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公开(公告)号：US07554664B2
公开(公告)日：2009-06-30
申请号：US11878998
申请日：2007-07-30
IPC分类号： G01N21/25
CPC分类号： G02B21/0076
摘要： Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to the threshold wavelength between the transmission and reflection is provided in several partial beam paths for the selection of the wavelengths.
摘要翻译： 激光扫描显微镜具有用于照射样品的照明光束路径和用于来自样品的光的波长依赖性记录的检测光束路径，由此提供用于选择检测波长的滤光器，其特征在于，至少一个刻度滤光器在空间上 关于透射和反射之间的阈值波长可变的几个部分光束路径被提供用于选择波长。
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公开(公告)号：US20080024782A1
公开(公告)日：2008-01-31
申请号：US11878998
申请日：2007-07-30
CPC分类号： G02B21/0076
摘要： Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to the threshold wavelength between the transmission and reflection is provided in several partial beam paths for the selection of the wavelengths.
摘要翻译： 激光扫描显微镜具有用于照射样品的照明光束路径和用于来自样品的光的波长依赖性记录的检测光束路径，由此提供用于选择检测波长的滤光器，其特征在于，至少一个刻度滤光器在空间上 关于透射和反射之间的阈值波长可变的几个部分光束路径被提供用于选择波长。
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公开(公告)号：US07852474B2
公开(公告)日：2010-12-14
申请号：US11785153
申请日：2007-04-16
IPC分类号： G01J3/28
CPC分类号： G02B21/0064 , G01J3/02 , G01J3/0208 , G01J3/021 , G01J3/0259 , G01J3/1804 , G02B21/16
摘要： A spectral analytical unit for acting on a parallel light bundle having different wavelengths. The spectral analytical unit includes a diffraction grating on which the light bundle falls, the diffraction grating splitting the different wavelengths through diffraction in first spectral directions defining a light bundle diffraction order 1 without recycle, and the diffraction grating bending the light bundle in second directions defining a light bundle diffraction order 0 without recycle, a detector line made up of a plurality of elements, optics for focusing the split light bundle diffraction order 1 without recycle on the detector line, evaluation electronics connected to the detector line for obtaining data related to a created spectrum, and a deflecting device wherein the diffraction order 0 light bundle without recycle meets on the deflecting device which is so directed and positioned that this light bundle falls on the diffraction grating thereby creating a reflected diffraction order 1 light bundle with first recycle and a reflected diffraction order 0 light bundle with first recycle whereby the diffraction order 1 without recycle and the reflected diffraction order 1 light bundle with first recycle each of a part wavelength range are impressed through the optics on a single element of the detector line.
摘要翻译： 用于作用于具有不同波长的平行光束的光谱分析单元。 光谱分析单元包括光束落在其上的衍射光栅，衍射光栅通过在限定光束衍射级数1而不进行再循环的第一光谱方向上通过衍射分离不同波长，并且衍射光栅在限定第二方向的第二方向上折射光束 没有再循环的光束衍射级0，由多个元件组成的检测器线，用于将分束光束衍射级1聚焦在检测器线路上而不再循环的光学器件，连接到检测器线的评估电子设备，用于获得与 以及偏转装置，其中没有再循环的衍射级0光束在偏转装置上相遇，所述偏转装置被定向和定位成使得该光束落在衍射光栅上，从而产生具有第一再循环的反射衍射级1光束和 反射衍射级0光束与fi 第一次循环，其中没有再循环的衍射级1和具有部分波长范围的第一次再循环的反射衍射级1光束通过检测器线的单个元件上的光学器件施加。
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公开(公告)号：US20070242268A1
公开(公告)日：2007-10-18
申请号：US11785153
申请日：2007-04-16
IPC分类号： G01J3/28
CPC分类号： G02B21/0064 , G01J3/02 , G01J3/0208 , G01J3/021 , G01J3/0259 , G01J3/1804 , G02B21/16
摘要： A spectral analytical unit for acting on a parallel light bundle having different wavelengths. The spectral analytical unit includes a diffraction grating on which the light bundle falls, the diffraction grating splitting the different wavelengths through diffraction in first spectral directions defining a light bundle diffraction order 1 without recycle, and the diffraction grating bending the light bundle in second directions defining a light bundle diffraction order 0 without recycle, a detector line made up of a plurality of elements, optics for focusing the split light bundle diffraction order 1 without recycle on the detector line, evaluation electronics connected to the detector line for obtaining data related to a created spectrum, and a deflecting device wherein the diffraction order 0 light bundle without recycle meets on the deflecting device which is so directed and positioned that this light bundle falls on the diffraction grating thereby creating a reflected diffraction order 1 light bundle with first recycle and a reflected diffraction order 0 light bundle with first recycle whereby the diffraction order 1 without recycle and the reflected diffraction order 1 light bundle with first recycle each of a part wavelength range are impressed through the optics on a single element of the detector line.
