Detector arrangement having increased sensitivity
    1.
    发明授权
    Detector arrangement having increased sensitivity 有权
    检测器布置灵敏度增加

    公开(公告)号:US08497464B2

    公开(公告)日:2013-07-30

    申请号:US12856792

    申请日:2010-08-16

    IPC分类号: G01D5/30 H01J3/14 H01L27/00

    摘要: To increase the sensitivity of detector arrangements, it is known that light deflection elements in the form of a line arrays having spherical elements may be used to focus incident light onto light-sensitive regions of the detector. Manufacturing such line arrays is complex and cost intensive, especially in small lot numbers. The increased sensitivity of the detector array can be achieved easily and inexpensively by using a novel light deflection element. The detector arrangement therefore has a light deflection element having light entrance surfaces, deflecting incident light by refraction onto light-sensitive regions of the detector. Light entrance surfaces of the light deflection element are inclined with respect to one another and are designed as planar surfaces. The detector arrangement is suitable in particular for detection of light emanating from a specimen in a microscope, preferably in a laser-scanning microscope.

    摘要翻译: 为了提高检测器装置的灵敏度,已知可以使用具有球形元件的线阵列形式的光偏转元件将入射光聚焦到检测器的光敏区域上。 制造这样的线阵列是复杂和成本密集的,特别是在很少的批号。 通过使用新颖的光偏转元件,可以容易且廉价地实现检测器阵列的增加的灵敏度。 因此,检测器装置具有具有光入射表面的光偏转元件,通过折射将入射光偏转到检测器的光敏区域上。 光偏转元件的光入射面相对于彼此倾斜并被设计为平面。 检测器装置特别适于检测在显微镜中优选在激光扫描显微镜中从样品发出的光。

    DETECTOR ARRANGEMENT HAVING INCREASED SENSITIVITY
    2.
    发明申请
    DETECTOR ARRANGEMENT HAVING INCREASED SENSITIVITY 有权
    具有增强灵敏度的检测器装置

    公开(公告)号:US20110042555A1

    公开(公告)日:2011-02-24

    申请号:US12856792

    申请日:2010-08-16

    IPC分类号: G01D5/30

    摘要: To increase the sensitivity of detector arrangements, it is known that light deflection elements in the form of a line arrays having spherical elements may be used to focus incident light onto light-sensitive regions of the detector. Manufacturing such line arrays is complex and cost intensive, especially in small lot numbers. The increased sensitivity of the detector array can be achieved easily and inexpensively by using a novel light deflection element. The detector arrangement therefore has a light deflection element having light entrance surfaces, deflecting incident light by refraction onto light-sensitive regions of the detector. Light entrance surfaces of the light deflection element are inclined with respect to one another and are designed as planar surfaces. The detector arrangement is suitable in particular for detection of light emanating from a specimen in a microscope, preferably in a laser-scanning microscope.

    摘要翻译: 为了提高检测器装置的灵敏度,已知可以使用具有球形元件的线阵列形式的光偏转元件将入射光聚焦到检测器的光敏区域上。 制造这样的线阵列是复杂和成本密集的,特别是在很少的批号。 通过使用新颖的光偏转元件,可以容易且廉价地实现检测器阵列的增加的灵敏度。 因此,检测器装置具有具有光入射表面的光偏转元件,通过折射将入射光偏转到检测器的光敏区域上。 光偏转元件的光入射面相对于彼此倾斜并被设计为平面。 检测器装置特别适于检测在显微镜中优选在激光扫描显微镜中从样品发出的光。

