Electronic device
    2.
    发明授权

    公开(公告)号:US10861503B1

    公开(公告)日:2020-12-08

    申请号:US16698802

    申请日:2019-11-27

    Applicant: SK hynix Inc.

    Abstract: A semiconductor memory includes: a first line; a second line; a third line; a first memory cell disposed between the first line and the second line at an intersection region of the first line and the second line, the first memory cell including a first selection element layer and a first electrode coupled to the first selection element layer; and a second memory cell disposed between the second line and the third line at an intersection region of the second line and third second line, the second memory cell including a second selection element layer and a second electrode coupled to the second selection element layer. A threshold voltage of the first selection element layer is greater than a threshold voltage of the second selection element layer, and a resistance of the second electrode is greater than a resistance of the first electrode.

    Comparison device and CMOS image sensor including the same

    公开(公告)号:US10757356B2

    公开(公告)日:2020-08-25

    申请号:US16219246

    申请日:2018-12-13

    Applicant: SK hynix Inc.

    Abstract: Provided are a comparison device that may minimize an influence of banding noise by offsetting the banding noise, and a CMOS image sensor including the comparison device. The comparison device may include a comparison circuit configured to compare a pixel signal and a ramp signal with each other and output a comparison signal, a banding noise adjustment circuit coupled to the comparison circuit to adjust electrical characteristic values of the comparison circuit, a banding value generation circuit coupled to the banding noise adjustment circuit to provide the banding noise adjustment circuit with a banding value generated based on a setting code value, and a banding noise reduction circuit coupled to the banding noise adjustment circuit and configured to reduce the banding noise of the comparison circuit by adjusting electrical characteristic values of the comparison circuit.

    Power voltage selection device
    8.
    发明授权
    Power voltage selection device 有权
    电源电压选择装置

    公开(公告)号:US09225175B2

    公开(公告)日:2015-12-29

    申请号:US13716458

    申请日:2012-12-17

    Applicant: SK hynix Inc.

    Inventor: Tae-Hoon Kim

    CPC classification number: H02J4/00 G06F1/263 H01L27/088 H03K17/693 Y10T307/658

    Abstract: A power voltage selection device includes a first power voltage and a second power voltage; a power selection unit having a first PMOS transistor and a second PMOS transistor, wherein the first power voltage is supplied to a source of the first PMOS transistor, a gate of the first PMOS transistor receives a first enable signal, the second power voltage is supplied to a source of the second PMOS transistor, a gate of the second PMOS transistor receives a second enable signal, and a body of the first PMOS transistor is coupled to a body of the second PMOS transistor; an output unit having a common node to which a drain of the first PMOS transistor and a drain of the second PMOS transistor are commonly coupled; and a body voltage control unit controlling to supply one of the first power voltage and the second power voltage to the bodies of the first PMOS transistor and the second PMOS transistor, wherein the one has a higher voltage level than the other.

    Abstract translation: 电源电压选择装置包括第一电源电压和第二电源电压; 具有第一PMOS晶体管和第二PMOS晶体管的功率选择单元,其中所述第一电源电压被提供给所述第一PMOS晶体管的源极,所述第一PMOS晶体管的栅极接收第一使能信号,提供所述第二电源电压 到第二PMOS晶体管的源极,第二PMOS晶体管的栅极接收第二使能信号,并且第一PMOS晶体管的主体耦合到第二PMOS晶体管的主体; 输出单元,具有公共节点,第一PMOS晶体管的漏极和第二PMOS晶体管的漏极共同耦合到该公共节点; 以及体电压控制单元,其控制将所述第一电源电压和所述第二电力电压中的一个提供给所述第一PMOS晶体管和所述第二PMOS晶体管的主体,其中所述第一电源电压和所述第二电源电压具有比另一个更高的电压电平。

    Memory systems and operating method thereof

    公开(公告)号:US10417082B2

    公开(公告)日:2019-09-17

    申请号:US15826857

    申请日:2017-11-30

    Applicant: SK hynix Inc.

    Inventor: Tae-Hoon Kim

    Abstract: A memory system comprising: a memory device including a plurality of memory dies each having a plurality of the memory blocks; and a controller suitable for performing a command operation to the memory dies, wherein the memory device comprises means for performing an error check operation to a first data provided from the controller to store the first data the memory device.

Patent Agency Ranking