摘要:
A semiconductor structure includes a gate structure disposed on a substrate. At least one lightly doped region adjoins the gate structure in the substrate. The at least one lightly doped region has a first conductivity type. A source feature and a drain feature are on opposite sides of the gate structure in the substrate. The source feature and the drain feature have the first conductivity type. The source feature is in the at least one lightly doped region. A bulk pick-up region adjoins the source feature in the at least one lightly doped region. The bulk pick-up region has a second conductivity type.
摘要:
A semiconductor structure includes a semiconductor substrate; a first well region of a first conductivity type in the semiconductor substrate; a metal-containing layer on the first well region, wherein the metal-containing layer and the first well region form a Schottky barrier; and a first heavily doped region of the first conductivity type in the first well region, wherein the first heavily doped region is horizontally spaced apart from the metal-containing layer.
摘要:
A semiconductor structure includes a semiconductor substrate; a first well region of a first conductivity type in the semiconductor substrate; a metal-containing layer on the first well region, wherein the metal-containing layer and the first well region form a Schottky barrier; and a first heavily doped region of the first conductivity type in the first well region, wherein the first heavily doped region is horizontally spaced apart from the metal-containing layer.
摘要:
A hierarchical downlink (DL) synchronization channel (SCH) is provided for wireless OFDM/OFDMA systems. The SCH includes a Primary SCH (P-SCH) for carrying PA-Preambles used for coarse timing and frequency synchronization, and a Secondary SCH (S-SCH) for carrying SA-Preambles used for cell ID detection. The total time length occupied by P-SCH and S-SCH is equal to one OFDM symbol time length of a data channel, and S-SCH is located in front of P-SCH in each DL frame. A perfect multi-period time-domain structure is created and maintained in P-SCH to increase preciseness of frame boundary estimation. With overlapping deployment of macrocells and femtocells, a predefined SCH configuration scheme is provided to separate frequency subbands used for macrocells and femtocells such that interferences in S-SCH can be mitigated. In addition, a self-organized SCH configuration scheme is provided to allow more flexibility for femtocells to avoid or introduce interference in S-SCH.
摘要:
A semiconductor structure includes a semiconductor substrate; an n-type tub extending from a top surface of the semiconductor substrate into the semiconductor substrate, wherein the n-type tub comprises a bottom buried in the semiconductor substrate; a p-type buried layer (PBL) on a bottom of the tub, wherein the p-type buried layer is buried in the semiconductor substrate; and a high-voltage n-type metal-oxide-semiconductor (HVNMOS) device over the PBL and within a region encircled by sides of the n-type tub.
摘要:
A method for estimating the velocity of the Mobile Station (MS) in Orthogonal Frequency Divisional Multiplexing (OFDM)/Orthogonal Frequency Divisional Multiplexing Access (OFDMA) system is disclosed. First, the pilots in the preamble are received by MS and the pilots in a specified symbol of the specific zone are received by MS. An auto-correlation between the received pilots in preamble and the received pilots in the specified symbol of the specific zone is calculated. The auto-correlation is the calculated with frame by frame basis, and the average auto-correlation is calculated from number of frames. Once the average auto-correlation is obtained, the velocity of MS is estimated from predetermined function according to the obtained average auto-correction.
摘要:
An exemplary embodiment of a semiconductor device capable of high-voltage operation includes a substrate with a well region therein. A gate stack with a first side and a second side opposite thereto, overlies the well region. Within the well region, a doped body region includes a channel region extending under a portion of the gate stack and a drift region is adjacent to the channel region. A drain region is within the drift region and spaced apart by a distance from the first side thereof and a source region is within the doped body region near the second side thereof. There is no P-N junction between the doped body region and the well region.
摘要:
A band averaging circuit and a related method for estimating a carrier frequency offset are applied in a multi-band multi-carrier communication system. A packet of the multi-band multi-carrier communication system is transmitted via a plurality of carriers. The band averaging circuit includes a frequency offset estimation unit for generating a plurality of carrier frequency offset ratios corresponding to the carriers according to a received packet; and a frequency offset adjustment circuit coupled to the frequency offset estimation unit for calculating a weighted average carrier frequency offset ratio according to carrier frequency offset ratios and comparison results of the carrier frequency offset ratios, and also for calculating a carrier frequency offset of each carrier according to the weighted average carrier frequency offset ratio and a center frequency of the carrier.
摘要:
The present invention relates to a symbol acquisition apparatus and a method thereof. The method includes: determining a first boundary according to a first preamble symbol and generating a first confidence value according to signal quality of the first preamble symbol; determining a second boundary according to a second preamble symbol and generating a second confidence value according to signal quality of the second preamble symbol; and determining a symbol boundary from the first and the second boundaries according to the first and the second confidence values.
摘要:
An avoidance method for co-channel interference in a wireless network. The first step of the method is to evaluate an interference measure on each subcarrier. Based on the interference measure of each subcarrier, a peak-to-average measure ratio of interference within the received symbol is then obtained. If the peak-to-average measure ratio of interference is greater than a predetermined threshold, a most interfered subcarrier at which the maximal interference measure occurs is detected. Accordingly, a downgrading factor is set for the most interfered subcarrier.