    MICROSCOPE
    3.
    发明申请
    MICROSCOPE 有权
    显微镜

    公开(公告)号:US20120229791A1

    公开(公告)日:2012-09-13

    申请号:US13498062

    申请日:2010-09-17

    IPC分类号: G01P3/40 G02B21/06 G01J1/00

    摘要: A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

    摘要翻译: 一种显微镜,包括提供照射样品区域的光片的照明装置,所述片材沿着照明光束路径的照明轴线和垂直于照明轴线的横轴线具有平面延伸。 检测装置检测在检测轴上从样本区域发出的光,照明轴和检测轴以及横轴和检测轴相对于彼此以不等于零的角度取向。 检测装置具有设置在检测光束路径中的检测透镜系统和用于将检测光束路径分割成两个光束子路径的分离装置。 表面检测器的无限区域中的二向色分束器约为3mm厚。 摇摆板相对于布置在两个光束子路径之一中的检测轴线彼此正交配置,因此可以自动叠加测量值。

    Microscope having light sheet illumination of a sample region
    4.
    发明授权
    Microscope having light sheet illumination of a sample region 有权
    具有样品区域的光照照明的显微镜

    公开(公告)号:US09239454B2

    公开(公告)日:2016-01-19

    申请号:US13498062

    申请日:2010-09-17

    摘要: A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

    摘要翻译: 一种显微镜,包括提供照射样品区域的光片的照明装置,所述片材沿着照明光束路径的照明轴线和垂直于照明轴线的横轴线具有平面延伸。 检测装置检测在检测轴上从样本区域发出的光,照明轴和检测轴以及横轴和检测轴相对于彼此以不等于零的角度取向。 检测装置具有设置在检测光束路径中的检测透镜系统和用于将检测光束路径分割成两个光束子路径的分离装置。 表面检测器的无限区域中的二向色分束器约为3mm厚。 摇摆板相对于布置在两个光束子路径之一中的检测轴线彼此正交配置,因此可以自动叠加测量值。

    Calibration device and laser scanning microscope with such a calibration device
    5.
    发明授权
    Calibration device and laser scanning microscope with such a calibration device 有权
    校准装置和激光扫描显微镜用这种校准装置

    公开(公告)号:US08115164B2

    公开(公告)日:2012-02-14

    申请号:US12320599

    申请日:2009-01-29

    IPC分类号: G01D18/00

    摘要: A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.

    摘要翻译: 用于在激光扫描显微镜中管理各种性能测试和/或校准任务的校准装置。 具有聚焦光学元件和布置在聚焦光学器件的焦平面中的测试结构的校准装置可以被转换成显微镜光束路径,该结构元件可在反射和/或透射的光中可检测到,在共同安装中彼此对准 在激光扫描显微镜中,使得聚焦光学元件的瞳孔与激光扫描显微镜的客观瞳孔重合或位于与其共轭的平面中。

    Laser scanning microscope
    7.
    发明授权
    Laser scanning microscope 有权
    激光扫描显微镜

    公开(公告)号:US07554664B2

    公开(公告)日:2009-06-30

    申请号:US11878998

    申请日:2007-07-30

    IPC分类号: G01N21/25

    CPC分类号: G02B21/0076

    摘要: Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to the threshold wavelength between the transmission and reflection is provided in several partial beam paths for the selection of the wavelengths.

    摘要翻译: 激光扫描显微镜具有用于照射样品的照明光束路径和用于来自样品的光的波长依赖性记录的检测光束路径,由此提供用于选择检测波长的滤光器,其特征在于,至少一个刻度滤光器在空间上 关于透射和反射之间的阈值波长可变的几个部分光束路径被提供用于选择波长。

    MICROSCOPE, MORE PARTICULARLY FLUORESCENCE MICROSCOPE, DICHROIC BEAM SPLITTER AND USE THEREOF
    8.
    发明申请
    MICROSCOPE, MORE PARTICULARLY FLUORESCENCE MICROSCOPE, DICHROIC BEAM SPLITTER AND USE THEREOF 审中-公开
    显微镜,更特别的荧光显微镜,双色光束分离器及其使用

