公开(公告)号：US08250697B2

公开(公告)日：2012-08-28

申请号：US11843396

申请日：2007-08-22

申请人： Robin Lee ,  Marc Palmer

发明人： Robin Lee ,  Marc Palmer

IPC分类号： B08B1/02 ,  B08B9/02

CPC分类号： B08B1/02 ,  B08B3/041 ,  B65H54/58 ,  B65H2301/5115

摘要： A cable processing system includes a conveyor that holds cables and conveys the cables in a specified direction. The operation stretches the cables and allows them to be packaged or otherwise coiled. The cable processing system may wash the cables as they pass thereby.

摘要翻译： 电缆处理系统包括保持电缆并沿指定方向传送电缆的输送机。 操作延伸电缆，并允许它们被包装或以其他方式盘绕。 电缆处理系统可以在电缆通过时清洗电缆。

公开(公告)号：US08228067B2

公开(公告)日：2012-07-24

申请号：US11934012

申请日：2007-11-01

申请人： Chris Conti ,  Marc Palmer ,  Robin Lee

发明人： Chris Conti ,  Marc Palmer ,  Robin Lee

IPC分类号： G01R31/02 ,  G01R31/327

CPC分类号： G01R31/2844 ,  G01R31/2825 ,  Y10T307/406

摘要： A load bank that is used to test electrical connections. The connections are attached to the load bank, so that the switches are loaded during the testing. The overheating or underheating, of either switches or loads can be tested, evaluated, and used to determine faults and errors.

摘要翻译： 用于测试电气连接的负载组。 连接连接到负载组，以便在测试期间加载开关。 任何开关或负载的过热或过热都可以被测试，评估和用于确定故障和错误。

公开(公告)号：US20080211508A1

公开(公告)日：2008-09-04

申请号：US11934012

申请日：2007-11-01

申请人： Chris Conti ,  Marc Palmer ,  Robin Lee

发明人： Chris Conti ,  Marc Palmer ,  Robin Lee

IPC分类号： G01R31/02 ,  H02J3/00

CPC分类号： G01R31/2844 ,  G01R31/2825 ,  Y10T307/406

摘要： A load bank that is used to test electrical connections. The connections are attached to the load bank, so that the switches are loaded during the testing. The overheating or underheating, of either switches or loads can be tested, evaluated, and used to determine faults and errors.

摘要翻译： 用于测试电气连接的负载组。 连接连接到负载组，以便在测试期间加载开关。 任何开关或负载的过热或过热都可以被测试，评估和用于确定故障和错误。

公开(公告)号：US09593136B2

公开(公告)日：2017-03-14

申请号：US14130384

申请日：2012-06-29

申请人： Helena I. Boshoff ,  Cynthia S. Dowd ,  Emily R. Jackson ,  Kylene Kehn-Hall ,  Richard E. Lee ,  Robin Lee ,  Geraldine San Jose

发明人： Helena I. Boshoff ,  Cynthia S. Dowd ,  Emily R. Jackson ,  Kylene Kehn-Hall ,  Richard E. Lee ,  Robin Lee ,  Geraldine San Jose

IPC分类号： C07F9/40 ,  A61K31/662 ,  A01N57/18 ,  A61K31/66 ,  A01N37/46 ,  A61K31/135 ,  C12Q1/533

CPC分类号： C07F9/4021 ,  A01N37/46 ,  A01N57/18 ,  A61K31/135 ,  A61K31/66 ,  C07F9/4018 ,  C12Q1/533 ,  G01N2500/04

摘要： In particular, the compound is effective to inhibit Dxr in Mycobacterium tuberculosis (Mtb). The present invention relates to compounds having general formula (I) or (II) where X is an acidic group, such as carboxylate, phosphonate, sulfate, and tetrazole; Ar is a substituted or unsubstituted aromatic or heteroaromatic group; and n is 0, 1, 2, 3, or 4, preferably 2, 3, or 4. The compounds inhibits 1-deoxy-D-xylulose-5-phosphate reductoisomerase (Dxr), particularly Dxr in Mycobacterium tuberculosis (Mtb).

摘要翻译： 特别地，该化合物有效地抑制结核分枝杆菌（Mtb）中的Dxr。 本发明涉及具有通式（I）或（II）的化合物，其中X是酸性基团，如羧酸盐，膦酸盐，硫酸盐和四唑; Ar是取代或未取代的芳族或杂芳族基团; 该化合物抑制结核分枝杆菌（Mtb）中的1-脱氧-D-木酮糖-5-磷酸还原异构酶（Dxr），特别是Dxr。

公开(公告)号：US20120069588A1

公开(公告)日：2012-03-22

申请号：US13302643

申请日：2011-11-22

申请人： Robin Lee ,  Chris Conti

发明人： Robin Lee ,  Chris Conti

IPC分类号： F21S8/00 ,  H05K3/00

CPC分类号： H05B37/03 ,  G01R31/44 ,  Y10T29/49124

摘要： A moving light test system allows connecting moving lights to an interface board and conveying the lights and orienting and testing the lights while they are attached to the board. The lights can be mechanically and electrically connected to the board, and once connected, can be tested in multiple ways without reconfiguring or removing the lights. The board has a connector that can be plugged in at various locations, and the board can also be handled by mechanical devices. In this way, once the light is connected to the board, it does not need to be re-handled. In addition, lights can be tested in different orientations.

