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公开(公告)号:US20240170440A1
公开(公告)日:2024-05-23
申请号:US18373405
申请日:2023-09-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hwanyoung CHOI , Seokhyun LEE , Seokgeun AHN
IPC: H01L23/00 , H01L25/065
CPC classification number: H01L24/33 , H01L24/16 , H01L24/32 , H01L24/73 , H01L25/0657 , H01L2224/16148 , H01L2224/16225 , H01L2224/32059 , H01L2224/32145 , H01L2224/3303 , H01L2224/73204 , H01L2225/06513 , H01L2225/06541 , H01L2924/2064
Abstract: A semiconductor package includes first semiconductor chips electrically connected to each other through a through-via electrically connecting a first front surface pad and a first rear surface pad. A second semiconductor chip has a second lower surface including a second front surface pad, a second upper surface, a second side surface extending from the second upper surface, and a recess surface extending from the second lower surface to the second side surface. First adhesive films are on a first lower surface of first semiconductor chips and include first extension portions extending further outwardly than a first side surface of the first semiconductor chips. A second adhesive film is on the second lower surface and includes a second extension portion extending further outwardly than the second side surface. In a horizontal direction, a length of the second extension portion is less than a length of each of the first extension portions.
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公开(公告)号:US20240136341A1
公开(公告)日:2024-04-25
申请号:US18356682
申请日:2023-07-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seokgeun AHN , Daewoo KIM , Seokhyun LEE
CPC classification number: H01L25/105 , H01L23/3128 , H01L23/481 , H01L23/5383 , H01L24/08 , H01L25/50 , H01L2224/08225
Abstract: A semiconductor package, comprising: a first redistribution wiring layer including first and second surfaces opposite to each other, wherein the first redistribution wiring layer includes a first chip mounting region and a second chip mounting region adjacent to the first chip mounting region; a connection layer on the first surface of the first redistribution wiring layer; a first semiconductor chip on the first chip mounting region on the connection layer; a second semiconductor chip spaced apart from the first semiconductor chip on the second chip mounting region on the connection layer, wherein the second semiconductor chip includes through electrodes; a molding member on the first and second semiconductor chips on the connection layer; and a second redistribution wiring layer on the molding member, wherein the second redistribution wiring layer is electrically connected to the first redistribution wiring layer through the through electrodes.
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公开(公告)号:US20240234369A1
公开(公告)日:2024-07-11
申请号:US18617113
申请日:2024-03-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seokgeun AHN
IPC: H01L25/065 , H01L23/13 , H01L25/18
CPC classification number: H01L25/0652 , H01L23/13 , H01L25/18 , H01L2225/0651 , H01L2225/06517 , H01L2225/06558 , H01L2225/06562 , H01L2225/06586
Abstract: A semiconductor package is provided. The semiconductor package includes: a package substrate having a first surface, a second surface that is provided opposite the first surface and has a concave portion, and a through-hole having a side surface that is oblique with respect to the first surface, and a first diameter of a first opening of the through-hole defined through the first surface being less than a second diameter of a second opening of the through-hole defined through a bottom surface of the concave portion; a plurality of first semiconductor chips provided on the first surface; a second semiconductor chip provided on the bottom surface; and a molding portion provided in the through-hole, and covering the plurality of first semiconductor chips and the second semiconductor chip.
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公开(公告)号:US20220392870A1
公开(公告)日:2022-12-08
申请号:US17890835
申请日:2022-08-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seokgeun AHN
IPC: H01L25/065 , H01L25/18 , H01L23/13
Abstract: A semiconductor package is provided. The semiconductor package includes: a package substrate having a first surface, a second surface that is provided opposite the first surface and has a concave portion, and a through-hole having a side surface that is oblique with respect to the first surface, and a first diameter of a first opening of the through-hole defined through the first surface being less than a second diameter of a second opening of the through-hole defined through a bottom surface of the concave portion; a plurality of first semiconductor chips provided on the first surface; a second semiconductor chip provided on the bottom surface; and a molding portion provided in the through-hole, and covering the plurality of first semiconductor chips and the second semiconductor chip.
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