    公开(公告)号:US20120008197A1

    公开(公告)日:2012-01-12

    申请号:US13176032

    申请日:2011-07-05

    IPC分类号: G02B21/06 G02B27/28

    摘要: The invention relates to a microscope, more particularly to a fluorescence microscope, for the structured illumination microscopy, comprising a microscope light path having an optical axis, including a beam splitter for coupling illumination light into the microscope light path, including an illumination pattern unit disposed, in particular, in the microscope light path for the purpose of generating an illuminated pattern on, or in, a sample to be examined, comprising a rotary device for the purpose of effecting relative rotation about the optical axis between the illumination pattern and the sample to be examined. The microscope is characterized in that a rotary polarizing device is provided for the purpose of rotating a polarization of the illumination light, that the angular positions of the rotary device and of the rotary polarizing device are inflexibly coupled to each other, that in order to reduce polarization effects during relative rotation between the illumination pattern and the beam splitter, a beam splitter is used which reflects and/or transmits the incident illumination light while substantially maintaining the polarization state, and/or that in order to reduce polarization effects while effecting relative rotation between the illumination pattern and the beam splitter, a beam splitter is positioned in the optical path such that the angle of incidence of the illumination light relative to a surface normal vector of the beam splitter is less than 45 degrees. The invention also relates to a dichroic beam splitter and to the use thereof in a fluorescence microscope.

    摘要翻译: 本发明涉及一种用于结构化照明显微镜的显微镜,更具体地涉及一种荧光显微镜,包括具有光轴的显微镜光路,包括用于将照明光耦合到显微镜光路中的分束器,包括设置的照明图案单元 特别地,在显微镜光路中,为了在被检测样品上或其中产生照射图案,包括旋转装置,用于在照射图案和样品之间实现围绕光轴的相对旋转 要检查 显微镜的特征在于,为了旋转照明光的偏振,旋转装置和旋转偏振装置的角度位置彼此不灵敏地耦合而设置旋转偏振装置,以便减少 在照明图案和分束器之间的相对旋转期间的偏振效应,使用分束器,其反射和/或透射入射照明光,同时基本保持偏振状态,和/或为了在实现相对旋转时减少偏振效应 在照明图案和分束器之间,光束分离器被定位在光路中,使得照明光相对于分束器的表面法线矢量的入射角小于45度。 本发明还涉及二向色分束器及其在荧光显微镜中的应用。

    Calibration device and laser scanning microscope with such a calibration device
    9.
    发明申请
    Calibration device and laser scanning microscope with such a calibration device 有权
    校准装置和激光扫描显微镜用这种校准装置

    公开(公告)号:US20090224174A1

    公开(公告)日:2009-09-10

    申请号:US12320599

    申请日:2009-01-29

    IPC分类号: G01N21/64 G02B21/06

    摘要: A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.

    摘要翻译: 用于在激光扫描显微镜中管理各种性能测试和/或校准任务的校准装置。 具有聚焦光学元件和布置在聚焦光学器件的焦平面中的测试结构的校准装置可以被转换成显微镜光束路径,该结构元件可在反射和/或透射的光中可检测到,在共同安装中彼此对准 在激光扫描显微镜中,使得聚焦光学元件的瞳孔与激光扫描显微镜的客观瞳孔重合或位于与其共轭的平面中。

    Climatic cabinet
    10.
    发明授权
    Climatic cabinet 有权
    气候柜

    公开(公告)号:US06536859B1

    公开(公告)日:2003-03-25

    申请号:US09631519

    申请日:2000-08-03

    申请人: Wolfgang Bathe

    发明人: Wolfgang Bathe

    IPC分类号: A47B8818

    摘要: A climatic cabinet for receiving objects, preferably microtiter plates, which contains a preferably rotatable object receptacle in the interior. The object receptacle is vertically adjustable for changing its position relative to an input and output door. The object receptacle is adjustable in a raised position with respect to its position relative to the input and output door.

    摘要翻译: 用于接收物体的气候柜,优选微滴板,其在内部包含优选可旋转的物体容器。 对象插座可垂直调节,用于相对于输入和输出门改变其位置。 物体容器相对于其相对于输入和输出门的位置处于升高位置是可调节的。