摘要翻译： 移动光测试系统允许将移动灯连接到接口板，并在灯被连接到板上时传送灯光并定向和测试灯。 灯可以机械和电气连接到电路板，一旦连接，可以以多种方式进行测试，无需重新配置或拆除灯。 该板有一个可以插入各种位置的连接器，并且该板也可以由机械设备来处理。 以这种方式，一旦灯被连接到电路板，就不需要重新处理。 此外，灯可以以不同的方向进行测试。

公开(公告)号：US20080134809A1

公开(公告)日：2008-06-12

申请号：US11952742

申请日：2007-12-07

申请人： Robin Lee

发明人： Robin Lee

IPC分类号： G01N19/00 ,  G01J1/04

CPC分类号： G01N35/04 ,  Y10T29/51

摘要： A testing table that allows testing lights along its length. The testing table can be used to convey lights along the direction, and to test the lights at different locations along the direction along the conveying. The lights can be cleaned and tested. Empty tubs can be returned.

摘要翻译： 一个测试台，允许测试灯沿其长度。 测试台可用于沿着该方向传输光，并沿沿输送方向测试不同位置的灯。 灯可以清洗和测试。 空桶可以退回。

公开(公告)号：US20060211348A1

公开(公告)日：2006-09-21

申请号：US10553592

申请日：2004-04-16

申请人： Brent Hyde ,  Steven Jones ,  Robin Lee ,  Scott Roger ,  Terry Saunders ,  Matthew Siemers

发明人： Brent Hyde ,  Steven Jones ,  Robin Lee ,  Scott Roger ,  Terry Saunders ,  Matthew Siemers

IPC分类号： B24B19/00

CPC分类号： B24B3/38 ,  B24B33/06 ,  B24B41/066 ,  B24D15/06

摘要： A honing guide and bevel setting jig for removable attachment to the honing guide to properly position the angle and projection of a tool to be sharpened in the jig to enable the tool to be honed at the proper angle and position. An adjustable roller that contacts an abrasive surface during use of the guide facilitates formation of micro bevels. A tool securing bar having a generally triangular shape in the bar's middle section forces the arris-defining back of the tool being honed against a reference surface in the guide by tightening thumb nuts around threaded studs projecting from the bar. Jigs for use with both square and skew edge chisel and blades are described. A concave surface clamp bar honing guide provides enhanced gripping of the tool being honed, and wedges and adjustable structures expand the range of bevel angles that can be honed.

公开(公告)号：US20050229409A1

公开(公告)日：2005-10-20

申请号：US11159435

申请日：2005-06-21

申请人： Robin Lee ,  Terry Saunders

发明人： Robin Lee ,  Terry Saunders

IPC分类号： B27G17/02

CPC分类号： B27G17/02

摘要： A plane such as a low angle jack plane having an adjustable toe that cannot inadvertently slide backwards in the plane body so that it contacts and possibly damages the plane blade. A threaded stop mounted in the plane body bears against the toe establishing the point to which the toe can slide back in the plane body. Rotation of the threaded stop moves the end of the stop by small, easily controlled increments, making it easy to change the width of the mouth while preventing contact between the toe and the plane blade.

公开(公告)号：US06303439B1

公开(公告)日：2001-10-16

申请号：US09449297

申请日：1999-11-24

申请人： Robin Lee ,  Chih-Hung Lin

发明人： Robin Lee ,  Chih-Hung Lin

IPC分类号： H01L218247

CPC分类号： H01L29/66825 ,  H01L21/28273 ,  H01L29/7887

摘要： A method for fabricating a two-bit flash memory cell is described in which a substrate with a trench formed therein is provided. A conformal tunnel oxide layer is then formed on the substrate, followed by forming polysilicon spacers on the portion of the tunnel oxide layer which covers the sidewalls of the trench. The polysilicon spacers are separated into a first polysilicon spacer on the right sidewall and a second polysilicon spacer on the left sidewall. Thereafter, a gate oxide layer is formed on the polysilicon spacers, followed by forming a polysilicon gate on the gate oxide layer in the substrate. Subsequently, a source/drain region is formed on both sides of the polysilicon gate in the substrate.

摘要翻译： 描述了一种用于制造双位闪存单元的方法，其中提供了形成有沟槽的衬底。 然后在衬底上形成保形隧道氧化物层，随后在覆盖沟槽侧壁的隧道氧化物层的部分上形成多晶硅间隔物。 多晶硅间隔物被分离成右侧壁上的第一多晶硅间隔物和左侧壁上的第二多晶硅间隔物。 此后，在多晶硅间隔物上形成栅极氧化层，随后在衬底的栅极氧化物层上形成多晶硅栅极。 随后，在衬底中的多晶硅栅极的两侧上形成源/漏区。

公开(公告)号：US06277705B1

公开(公告)日：2001-08-21

申请号：US09483451

申请日：2000-01-14

申请人： Robin Lee

发明人： Robin Lee

IPC分类号： H01L2176

CPC分类号： H01L21/7682

摘要： A fabrication method for an air-gap, in which method hard mask is used, is described. A patterned hard mask layer is formed on a semiconductor substrate. Taking advantage of the etching selectivity of the hard mask layer to the dielectric layer, an opening with a high aspect ratio is formed in the dielectric layer. A conductive plug is then formed in the opening, followed by forming a conductive layer on the hard mask layer to cover the conductive plug. The hard mask layer is further removed. A silicon oxide layer with poor step coverage is formed to cover the substrate. Using the space remaining after the removal of the hard mask layer, an air-gap is formed between the conductive layer and the dielectric layer to enhance the insulation effect.

摘要翻译： 对使用了硬掩模的气隙的制造方法进行说明。 在半导体衬底上形成图案化的硬掩模层。 利用硬掩模层对电介质层的蚀刻选择性，在电介质层中形成具有高纵横比的开口。 然后在开口中形成导电塞，然后在硬掩模层上形成导电层以覆盖导电塞。 进一步去除硬掩模层。 形成具有差的台阶覆盖的氧化硅层以覆盖基板。 使用去除硬掩模层之后剩余的空间，在导电层和电介质层之间形成气隙以提高绝缘效果。