is less than 0.25° C.
摘要:
An electrically controlled medium for modulating light includes two plastic thin film layers (1) and (2), and a mixture layer (3) is arranged between the two plastic thin film layers (1) and (2). The mixture layer (3) is consisted of smectic liquid crystals (31), polymer materials (33) and dopants (32). Electrode layers (4) are coated on one side of each of the two plastic thin film layers (1) and (2) facing to the mixture layer (3), and the electrode layers (4) are connected to a device of electrical driving system (5). The liquid crystal molecules are allowed to exhibit different molecule alignments by controlling the amplitude, frequency and driving time of the electric power applied to the electrode layers (4), so that the electrically controlled medium for modulating light can be switched between a blurredly scattering state and a fully transparent state, even may be switched among a plurality of gradual translucent states of different gray levels. The medium is power saving, hard to be broken and eco friendly and it can maintain its state after power is off (memory effect). It has fast switching speed and can be broadly used for the fields of architectural decoration, privacy control areas, automotive electronics and glass, etc.
摘要:
Methods of monitoring critical dimensions in a semiconductor fabrication process include capturing at least one image of a first structure that has an effect on the polarization state of light reflected therefrom. For at least some of the first structure images, a value is calculated indicative of intensity of light reflected from the first structure. A critical dimension of the first structure is obtained and correlated with the calculated value. At least one image of a subsequent structure is captured. A determination is made, based at least in part on the calculated value, of a critical dimension of the subsequent structure.