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公开(公告)号:US20250142850A1
公开(公告)日:2025-05-01
申请号:US18783982
申请日:2024-07-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seyoung Kim , Dahee Kim , Hongseon Song , Wanggon Lee , Sukjin Chung , Beomjong Kim
IPC: H10B12/00
Abstract: Provided is an integrated circuit device including a lower electrode, a dielectric layer on the lower electrode, an upper electrode facing the lower electrode with the dielectric layer therebetween, and an interfacial structure between the dielectric layer and the upper electrode, wherein the interfacial structure includes a first interfacial layer and a second interfacial layer, and a high band gap interfacial layer between the first interfacial layer and the second interfacial layer, wherein a third band gap of the high band gap interfacial layer is greater than a first band gap of the first interfacial layer and is greater than a second band gap of the second interfacial layer.
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公开(公告)号:US20250140771A1
公开(公告)日:2025-05-01
申请号:US18668868
申请日:2024-05-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dahee Kim , Taehoon Lee , Gyujin Choi
IPC: H01L25/18 , H01L21/48 , H01L23/00 , H01L23/31 , H01L23/367 , H01L23/498
Abstract: A semiconductor package using a core layer to reduce the total thickness of the semiconductor package and to maximize heat dissipation characteristics is provided. The semiconductor package includes a first redistribution layer, a first semiconductor device disposed on the first redistribution layer, a second semiconductor device disposed on the first redistribution layer and adjacent to the first semiconductor device, a support member disposed at side surfaces of the first semiconductor device and the second semiconductor device, a third semiconductor device disposed above the second semiconductor device, and a heat dissipation structure disposed above the first semiconductor device and adjacent to the third semiconductor device.
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公开(公告)号:US20250140728A1
公开(公告)日:2025-05-01
申请号:US18898033
申请日:2024-09-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Taehoon Lee , Dahee Kim , Gyujin Choi
IPC: H01L23/00 , H01L23/498
Abstract: An example semiconductor package includes a redistribution structure, including a first surface and a second surface, and a semiconductor chip on the first surface of the redistribution structure. The redistribution structure includes a plurality of first conductive lines, including a first signal line, and a plurality of second conductive lines at a vertical level different from the plurality of first conductive lines. The plurality of second conductive lines include a ground line electrically insulated from the first signal line. The ground line includes an opening extending through the ground line at a position vertically overlapping the first signal line and a venting hole communicating with a first end portion of the opening. The first end portion of the opening has a first width in a first horizontal direction. The venting hole has a second width smaller than the first width in the first horizontal direction.
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公开(公告)号:US20220165698A1
公开(公告)日:2022-05-26
申请号:US17401664
申请日:2021-08-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dahee Kim , Jeongrim Seo , Gookmi Song
IPC: H01L23/00 , H01L25/10 , H01L23/31 , H01L23/538 , H01L21/48
Abstract: A semiconductor package includes: a redistribution substrate including a connection via and a redistribution layer electrically connected to each other, and a redistribution pad electrically connected to the redistribution layer by the connection via, a space pattern separating at least some of the redistribution pads from each other, a dummy metal pattern at least partially surrounded by the space pattern, and a degassing opening passing through at least one of the redistribution pad and the dummy metal pattern; a connection bump electrically connected to the redistribution pad; and a semiconductor chip on the redistribution substrate and including a connection pad electrically connected to the redistribution layer, the redistribution pad including a plurality of protrusions protruding from the same plane in directions different from each other and having a corner having a rounded shape, and the dummy metal pattern includes branch patterns each extending in directions different from one another.
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公开(公告)号:US20250105159A1
公开(公告)日:2025-03-27
申请号:US18823171
申请日:2024-09-03
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Pyunghwa Han , Dahee Kim , Bongsoo Kim , Chobi Kim
IPC: H01L23/538 , H01L23/00 , H01L23/16 , H01L23/31 , H01L23/498 , H01L25/10
Abstract: A semiconductor package includes a first wiring structure, an extension structure disposed on the first wiring structure, including an extension base layer and a plurality of via structures, and having a mounting space passing through the extension base layer. The plurality of via structures include a plurality of via connection patterns, a semiconductor chip disposed in the mounting space and electrically connected to the first wiring structure, a filling insulating layer filling the mounting space, and a second wiring structure disposed on the extension structure and the filling insulating layer and electrically connected to the first wiring structure. Lowermost via connection patterns, among the plurality of via connection patterns, include a plurality of first lower connection pads, and the extension base layer includes base dams respectively passing through the plurality of first lower connection pads.
