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公开(公告)号:US09379014B1
公开(公告)日:2016-06-28
申请号:US14803063
申请日:2015-07-18
Applicant: QUALCOMM Incorporated
IPC: H01L23/52 , H01L21/768 , H01L23/522 , H01L23/528 , H01L27/11
CPC classification number: H01L27/1104
Abstract: A static random-access memory (SRAM) array includes a first metal layer and a second metal layer. The metal layer includes multiple first source lines spanning multiple columns of cells. The multiple first source lines include a first source line and a second source line. The second metal layer includes multiple second source lines spanning multiple rows of cells. The SRAM array further includes a set of vias coupled to the multiple first source lines and to the multiple second source lines. A first via of the set of vias is coupled to the first source line and multiple vias of the set of vias are coupled to the second source line. Two vias of the multiple vias that are closest to the first via are each substantially the same distance from the first via.
Abstract translation: 静态随机存取存储器(SRAM)阵列包括第一金属层和第二金属层。 金属层包括跨多个单元格的多个第一源线。 多个第一源极线包括第一源极线和第二源极线。 第二金属层包括跨越多行单元的多个第二源极线。 SRAM阵列还包括耦合到多个第一源极线和多个第二源极线的一组通孔。 通孔组的第一通孔耦合到第一源极线,并且该组通孔的多个通孔耦合到第二源极线。 最靠近第一通孔的多个通孔的两个通孔各自与第一通孔基本相同。
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公开(公告)号:US09349431B1
公开(公告)日:2016-05-24
申请号:US14660366
申请日:2015-03-17
Applicant: QUALCOMM Incorporated
Inventor: Mosaddiq Saifuddin , Jung Pill Kim
IPC: G11C7/00 , G11C11/406 , G11C11/408 , G11C11/4096
CPC classification number: G11C11/406 , G11C11/40611 , G11C11/40618 , G11C11/40622 , G11C11/408 , G11C11/4087 , G11C11/4096 , G11C2211/4061
Abstract: A method of performing refresh operations on a storage device includes identifying word lines coupled to weak storage elements. The method also includes grouping a plurality of word lines having distinct bank offsets onto a single refresh address. Each of the plurality of word lines is coupled to a corresponding weak storage element. The method further includes performing a refresh of the single refresh address.
Abstract translation: 在存储设备上执行刷新操作的方法包括识别耦合到弱存储元件的字线。 该方法还包括将具有不同的组偏移的多个字线分组到单个刷新地址上。 多个字线中的每一个耦合到相应的弱存储元件。 该方法还包括执行单个刷新地址的刷新。
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公开(公告)号:US09754655B2
公开(公告)日:2017-09-05
申请号:US15340266
申请日:2016-11-01
Applicant: QUALCOMM Incorporated
Inventor: Mosaddiq Saifuddin , SankaraRao Kunapareddy , Keunsoo Roh , Chun Xiang He , Pratik Patel , Nicholas Ambur , Jeremy Haugen
IPC: G11C16/06 , G11C11/406 , G11C7/10 , G11C11/408 , G06F13/16 , G06F1/32
CPC classification number: G11C11/40615 , G06F1/3225 , G06F1/3275 , G06F13/1636 , G11C7/1072 , G11C11/40611 , G11C11/40618 , G11C11/40622 , G11C11/4087
Abstract: In an embodiment, a dynamic random-access memory (DRAM) system configures an inactive portion of a DRAM die to operate in accordance with a self-refresh mode that is characterized by refreshes of the DRAM die being controlled by a local DRAM die controller integrated into the DRAM die. The DRAM system also configures an active portion of the DRAM die to operate in accordance with a controller-managed refresh mode while the inactive portion of the DRAM die operates in the self-refresh mode, the controller-managed refresh mode characterized by refreshes of the DRAM die being controlled by a controller that is external to the DRAM die.
