Non-volatile semiconductor memory device with nand type memory cell
arrays
    2.
    发明授权
    Non-volatile semiconductor memory device with nand type memory cell arrays 失效
    具有n型存储单元阵列的非易失性半导体存储器件

    公开(公告)号:US5978265A

    公开(公告)日:1999-11-02

    申请号:US746176

    申请日:1991-08-15

    CPC分类号: G11C16/0483 G11C16/10

    摘要: An electrically erasable programmable read-only memory is disclosed which has programmable memory cells connected to parallel bit lines provided above a semiconductor substrate. The memory cells include NAND cell blocks each of which has a series array of memory cell transistors. Parallel word lines are connected to the control gates of the memory cell transistors, respectively. In a data write mode, a selection transistor in a certain NAND cell block including a selected memory cell is rendered conductive to connect the certain cell block to a corresponding bit line associated therewith. Under such a condition, electrons are tunnel-injected into a floating gate of the selected memory cell transistor, and the threshold value of the certain transistor is increased to be a positive value. A logical data is thus written in the selected memory cell transistor. The data in the selected cell transistor is erased by discharging carriers accumulated in the floating gate thereof to its drain or the substrate, so that the threshold value of the certain transistor is decreased to be a negative value.

    摘要翻译: 公开了一种电可擦除可编程只读存储器,其具有连接到设置在半导体衬底上的并行位线的可编程存储器单元。 存储单元包括NAND单元块,每个NAND单元具有存储单元晶体管的串联阵列。 并行字线分别连接到存储单元晶体管的控制栅极。 在数据写入模式中,包括所选择的存储单元的某个NAND单元块中的选择晶体管被导通以将特定单元块连接到与其相关联的相应位线。 在这种条件下,电子被隧道注入到所选择的存储单元晶体管的浮动栅极中,并且特定晶体管的阈值增加到正值。 因此,逻辑数据被写入所选择的存储单元晶体管中。 通过将其浮置栅极中累积的载流子放电到其漏极或衬底来擦除所选择的单元晶体管中的数据,使得某个晶体管的阈值降低为负值。

    Non-volatile semiconductor memory with NAND cell structure and switching
transistors with different channel lengths to reduce punch-through
    3.
    发明授权
    Non-volatile semiconductor memory with NAND cell structure and switching transistors with different channel lengths to reduce punch-through 失效
    具有NAND单元结构的非易失性半导体存储器和具有不同通道长度的开关晶体管以减少穿通

    公开(公告)号:US5508957A

    公开(公告)日:1996-04-16

    申请号:US312072

    申请日:1994-09-26

    摘要: An erasable programmable read-only memory with NAND cell structure includes NAND cell blocks, each of which has a selection transistor connected to the corresponding bit line and a series array of memory cell transistors, and a switching transistor connected between the series array of memory cell transistors and ground. Each cell transistor has a floating gate and a control gate. Word lines are connected to the control gates of the cell transistors. In a data writing mode, a selection transistor of a certain cell block containing a selected cell is rendered conductive, so that this cell block is connected to the corresponding bit line. Under such a condition, a decoder circuit stores a desired data (a logic "one" e.g.) in the selected cell, by applying an "H" level voltage to the bit line, applying an "L" level voltage to a word line connected to the selected cell, applying the "H" level voltage to a memory cell or cells positioned between the selected cell and the bit line, and applying the "L" level voltage to a memory cell or cells positioned between the selected cell and the ground. The selection transistor and switching transistor for a corresponding series array of memory cell transistors have different channel lengths to reduce punch through.

    摘要翻译: 具有NAND单元结构的可擦除可编程只读存储器包括NAND单元块,每个单元块具有连接到对应位线的选择晶体管和存储单元晶体管的串联阵列,以及连接在串联阵列存储单元之间的开关晶体管 晶体管和地。 每个单元晶体管具有浮置栅极和控制栅极。 字线连接到单元晶体管的控制栅极。 在数据写入模式中,包含所选择的单元的某个单元块的选择晶体管被导通,使得该单元块连接到对应的位线。 在这种情况下,解码器电路通过向位线施加“H”电平电压,将所需数据(例如逻辑“1”)存储在所选择的单元中,对连接的字线施加“L”电平电压 将“H”电平施加到位于所选择的单元和位线之间的存储单元或单元,并将“L”电平施加到位于所选单元和地之间的存储单元或单元 。 用于存储单元晶体管的相应串联阵列的选择晶体管和开关晶体管具有不同的沟道长度以减少穿通。