METHOD OF FABRICATING SEMICONDUCTOR DEVICE

    公开(公告)号:US20220149210A1

    公开(公告)日:2022-05-12

    申请号:US17584545

    申请日:2022-01-26

    Abstract: A semiconductor device includes a channel pattern including first and second semiconductor patterns stacked on a substrate, a gate electrode covering top and lateral surfaces of the channel pattern and extending in a first direction, and including a first gate segment between the first semiconductor pattern and the second semiconductor pattern, a gate spacer covering a lateral surface of the gate electrode and including an opening exposing the channel pattern, and a first source/drain pattern on a side of the gate spacer and in contact with the channel pattern through the opening, the first source/drain pattern including a sidewall center thickness at a height of the first gate segment and at a center of the opening, and a sidewall edge thickness at the height of the first gate segment and at an edge of the opening, the sidewall edge thickness being about 0.7 to 1 times the sidewall center thickness.

    ELECTRONIC APPARATUS AND CONTROLLING METHOD THEREOF

    公开(公告)号:US20210321166A1

    公开(公告)日:2021-10-14

    申请号:US17261364

    申请日:2019-07-11

    Abstract: An apparatus includes a display; a communicator; a processor; and a memory, the memory storing instructions to: obtain a plurality of images relevant to media content displayed on the display, which are stored for a period of time when an object identifying command requesting identification of an object contained in the media content is received. The command is received from a different electronic apparatus through the communicator. The processor obtains a candidate image containing the object being displayed, by identifying objects contained in the plurality of images, and transmits the candidate image to the different electronic apparatus via the communicator. The apparatus may use an AI data recognition model learned based on a rule-based model or machine learning, a neural network or a deep-learning algorithm. The rule-based model or the AI data recognition model may identify an object contained in an image by regarding the image as an input.

    SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

    公开(公告)号:US20200381564A1

    公开(公告)日:2020-12-03

    申请号:US16774653

    申请日:2020-01-28

    Abstract: A semiconductor device includes a channel pattern including first and second semiconductor patterns stacked on a substrate, a gate electrode covering top and lateral surfaces of the channel pattern and extending in a first direction, and including a first gate segment between the first semiconductor pattern and the second semiconductor pattern, a gate spacer covering a lateral surface of the gate electrode and including an opening exposing the channel pattern, and a first source/drain pattern on a side of the gate spacer and in contact with the channel pattern through the opening, the first source/drain pattern including a sidewall center thickness at a height of the first gate segment and at a center of the opening, and a sidewall edge thickness at the height of the first gate segment and at an edge of the opening, the sidewall edge thickness being about 0.7 to 1 times the sidewall center thickness.

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