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1.
公开(公告)号:US20240072008A1
公开(公告)日:2024-02-29
申请号:US18503513
申请日:2023-11-07
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Jinchang ZHOU , Yusheng LIN , Mingjiao LIU
IPC: H01L25/07 , H01L23/00 , H01L23/538 , H01L25/00 , H01L25/065 , H01L25/11 , H01L29/739 , H10N30/50
CPC classification number: H01L25/071 , H01L23/5384 , H01L23/5389 , H01L24/09 , H01L25/0652 , H01L25/0655 , H01L25/0657 , H01L25/072 , H01L25/074 , H01L25/117 , H01L25/50 , H01L29/7395 , H10N30/50 , H01L23/5385 , H01L2224/0401 , H01L2224/05085 , H01L2224/0603 , H01L2224/06181 , H01L2224/1403 , H01L2224/29139 , H01L2224/32225 , H01L2224/73204 , H01L2224/73253 , H01L2224/81815 , H01L2224/83815 , H01L2224/8384 , H01L2224/92242 , H01L2225/06503 , H01L2225/06517 , H01L2225/06527 , H01L2225/06572 , H01L2924/13055 , H01L2924/13091 , H01L2924/19105
Abstract: A semiconductor device has an interposer including a plurality of conductive vias formed through the interposer. A first semiconductor die is disposed over the interposer. A second semiconductor die is disposed over a first substrate. The first semiconductor die and second semiconductor die are power semiconductor devices. The interposer is disposed over the second semiconductor die opposite the first substrate. A second substrate is disposed over the first semiconductor die opposite the interposer. The first substrate and second substrate provide heat dissipation from the first semiconductor die and second semiconductor die from opposite sides of the semiconductor device. A plurality of first and second interconnect pads is formed in a pattern over the first semiconductor die and second semiconductor die. The second interconnect pads have a different area than the first interconnect pads to aid with alignment when stacking the assembly.
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2.
公开(公告)号:US20180240786A1
公开(公告)日:2018-08-23
申请号:US15954353
申请日:2018-04-16
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Jinchang ZHOU , Yusheng LIN , Mingjiao LIU
IPC: H01L25/07 , H01L23/367 , H01L23/538 , H01L23/00 , H01L25/065 , H01L25/11 , H01L25/00 , H01L29/739 , H01L41/083
CPC classification number: H01L25/071 , H01L23/5384 , H01L23/5385 , H01L23/5389 , H01L24/09 , H01L25/0652 , H01L25/0655 , H01L25/0657 , H01L25/072 , H01L25/074 , H01L25/117 , H01L25/50 , H01L29/7395 , H01L41/083 , H01L2224/0401 , H01L2224/05085 , H01L2224/0603 , H01L2224/06181 , H01L2224/1403 , H01L2224/29139 , H01L2224/32225 , H01L2224/73204 , H01L2224/73253 , H01L2224/81815 , H01L2224/83815 , H01L2224/8384 , H01L2224/92242 , H01L2225/06503 , H01L2225/06517 , H01L2225/06527 , H01L2225/06572 , H01L2924/13055 , H01L2924/13091 , H01L2924/19105
Abstract: A semiconductor device has an interposer including a plurality of conductive vias formed through the interposer. A first semiconductor die is disposed over the interposer. A second semiconductor die is disposed over a first substrate. The first semiconductor die and second semiconductor die are power semiconductor devices. The interposer is disposed over the second semiconductor die opposite the first substrate. A second substrate is disposed over the first semiconductor die opposite the interposer. The first substrate and second substrate provide heat dissipation from the first semiconductor die and second semiconductor die from opposite sides of the semiconductor device. A plurality of first and second interconnect pads is formed in a pattern over the first semiconductor die and second semiconductor die. The second interconnect pads have a different area than the first interconnect pads to aid with alignment when stacking the assembly.
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3.
公开(公告)号:US20240304603A1
公开(公告)日:2024-09-12
申请号:US18668408
申请日:2024-05-20
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Jinchang ZHOU , Yusheng LIN , Mingjiao LIU
IPC: H01L25/07 , H01L23/00 , H01L23/538 , H01L25/00 , H01L25/065 , H01L25/11 , H01L29/739 , H10N30/50
CPC classification number: H01L25/071 , H01L23/5384 , H01L23/5389 , H01L24/09 , H01L25/0652 , H01L25/0655 , H01L25/0657 , H01L25/072 , H01L25/074 , H01L25/117 , H01L25/50 , H01L29/7395 , H10N30/50 , H01L23/5385 , H01L2224/0401 , H01L2224/05085 , H01L2224/0603 , H01L2224/06181 , H01L2224/1403 , H01L2224/29139 , H01L2224/32225 , H01L2224/73204 , H01L2224/73253 , H01L2224/81815 , H01L2224/83815 , H01L2224/8384 , H01L2224/92242 , H01L2225/06503 , H01L2225/06517 , H01L2225/06527 , H01L2225/06572 , H01L2924/13055 , H01L2924/13091 , H01L2924/19105
Abstract: A semiconductor device has an interposer including a plurality of conductive vias formed through the interposer. A first semiconductor die is disposed over the interposer. A second semiconductor die is disposed over a first substrate. The first semiconductor die and second semiconductor die are power semiconductor devices. The interposer is disposed over the second semiconductor die opposite the first substrate. A second substrate is disposed over the first semiconductor die opposite the interposer. The first substrate and second substrate provide heat dissipation from the first semiconductor die and second semiconductor die from opposite sides of the semiconductor device. A plurality of first and second interconnect pads is formed in a pattern over the first semiconductor die and second semiconductor die. The second interconnect pads have a different area than the first interconnect pads to aid with alignment when stacking the assembly.