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公开(公告)号:US09495261B2
公开(公告)日:2016-11-15
申请号:US14458009
申请日:2014-08-12
Applicant: QUALCOMM Incorporated
Inventor: Jung Pill Kim , Dexter Tamio Chun , Deepti Vijayalakshmi Sriramagiri , Mosaddiq Saifuddin , Xiangyu Dong , Sungryul Kim , Yanru Li , Jungwon Suh
CPC classification number: G06F11/2053 , G06F11/073 , G06F11/0775 , G06F11/0793 , G06F11/08 , G06F11/1048 , G06F11/3037 , G11C29/4401 , G11C29/52 , G11C2029/0409
Abstract: Methods and systems for an in-system repair process that repairs or attempts to repair random bit failures in a memory device are provided. In some examples, an in-system repair process may select alternative steps depending on whether the failure is correctable or uncorrectable. In these examples, the process uses communications between a system on chip and the memory to fix the failures during normal operation.
Abstract translation: 提供了修复或尝试修复存储器件中的随机位故障的系统内修复过程的方法和系统。 在一些示例中,系统内修复过程可以根据故障是可校正还是不可校正来选择替代步骤。 在这些示例中,该过程使用片上系统与存储器之间的通信来在正常操作期间修复故障。
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公开(公告)号:US09378081B2
公开(公告)日:2016-06-28
申请号:US14146628
申请日:2014-01-02
Applicant: QUALCOMM Incorporated
Inventor: Xiangyu Dong , Jung Pill Kim , Mosaddiq Saifuddin
CPC classification number: G06F11/076 , G06F11/1048 , G06F11/1076 , G06F12/00 , G06F13/16 , G06F13/1668 , G06F2201/88
Abstract: A method includes storing, at a counter, a first value indicating a count of read operations in which a bit error is detected in data associated with a first address. The method further includes, in response to the first value exceeding a first threshold value, remapping the first address to a second address using a controller that is coupled to a memory array. The first address corresponds to a first element of the memory array. The second address corresponds to a second element that is included at a memory within the controller. Remapping the first address includes, in response to receiving a first read request for data located at the first address, replacing a first value read from the first element with a second value read from the second element.
Abstract translation: 一种方法包括在计数器处存储指示在与第一地址相关联的数据中检测到位错误的读取操作的计数的第一值。 该方法还包括响应于第一值超过第一阈值,使用耦合到存储器阵列的控制器将第一地址重新映射到第二地址。 第一个地址对应于存储器阵列的第一个元素。 第二地址对应于包括在控制器内的存储器上的第二元件。 响应于接收到位于第一地址的数据的第一读取请求,重映射第一地址包括用从第二元素读取的第二值替换从第一元素读取的第一值。
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公开(公告)号:US20150186198A1
公开(公告)日:2015-07-02
申请号:US14146628
申请日:2014-01-02
Applicant: QUALCOMM Incorporated
Inventor: Xiangyu Dong , Jung Pill Kim , Mosaddiq Saifuddin
CPC classification number: G06F11/076 , G06F11/1048 , G06F11/1076 , G06F12/00 , G06F13/16 , G06F13/1668 , G06F2201/88
Abstract: A method includes storing, at a counter, a first value indicating a count of read operations in which a bit error is detected in data associated with a first address. The method further includes, in response to the first value exceeding a first threshold value, remapping the first address to a second address using a controller that is coupled to a memory array. The first address corresponds to a first element of the memory array. The second address corresponds to a second element that is included at a memory within the controller. Remapping the first address includes, in response to receiving a first read request for data located at the first address, replacing a first value read from the first element with a second value read from the second element.