摘要翻译： 用于作用于具有不同波长的平行光束的光谱分析单元。 光谱分析单元包括光束落在其上的衍射光栅，衍射光栅通过在限定光束衍射级数1而不进行再循环的第一光谱方向上通过衍射分离不同波长，并且衍射光栅在限定第二方向的第二方向上折射光束 没有再循环的光束衍射级0，由多个元件组成的检测器线，用于将分束光束衍射级1聚焦在检测器线路上而不再循环的光学器件，连接到检测器线的评估电子设备，用于获得与 以及偏转装置，其中没有再循环的衍射级0光束在偏转装置上相遇，所述偏转装置被定向和定位成使得该光束落在衍射光栅上，从而产生具有第一再循环的反射衍射级1光束和 反射衍射级0光束与fi 第一次循环，其中没有再循环的衍射级1和具有部分波长范围的第一次再循环的反射衍射级1光束通过检测器线的单个元件上的光学器件施加。
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公开(公告)号：US20060273261A1
公开(公告)日：2006-12-07
申请号：US11416394
申请日：2006-05-03
IPC分类号： G01N21/64
CPC分类号： G02B21/008
摘要： A Laser Scanning Microscope with an illumination radiation distribution, which is guided over a sample for scanning and in which an image of the sample is taken from the sample radiation generated and detected during the scanning, wherein the sample is sampled with an imaging rate of x images per second, wherein in a mode for the adjustment of the device parameters, the imaging rate is reduced with uniform sampling speed. preferably for sparing the sample the exposure, to a fraction X/Y of X, Y>1.
摘要翻译： 具有照射辐射分布的激光扫描显微镜，其被引导到用于扫描的样本上，并且其中从扫描期间产生和检测的样品辐射中取出样品的图像，其中以x的成像速率 图像每秒，其中在用于调整设备参数的模式下，以均匀的采样速度降低成像速率。 优选用于将样品暴露于X，Y> X的分数X / Y。
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6.发明授权Calibration device and laser scanning microscope with such a calibration device 有权校准装置和激光扫描显微镜用这种校准装置公开(公告)号：US08115164B2
公开(公告)日：2012-02-14
申请号：US12320599
申请日：2009-01-29
申请人： Ralf Netz , Wolfgang Bathe , Joerg Steinert , Werner Kleinschmidt , Ingo Fahlbusch , Michael Brehm
发明人： Ralf Netz , Wolfgang Bathe , Joerg Steinert , Werner Kleinschmidt , Ingo Fahlbusch , Michael Brehm
IPC分类号： G01D18/00
CPC分类号： G02B21/34 , G01M11/0264 , G02B21/002 , G02B27/32
摘要： A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.
摘要翻译： 用于在激光扫描显微镜中管理各种性能测试和/或校准任务的校准装置。 具有聚焦光学元件和布置在聚焦光学器件的焦平面中的测试结构的校准装置可以被转换成显微镜光束路径，该结构元件可在反射和/或透射的光中可检测到，在共同安装中彼此对准 在激光扫描显微镜中，使得聚焦光学元件的瞳孔与激光扫描显微镜的客观瞳孔重合或位于与其共轭的平面中。
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7.发明申请Calibration device and laser scanning microscope with such a calibration device 有权校准装置和激光扫描显微镜用这种校准装置公开(公告)号：US20090224174A1
公开(公告)日：2009-09-10
申请号：US12320599
申请日：2009-01-29
申请人： Ralf Netz , Wolfgang Bathe , Joerg Steinert , Werner Kleinschmidt , Ingo Fahlbusch , Michael Brehm
发明人： Ralf Netz , Wolfgang Bathe , Joerg Steinert , Werner Kleinschmidt , Ingo Fahlbusch , Michael Brehm
CPC分类号： G02B21/34 , G01M11/0264 , G02B21/002 , G02B27/32
摘要： A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.