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4.
公开(公告)号:US20180233491A1
公开(公告)日:2018-08-16
申请号:US15954326
申请日:2018-04-16
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Jinchang ZHOU , Yusheng LIN , Mingjiao LIU
IPC: H01L25/07 , H01L23/367 , H01L23/538 , H01L23/00 , H01L25/065 , H01L25/11 , H01L25/00 , H01L29/739 , H01L41/083
CPC classification number: H01L25/071 , H01L23/5384 , H01L23/5385 , H01L23/5389 , H01L24/09 , H01L25/0652 , H01L25/0655 , H01L25/0657 , H01L25/072 , H01L25/074 , H01L25/117 , H01L25/50 , H01L29/7395 , H01L41/083 , H01L2224/0401 , H01L2224/05085 , H01L2224/0603 , H01L2224/06181 , H01L2224/1403 , H01L2224/29139 , H01L2224/32225 , H01L2224/73204 , H01L2224/73253 , H01L2224/81815 , H01L2224/83815 , H01L2224/8384 , H01L2224/92242 , H01L2225/06503 , H01L2225/06517 , H01L2225/06527 , H01L2225/06572 , H01L2924/13055 , H01L2924/13091 , H01L2924/19105
Abstract: A semiconductor device has an interposer including a plurality of conductive vias formed through the interposer. A first semiconductor die is disposed over the interposer. A second semiconductor die is disposed over a first substrate. The first semiconductor die and second semiconductor die are power semiconductor devices. The interposer is disposed over the second semiconductor die opposite the first substrate. A second substrate is disposed over the first semiconductor die opposite the interposer. The first substrate and second substrate provide heat dissipation from the first semiconductor die and second semiconductor die from opposite sides of the semiconductor device. A plurality of first and second interconnect pads is formed in a pattern over the first semiconductor die and second semiconductor die. The second interconnect pads have a different area than the first interconnect pads to aid with alignment when stacking the assembly.
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公开(公告)号:US20220293499A1
公开(公告)日:2022-09-15
申请号:US17804423
申请日:2022-05-27
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Jinchang ZHOU , Asif JAKWANI , Chee Hiong CHEW , Yusheng LIN , Sravan VANAPARTHY , Silnore Tejero SABANDO
IPC: H01L23/495 , H01L21/48 , H01L23/31
Abstract: Implementations of power modules may include: a substrate having a first side and a second side. The power module may include a plurality of leads coupled to a second side of the substrate and a molding compound over a portion of five or more surfaces of the substrate. The power module may also include an opening extending from a first side of the substrate to an outer edge of the molding compound. The opening may be configured to receive a coupling device and the coupling device may be configured to couple with a heat sink or a package support.
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公开(公告)号:US20200098671A1
公开(公告)日:2020-03-26
申请号:US16556541
申请日:2019-08-30
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Jinchang ZHOU , Asif JAKWANI , Chee Hiong CHEW , Yusheng LIN , Sravan VANAPARTHY , Silnore Tejero SABANDO
IPC: H01L23/495 , H01L23/31 , H01L21/48
Abstract: Implementations of power modules may include: a substrate having a first side and a second side. The power module may include a plurality of leads coupled to a second side of the substrate and a molding compound over a portion of five or more surfaces of the substrate. The power module may also include an opening extending from a first side of the substrate to an outer edge of the molding compound. The opening may be configured to receive a coupling device and the coupling device may be configured to couple with a heat sink or a package support.
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7.
公开(公告)号:US20180040593A1
公开(公告)日:2018-02-08
申请号:US15231277
申请日:2016-08-08
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Jinchang ZHOU , Yusheng LIN , Mingjiao LIU
IPC: H01L25/07 , H01L23/00 , H01L23/367 , H01L23/538 , H01L29/739 , H01L25/00
CPC classification number: H01L25/071 , H01L23/3675 , H01L23/5384 , H01L23/5385 , H01L23/5389 , H01L24/09 , H01L25/0652 , H01L25/0655 , H01L25/0657 , H01L25/072 , H01L25/074 , H01L25/117 , H01L25/50 , H01L29/7395 , H01L41/083 , H01L2224/0401 , H01L2224/05085 , H01L2224/0603 , H01L2224/06181 , H01L2224/1403 , H01L2224/29139 , H01L2224/32225 , H01L2224/73204 , H01L2224/73253 , H01L2224/81815 , H01L2224/83815 , H01L2224/8384 , H01L2224/92242 , H01L2225/06503 , H01L2225/06517 , H01L2225/06527 , H01L2225/06572 , H01L2924/13055 , H01L2924/13091 , H01L2924/19105
Abstract: A semiconductor device has an interposer including a plurality of conductive vias formed through the interposer. A first semiconductor die is disposed over the interposer. A second semiconductor die is disposed over a first substrate. The first semiconductor die and second semiconductor die are power semiconductor devices. The interposer is disposed over the second semiconductor die opposite the first substrate. A second substrate is disposed over the first semiconductor die opposite the interposer. The first substrate and second substrate provide heat dissipation from the first semiconductor die and second semiconductor die from opposite sides of the semiconductor device. A plurality of first and second interconnect pads is formed in a pattern over the first semiconductor die and second semiconductor die. The second interconnect pads have a different area than the first interconnect pads to aid with alignment when stacking the assembly.
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