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1.
公开(公告)号:US20140261566A1
公开(公告)日:2014-09-18
申请号:US14212899
申请日:2014-03-14
Applicant: SHIBAURA MECHATRONICS CORPORATION
Inventor: Konosuke HAYASHI , Masaaki FURUYA , Takashi OOTAGAKI , Yuji NAGASHIMA , Atsushi KINASE , Masahiro ABE
IPC: B08B3/10
CPC classification number: B08B3/10 , H01L21/67028 , H01L21/67034
Abstract: A substrate processing device 10 includes a suction drying unit 65 drying a surface of a substrate W by absorbing and removing a liquid droplet of volatile solvent formed on the surface of the substrate W by a heating operation of a heating unit 64.
Abstract translation: 基板处理装置10包括吸引干燥单元65,其通过加热单元64的加热操作吸收和去除形成在基板W的表面上的挥发性溶剂的液滴来干燥基板W的表面。
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公开(公告)号:US20200025643A1
公开(公告)日:2020-01-23
申请号:US16587737
申请日:2019-09-30
Applicant: SHIBAURA MECHATRONICS CORPORATION
Inventor: Masataka YOKOI , Nobuo KOBAYASHI , Masaaki FURUYA , Atsushi KINASE
Abstract: According to one of embodiments, a gas leak detecting device of a heater pipe and a gas leak detecting method of a heater pipe which are able to reliably detect a leak of gas from a heater pipe in which a fine hole is formed are provided. There is provided a gas leak detecting device of a heater pipe 10 which is provided with an inside pipe 10a housing a heater element and an outside pipe 10b sealed surrounding this inside pipe and which is adjusted through piping 30 by a pressure adjustment mechanism 20 in gas pressure in a space between the outside pipe 10b and the inside pipe 10a to a predetermined pressure value, comprising a gas flow resistance part 21 (213) provided at the piping 30 and locally resistant to flow of gas, a pressure detection unit 23 detecting gas pressure of a space between the outside pipe 10b and the inside pipe 10a between the gas flow resistance part 21 and the heater pipe 10 in the piping 30, and a leak judging means 50 for judging whether gas is leaking from the heater pipe 10 based on a detected pressure value obtained by the pressure detection unit 23.
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3.
公开(公告)号:US20140261554A1
公开(公告)日:2014-09-18
申请号:US14212382
申请日:2014-03-14
Applicant: SHIBAURA MECHATRONICS CORPORATION
Inventor: Konosuke HAYASHI , Masaaki FURUYA , Takashi OOTAGAKI , Yuji NAGASHIMA , Atsushi KINASE , Masahiro ABE
IPC: H01L21/67
CPC classification number: H01L21/6704 , H01L21/67028 , H01L21/67034 , H01L21/67115
Abstract: In a substrate processing device 10 having a heating and drying unit 103 for drying a surface of a substrate W, the heating and drying unit 103 heats upward a vertically downward surface of the substrate W to dry the surface of the substrate by dropping and removing, by gravity, the droplets of the volatile solvent formed on the surface of the substrate W by the heating operation.
Abstract translation: 在具有用于干燥基板W的表面的加热和干燥单元103的基板处理装置10中,加热和干燥单元103向上加热基板W的垂直向下的表面,以通过掉落和去除来干燥基板的表面, 通过重力,通过加热操作形成在基板W的表面上的挥发性溶剂的液滴。
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4.
公开(公告)号:US20140261549A1
公开(公告)日:2014-09-18
申请号:US14212218
申请日:2014-03-14
Applicant: SHIBAURA MECHATRONICS CORPORATION
Inventor: Konosuke HAYASHI , Masaaki FURUYA , Takashi OOTAGAKI , Yuji NAGASHIMA , Atsushi KINASE , Masahiro ABE
IPC: H01L21/67
CPC classification number: H01L21/67051 , H01L21/67028 , H01L21/67034 , H01L21/6776
Abstract: A substrate processing device 100 includes a cleaning liquid supply unit 114 supplying a cleaning liquid to a surface of a substrate W, a solvent supply unit 115 supplying a volatile solvent to the surface of the substrate W supplied with the cleaning liquid to replace the cleaning liquid on the surface of the substrate W with the volatile solvent, a heating unit 117 heating the substrate W supplied with the volatile solvent, and a drying unit 118 drying the surface of the substrate W by removing a droplet of the volatile solvent produced on the surface of the substrate W by a heating operation of the heating unit 117, and the heating unit 117 and the drying unit 118 are arranged in a course of transportation of the substrate W transported from the solvent supply unit 115.
Abstract translation: 基板处理装置100包括向基板W的表面供给清洗液的清洗液供给部114,向供给清洗液的基板W的表面供给挥发性溶剂的溶剂供给部115,以更换清洗液 在具有挥发性溶剂的基板W的表面上,加热单元117,加热供给挥发性溶剂的基板W,以及干燥单元118,通过除去表面上产生的挥发性溶剂的液滴来干燥基板W的表面 通过加热单元117的加热操作,加热单元117和干燥单元118在从溶剂供应单元115输送的基板W的输送过程中布置。
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