摘要:
In one embodiment, the present invention includes a method for writing data into both a volatile portion and an erase block of a non-volatile portion of a storage device, and maintaining the data in the volatile portion until the data is successfully written to the erase block. In this way, enhanced data reliability is provided. Other embodiments are described and claimed.
摘要:
Apparatus and methods are disclosed, such as those involving a flash memory device. One such apparatus includes a memory block including a plurality of memory cells; and a data randomizer configured to randomly or pseudo-randomly change original data to be stored in the memory block to changed data. The original data is changed such that a pattern of data as stored in the memory block is different than what it would have been if the original data had been stored in the memory block during a write operation. This configuration can reduce or eliminate data pattern-dependent errors in data digits stored in memory cells.
摘要:
Apparatus and methods are disclosed, such as those involving a flash memory device. One such apparatus includes a memory block including a plurality of memory cells; and a data randomizer configured to randomly or pseudo-randomly change original data to be stored in the memory block to changed data. The original data is changed such that a pattern of data as stored in the memory block is different than what it would have been if the original data had been stored in the memory block during a write operation. This configuration can reduce or eliminate data pattern-dependent errors in data digits stored in memory cells.
摘要:
A nonvolatile memory cell comprising a pair of spaced apart shallow trench isolation regions formed in a substrate and defining a substrate active region. A tunnel dielectric is formed on the substrate active region. A floating gate is formed on the tunnel dielectric and is self aligned between the spaced apart shallow trench isolation regions. A dielectric layer is formed on the floating gate and a control gate formed on the dielectric layer. A source region and a drain region are formed in the substrate active region on opposite sides of the floating gate.
摘要:
A nonvolatile memory cell comprising a pair of spaced apart shallow trench isolation regions formed in a substrate and defining a substrate active region. A tunnel dielectric is formed on the substrate active region. A floating gate is formed on the tunnel dielectric and is self aligned between the spaced apart shallow trench isolation regions. A dielectric layer is formed on the floating gate and a control gate formed on the dielectric layer. A source region and a drain region are formed in the substrate active region on opposite sides of the floating gate.
摘要:
Apparatus and methods are disclosed, such as those involving a flash memory device. One such apparatus includes a memory block including a plurality of memory cells; and a data randomizer configured to randomly or pseudo-randomly change original data to be stored in the memory block to changed data. The original data is changed such that a pattern of data as stored in the memory block is different than what it would have been if the original data had been stored in the memory block during a write operation. This configuration can reduce or eliminate data pattern-dependent errors in data digits stored in memory cells.
摘要:
Apparatus and methods are disclosed, such as those involving a flash memory device. One such apparatus includes a memory block including a plurality of memory cells; and a data randomizer configured to randomly or pseudo-randomly change original data to be stored in the memory block to changed data. The original data is changed such that a pattern of data as stored in the memory block is different than what it would have been if the original data had been stored in the memory block during a write operation. This configuration can reduce or eliminate data pattern-dependent errors in data digits stored in memory cells.
摘要:
Apparatus for controlling a length of a period during which the output circuitry of a memory array waits before latching the output data including apparatus for detecting the presence of an error in data read from an memory array, apparatus for providing a first value to determine a wait period, apparatus responsive to the detection of an error for providing a second value, apparatus responsive to the first value for generating a signal to latch a data output from the memory array after a first period and responsive to the second value for generating a signal to latch a data output from the memory array after a second period.
摘要:
Apparatus for controlling a length of a period during which the output circuitry of a memory array waits before latching the output data including apparatus for detecting the presence of an error in data read from an memory array, apparatus for providing a first value to determine a wait period, apparatus responsive to the detection of an error for providing a second value, apparatus responsive to the first value for generating a signal to latch a data output from the memory array after a first period and responsive to the second value for generating a signal to latch a data output from the memory array after a second period.
摘要:
Circuitry for independently controlling the erasure of a flash memory including redundant rows for replacing shorted rows within the memory array is described. An erase command fires a sequencer circuit, which schedules the controllers that execute the tasks of an erase event. By nesting the control of erase events, the sequencer circuit allows easy modification of erase events. The sequencer circuit fires a precondition controller upon receipt of an erase command. The precondition controller then manages the preconditioning of the memory array, including memory cells within shorted rows. The precondition controller does so by disabling the replacement of shorted rows with redundant rows. During preconditioning each memory cell is programmed to a logic 0, before the memory cell is erased to a logic 1, to prevent the overerasure of memory cells during subsequent erasure. Afterward, the sequencer fires the erase controller. The erase control circuit then manages erasure. The circuitry also includes a postcondition controller and a program controller.