摘要:
Systems and methods for isolating and characterizing various target materials of a suspension are disclosed. A suspension suspected of containing the target materials is added to a tube. A float with a specific gravity corresponding to that of the target material is inserted into the tube. The tube, float, and suspension are centrifuged together causing the various materials suspended in the suspension to separate into different layers along the axial length of the tube according to their specific gravities. The float and/or tube are configured to drive the various target materials to a region of space between the float and inner wall of the tube.
摘要:
This disclosure is directed to tube and float systems that can be used to detect target materials in a variety of different suspensions. The tube is filled with a suspension suspected of containing a target material. When the tube, a float, and suspension are centrifuged, and the various materials suspended in the suspension are separated into different material layers along the axial length of the tube according to associated specific gravities. The float includes an insert and a float exterior that can be combined so that the float is to be positions at approximately the same level as the layer containing the target material. The float is to be positioned in, and expand the axial length of, the target material layer so that nearly the entire quantity of target material is to be positioned between the float outer surface and the inner surface of the tube.
摘要:
A method and apparatus for inspecting integrated circuit probe cards in which the probe points of the probe card are scanned across a checkplate having a conductivity transition border. The impedances between the probe points and the checkplate as they cross the conductivity transition border are measured to determine when the probe points cross the border. The positions of the probe card when each of the probe points crosses the border are measured to determine the positions of the probe points relative to each other. In one embodiment, the checkplate is formed by a square conductive plate having three quadrants of insulated material and a single quadrant of conductive material mounted on its upper surface. These conductive strips connected to the conductive plate are positioned between the quadrants of insulative material to form the conductivity transition border. In other embodiments, multiple parallel strips or a single dot of conductive material are surrounded by insulative material.
摘要:
Tube and float systems and methods for isolating, enumerating, and harvesting target materials of a suspension are described. In one aspect, a tube and float system includes a filter embedded in a tube cap. The filter enables the passage of fluids but prevents the passage of the target materials. The tube and float system can be used to isolate and enumerate the target materials by centrifuging the tube and float system with the suspension to trap the target materials between the float and inner wall of the tube. Fluids above and below the float are poured off and a second fluid can be introduced to the tube to re-suspend the trapped target material. The second fluid can be poured through the filter in the cap to trap the target material against the filter. The target material can be enumerated and analyzed.
摘要:
An apparatus for electrically testing a semiconductor device is herein disclosed. The apparatus includes carriers for a semiconductor device and a probe card (52) that are adapted for complementary registration with one another. The coupled carriers may be stacked or used in another high-density arrangement during electrical test or burn-in to improve test cell utilization.
摘要:
A method and apparatus for inspecting integrated circuit probe cards in which the probe points of the probe card are scanned across a checkplate having a conductivity transition border. The impedances between the probe points and the checkplate as they cross the conductivity transition border are measured to determine when the probe points cross the border. The positions of the probe card when each of the probe points crosses the border are measured to determine the positions of the probe points relative to each other. In one embodiment, the checkplate is formed by a square conductive plate having three quadrants of insulated material and a single quadrant of conductive material mounted on its upper surface. These conductive strips connected to the conductive plate are positioned between the quadrants of insulative material to form the conductivity transition border. In other embodiments, multiple parallel strips or a single dot of conductive material are surrounded by insulative material.
摘要:
Tube and float systems and methods for isolating, enumerating, and harvesting target materials of a suspension are described. In one aspect, a tube and float system includes a filter embedded in a tube cap. The filter enables the passage of fluids but prevents the passage of the target materials. The tube and float system can be used to isolate and enumerate the target materials by centrifuging the tube and float system with the suspension to trap the target materials between the float and inner wall of the tube. Fluids above and below the float are poured off and a second fluid can be introduced to the tube to re-suspend the trapped target material. The second fluid can be poured through the filter in the cap to trap the target material against the filter. The target material can be enumerated and analyzed.
摘要:
Methods and systems disclosed in the present application include membrane-like filters and methods and systems that employ these membrane-like filters to isolate circulating tumor cells and other abnormal cells from biological fluids, such as blood. The disclosed methods and systems use membrane-like filters that include a pattern or array of small, tapered apertures fabricated within a relatively thin but mechanically robust polymeric material that resists accumulation of biological-solution components and clogging during filtration of biological solutions.
摘要:
A method and apparatus for inspecting integrated circuit probe cards in which the probe points of the probe card are scanned across a checkplate having a conductivity transition border. The impedances between the probe points and the checkplate as they cross the conductivity transition border are measured to determine when the probe points cross the border. The positions of the probe card when each of the probe points crosses the border are measured to determine the positions of the probe points relative to each other. In one embodiment, the checkplate is formed by a square conductive plate having three quadrants of insulated material and a single quadrant of conductive material mounted on its upper surface. These conductive strips connected to the conductive plate are positioned between the quadrants of insulative material to form the conductivity transition border. In other embodiments, multiple parallel strips or a single dot of conductive material are surrounded by insulative material.