Abstract:
A method and device for predicting errors in a computing system are disclosed. The error prediction method includes: receiving log data generated by the computing system during operation of the computing system; tokenizing the log data into tokens; inputting the tokens to a discriminator model which generates scores of the respective tokens, each score corresponding to a probability that the corresponding token is an anomaly token; determining an anomaly score based on the scores; and determining a likelihood of future occurrence of an error in the computing system based on the anomaly score.
Abstract:
The present invention relates to a composition for an organic optoelectronic element, an organic optoelectronic element and a display device, the composition including a first compound for an organic optoelectronic element, represented by a combination of Chemical Formula 1 and Chemical Formula 2; and a second compound for an organic optoelectronic element, represented by a combination of Chemical Formula 3 and Chemical Formula 4. In Chemical Formula 1 to Chemical Formula 4, each substituent is defined as that in the specification.
Abstract:
An electronic device comprises a substrate; a main coil mounted on the substrate; and at least one auxiliary coil disposed near the main coil and electromagnetically coupled to the main coil, wherein the main coil is configured to receive an electromagnetic field generated by the at least one auxiliary coil.
Abstract:
A clothes treating apparatus capable of improving filter cleaning efficiency by a cleaning nozzle. The clothes treating apparatus includes: a cabinet; a tub inside the cabinet, being in a shape of a cylinder, and including an air outlet formed in a circumference of the tub and a tub duct protruding outward from the tub and configured to guide air discharged through the air outlet, the tub duct having a duct opening formed in a side of the tub duct; a filter case to which a filter is installed to filter a foreign material included in air passing through the air outlet, the filter case coupled to the tub duct; and a cleaning nozzle including a nozzle inserted into the tub duct through the duct opening to be positioned inside the tub duct and configured to spray water toward the filter.
Abstract:
An electronic apparatus includes: a processor configured to implement at least one function of the electronic apparatus by executing a program stored in a memory; execute a self-test application provided for a self-test of an error in response to occurrence of the error related to the function, and identify a test routine for the error among one or more test routines; obtain a test result of the error by testing the function based on the identified test routine, and output information about the obtained test result to a display.
Abstract:
A semiconductor device includes standard cells disposed in a first direction parallel to an upper surface of a substrate and a second direction intersecting the first direction, each standard cell including an active region, a gate structure disposed to intersect the active region, source/drain regions on the active region at both sides of the gate structure, and first interconnection lines electrically connected to the active region and the gate structures; filler cells disposed between at least portions of the standard cells, each filler cell including a filler active region and a filler gate structure disposed to intersect the filler active region; and a routing structure disposed on the standard cells and the filler cells and including second interconnection lines electrically connecting the first interconnection lines of different standard cells to each other, wherein the second interconnection lines includes a first line having a first width and a second line having a second width larger than the first width.
Abstract:
An electronic device and a method control applications in the electronic device. The method of controlling applications in the electronic device includes: executing a plurality of applications in a foreground and a background; detecting the number of touch points input to a touch screen to select an application according to the detected number of the touch points; detecting a touch gesture for controlling the selected application; and controlling the selected application according to the detected touch gesture.
Abstract:
A washing machine having a drying function may include: a cabinet; a tub inside the cabinet and having an air outlet; a drying device configured to supply heated air into the tub to be discharged through the air outlet; a duct connecting the air outlet to the drying device to guide the heated air from the tub to the drying device; and a water feed pipe configured to supply water into an upper portion of the duct to cool the heated air so that moisture in the heated air condenses, wherein the duct includes a middle protrusion on a middle of an inner surface of a side of the duct to scatter water supplied into the duct and flowing along the inner surface; and a lower protrusion on the inner surface below the middle protrusion to scatter water flowing along the inner surface downward past the middle protrusion.
Abstract:
A magnetoresistive random access memory device includes a pinned layer; a tunnel barrier layer on the pinned layer; a free layer structure on the tunnel barrier layer, the free layer structure including a plurality of magnetic layers and a plurality of metal insertion layers between the magnetic layers; and an upper oxide layer on the free layer structure, wherein each of the metal insertion layers includes a non-magnetic metal material doped with a magnetic material, and the metal insertion layers are spaced apart from each other.
Abstract:
Disclosed is an operating method of an electronic device for manufacture of a semiconductor device. The method includes receiving, at the electronic device, a computer-aided design (CAD) image for a lithography process of the semiconductor device, and generating, at the electronic device, a first scanning electron microscope (SEM) image and a first segment (SEG) image from the CAD image by using a machine learning-based module, and the first SEG image includes information about a location of a defect.