摘要翻译： 用于在激光扫描显微镜中管理各种性能测试和/或校准任务的校准装置。 具有聚焦光学元件和布置在聚焦光学器件的焦平面中的测试结构的校准装置可以被转换成显微镜光束路径，该结构元件可在反射和/或透射的光中可检测到，在共同安装中彼此对准 在激光扫描显微镜中，使得聚焦光学元件的瞳孔与激光扫描显微镜的客观瞳孔重合或位于与其共轭的平面中。
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8.发明申请公开(公告)号：US20050196325A1
公开(公告)日：2005-09-08
申请号：US11109898
申请日：2005-04-19
申请人： Wolfgang Bathe , Peter Kuehn , Dieter Schau , Alexander Friedman , Albert Gough
发明人： Wolfgang Bathe , Peter Kuehn , Dieter Schau , Alexander Friedman , Albert Gough
CPC分类号： G01N21/6452 , G01N21/6458 , G02B21/16 , G02B21/34
摘要： Arrangement for the evaluation of fluorescence-based detection reactions in transparent specimen vessels, wherein the excitation and imaging of the fluorescence is carried out through the vessel bottom, and the specimens are introduced from above, wherein an adjustable cover is provided which closes the top of the specimen vessels and which has at least one opening for introducing specimens and which is positioned above the specimen vessels provided for filling only during the filling process and/or is opened only during the filling process.
摘要翻译： 用于评估透明样品容器中基于荧光的检测反应的布置，其中荧光的激发和成像通过容器底部进行，并且从上方引入样品，其中提供可调节的盖，其封闭顶部的顶部 样品容器，并且具有用于引入试样的至少一个开口，并且其位于仅在填充过程期间提供用于填充的样品容器上方和/或仅在填充过程期间打开。
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公开(公告)号：US20120229791A1
公开(公告)日：2012-09-13
申请号：US13498062
申请日：2010-09-17
CPC分类号： G02B21/0032 , G02B21/0036 , G02B21/006 , G02B21/0064 , G02B21/0076 , G02B21/367 , G02B26/0891
摘要： A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.
摘要翻译： 一种显微镜，包括提供照射样品区域的光片的照明装置，所述片材沿着照明光束路径的照明轴线和垂直于照明轴线的横轴线具有平面延伸。 检测装置检测在检测轴上从样本区域发出的光，照明轴和检测轴以及横轴和检测轴相对于彼此以不等于零的角度取向。 检测装置具有设置在检测光束路径中的检测透镜系统和用于将检测光束路径分割成两个光束子路径的分离装置。 表面检测器的无限区域中的二向色分束器约为3mm厚。 摇摆板相对于布置在两个光束子路径之一中的检测轴线彼此正交配置，因此可以自动叠加测量值。
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公开(公告)号：US08497464B2
公开(公告)日：2013-07-30
申请号：US12856792
申请日：2010-08-16
申请人： Wolfgang Bathe , Michael Goelles , Mirko Liedtke
发明人： Wolfgang Bathe , Michael Goelles , Mirko Liedtke
CPC分类号： G01J1/04 , G01J1/02 , G01J1/0209 , G01J1/0407 , G01J1/0411 , G01J1/0422 , G01J3/02 , G01J3/0205 , G01J3/0208 , G01J3/0216 , G01J3/0256 , G02B5/045 , G02B21/0064 , G02B21/008 , H01L27/14625 , H01L27/14806 , H01L31/02325
摘要： To increase the sensitivity of detector arrangements, it is known that light deflection elements in the form of a line arrays having spherical elements may be used to focus incident light onto light-sensitive regions of the detector. Manufacturing such line arrays is complex and cost intensive, especially in small lot numbers. The increased sensitivity of the detector array can be achieved easily and inexpensively by using a novel light deflection element. The detector arrangement therefore has a light deflection element having light entrance surfaces, deflecting incident light by refraction onto light-sensitive regions of the detector. Light entrance surfaces of the light deflection element are inclined with respect to one another and are designed as planar surfaces. The detector arrangement is suitable in particular for detection of light emanating from a specimen in a microscope, preferably in a laser-scanning microscope.
摘要翻译： 为了提高检测器装置的灵敏度，已知可以使用具有球形元件的线阵列形式的光偏转元件将入射光聚焦到检测器的光敏区域上。 制造这样的线阵列是复杂和成本密集的，特别是在很少的批号。 通过使用新颖的光偏转元件，可以容易且廉价地实现检测器阵列的增加的灵敏度。 因此，检测器装置具有具有光入射表面的光偏转元件，通过折射将入射光偏转到检测器的光敏区域上。 光偏转元件的光入射面相对于彼此倾斜并被设计为平面。 检测器装置特别适于检测在显微镜中优选在激光扫描显微镜中从样品发出的光。
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