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公开(公告)号:US20240404936A1
公开(公告)日:2024-12-05
申请号:US18417921
申请日:2024-01-19
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Gyujin Choi , Dahee Kim , Jae-Ean Lee , Taehoon Lee
IPC: H01L23/498 , H01L23/00 , H01L23/48 , H01L23/528 , H01L25/065
Abstract: A stacked structure includes a lower substrate and a first semiconductor chip stacked on an upper surface of the lower substrate, the lower substrate includes a lower conductor pattern disposed on the upper surface of the lower substrate, the first semiconductor chip may have first and second surfaces facing each other, the second surface of the first semiconductor chip may face the upper surface of the lower substrate, and the first semiconductor chip may include a first conductor pattern disposed on the second surface. The first conductor pattern may be aligned with the lower conductor pattern in a first direction perpendicular to the upper surface of the lower substrate, and the first conductor pattern may be spaced apart from the lower conductor pattern in the first direction.
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公开(公告)号:US12051350B2
公开(公告)日:2024-07-30
申请号:US17988391
申请日:2022-11-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Moonsun Kim , Hyoungtak Cho , Dahee Kim , Sukdong Kim , Soohyun Seo , Wonkyu Sung , Yeonggyu Yoon , Changhan Lee , Hyunju Hong
CPC classification number: G09G3/035 , G06F1/1624 , G06F1/1652 , G09G2310/0267 , G09G2310/0275 , G09G2340/0442
Abstract: An electronic device is provided. The electronic device includes a display including a main area, a first sub area extending in a first direction, and a second sub area extending in a second direction perpendicular to the first direction, a display driver integrated circuit (IC) for scanning a scan signal and a data voltage to the display, and a processor operatively connected to the display and the display driver IC, wherein the processor is configured to control the display driver IC to supply the scan signal to at least some areas among the main area, the first sub area, and the second sub area of the display, to control the display driver IC to partially scan a data voltage to an area in which a screen is to be displayed among the main area, the first sub area, and the second sub area.
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公开(公告)号:US20250079382A1
公开(公告)日:2025-03-06
申请号:US18807488
申请日:2024-08-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jaeean Lee , Dongwon Kang , Dahee Kim , Changyeon Song , Sunguk Lee
IPC: H01L23/00 , H01L23/31 , H01L23/538
Abstract: Provided is a semiconductor package including a lower package substrate including lower insulating layers, a first semiconductor device mounted on the lower package substrate, a core layer on the lower package substrate to be laterally spaced apart from the first semiconductor device, an encapsulation material surrounding the first semiconductor device and covering an upper portion of the core layer, an upper package substrate disposed on the encapsulation material, the upper package substrate including a first upper redistribution layer and a second upper redistribution layer; wherein a first line width and a first line spacing of a first fine pattern of the first upper redistribution pattern are greater than or equal to a corresponding second line width and a corresponding second line spacing of a second fine pattern of the second upper redistribution pattern, respectively.
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公开(公告)号:US20240387486A1
公开(公告)日:2024-11-21
申请号:US18584905
申请日:2024-02-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dahee Kim , Hongwon Kim , Jae-Ean Lee , Taehoon Lee , Gyujin Choi
IPC: H01L25/16 , H01L23/00 , H01L23/31 , H01L23/48 , H01L23/498
Abstract: An example semiconductor package includes a substrate, a first semiconductor chip mounted on the substrate, a mold layer on the substrate to cover the first semiconductor chip, and outer terminals positioned below the substrate. The substrate includes a first interconnection layer, a second interconnection layer on the first interconnection layer, a passive device mounted on a bottom surface of the second interconnection layer, and a connection member at a side of the passive device and between the first interconnection layer and the second interconnection layer to connect the first interconnection layer to the second interconnection layer. The outer terminals are coupled to a bottom surface of the first interconnection layer, the passive device includes a first pad on a top surface of the passive device, and an interconnection pattern of the second interconnection layer contacts the first pad.
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公开(公告)号:US20240347487A1
公开(公告)日:2024-10-17
申请号:US18368640
申请日:2023-09-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jaeean Lee , Dahee Kim , Taehoon Lee , Gyujin Choi
IPC: H01L23/00 , H01L23/31 , H01L23/498
CPC classification number: H01L24/05 , H01L23/3128 , H01L23/49822 , H01L23/49833 , H01L24/06 , H01L24/08 , H01L23/49838 , H01L24/03 , H01L24/16 , H01L24/32 , H01L24/48 , H01L24/73 , H01L2224/03462 , H01L2224/05548 , H01L2224/05644 , H01L2224/05647 , H01L2224/05655 , H01L2224/0601 , H01L2224/08225 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/48225 , H01L2224/73265 , H01L2924/1815
Abstract: An upper redistribution wiring layer of a semiconductor package includes a protective layer provided on at least one upper insulating layer and having an opening that exposes at least a portion of an uppermost redistribution wiring among second redistribution wirings, and a bonding pad provided on the uppermost redistribution wiring through the opening. The bonding pad includes a first plating pattern formed on the uppermost redistribution wiring, the first plating pattern including a via pattern provided in the opening and a pad pattern formed on the via pattern to be exposed from the opening, a second plating pattern on the second plating pattern, and a third plating pattern on the second plating pattern.
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