Abstract translation: 一种方法包括在计数器处存储指示在与第一地址相关联的数据中检测到位错误的读取操作的计数的第一值。 该方法还包括响应于第一值超过第一阈值,使用耦合到存储器阵列的控制器将第一地址重新映射到第二地址。 第一个地址对应于存储器阵列的第一个元素。 第二地址对应于包括在控制器内的存储器上的第二元件。 响应于接收到位于第一地址的数据的第一读取请求,重映射第一地址包括用从第二元素读取的第二值替换从第一元素读取的第一值。
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公开(公告)号:US09824742B1
公开(公告)日:2017-11-21
申请号:US15249132
申请日:2016-08-26
Applicant: QUALCOMM Incorporated
Inventor: Mosaddiq Saifuddin , SankaraRao Kunapareddy
IPC: G11C11/406 , G11C11/408
CPC classification number: G11C11/40615 , G06F13/1636 , G11C11/40603 , G11C11/40622 , G11C11/4085
Abstract: Systems and method are directed to accessing a Dynamic Random Access Memory (DRAM) system. A DRAM controller is designed to determine that a DRAM bank of a DRAM system is in a self-refresh state and allow one or more commands to access the DRAM bank without exiting the self-refresh state. The DRAM controller may select these one or more commands, based on one or more of a clock frequency, traffic conditions related to requests for accessing the DRAM bank, or a command type. The one or more commands may include at least one of read (RD), write (WR), or precharge (PRE) commands received while the DRAM bank is in the self-refresh state.
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公开(公告)号:US09812222B2
公开(公告)日:2017-11-07
申请号:US14691570
申请日:2015-04-20
Applicant: QUALCOMM Incorporated
Inventor: Jung Pill Kim , Dexter Tamio Chun , Jungwon Suh , Deepti Vijayalakshmi Sriramagiri , Yanru Li , Mosaddiq Saifuddin , Xiangyu Dong
CPC classification number: G11C29/4401 , G06F11/073 , G06F11/0751 , G06F11/079 , G06F11/0793 , G06F11/1048 , G11C11/401 , G11C29/42 , G11C29/76
Abstract: A memory having a redundancy area is operated in a normal mode and an error is detected. A selecting selects between in-line repair process and off-line repair. In-line repair applies a short term error correction, which remaps a fail address to a remapped memory area of the memory. An in-system repair is applied, for a one-time programmed remapping of the fail address to a redundancy area of the memory. In-system repair utilizes idle time of the memory to maintain valid memory content.
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公开(公告)号:US20170316818A1
公开(公告)日:2017-11-02
申请号:US15249132
申请日:2016-08-26
Applicant: QUALCOMM Incorporated
Inventor: Mosaddiq Saifuddin , SankaraRao Kunapareddy
IPC: G11C11/406 , G11C11/408
CPC classification number: G11C11/40615 , G06F13/1636 , G11C11/40603 , G11C11/40622 , G11C11/4085
Abstract: Systems and method are directed to accessing a Dynamic Random Access Memory (DRAM) system. A DRAM controller is designed to determine that a DRAM bank of a DRAM system is in a self-refresh state and allow one or more commands to access the DRAM bank without exiting the self-refresh state. The DRAM controller may select these one or more commands, based on one or more of a clock frequency, traffic conditions related to requests for accessing the DRAM bank, or a command type. The one or more commands may include at least one of read (RD), write (WR), or precharge (PRE) commands received while the DRAM bank is in the self-refresh state.
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公开(公告)号:US12094515B2
公开(公告)日:2024-09-17
申请号:US17890022
申请日:2022-08-17
Applicant: QUALCOMM INCORPORATED
Inventor: Victor Van Der Veen , Pankaj Deshmukh , Behnam Dashtipour , David Hartley , Mosaddiq Saifuddin
IPC: G11C7/00 , G11C11/406 , G11C11/4096
CPC classification number: G11C11/40618 , G11C11/40615 , G11C11/4096
Abstract: An effect known as “rowhammer” may be mitigated in a DRAM organized in sub-banks of two or more rows. Row activation commands directed to a sub-bank may be detected. The number of row activation commands occurring within a refresh window may be counted and compared with a threshold. When it is detected that the number of row activation commands within the refresh window exceeds the threshold, an additional refresh command may be provided to the DRAM.
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