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公开(公告)号：US20150357983A1
公开(公告)日：2015-12-10
申请号：US14296914
申请日：2014-06-05
Applicant: STMICROELECTRONICS, INC.
Inventor： Davy Choi
CPC classification number: H03G3/02 , H03F1/0205 , H03F1/26 , H03F3/3022 , H03F3/393 , H03F3/45 , H03F3/45094 , H03F3/45179 , H03F3/45475 , H03F2200/261 , H03F2203/45116 , H03F2203/45138 , H03F2203/45336 , H03G1/0035 , H03G1/02 , H03G3/3036 , H03M1/18
Abstract: An instrumentation amplifier includes first and second resistors for gain setting. The operational amplifiers within the instrumentation amplifier include selectively enabled current drive sources coupled to the amplifier output. The first and second resistors have variable resistances. A control circuit is configured to select the variable resistances of the first and second resistors to implement a fixed gain for the instrumentation amplifier and further selectively enable the current drive sources. The control circuit receives an indication of a downstream programmable gain (for example, from a downstream programmable gain amplifier). The variable resistances of the first and second resistors are selected to be scaled inversely with respect to the downstream programmable gain and the current drive sources are enabled proportionately with respect to the downstream programmable gain.
Abstract translation: 仪表放大器包括用于增益设定的第一和第二电阻器。 仪表放大器内的运算放大器包括耦合到放大器输出的有选择地使能的电流驱动源。 第一和第二电阻具有可变电阻。 控制电路被配置为选择第一和第二电阻器的可变电阻以实现仪器放大器的固定增益，并且进一步选择性地启用当前的驱动源。 控制电路接收下游可编程增益的指示（例如，从下游可编程增益放大器）。 第一和第二电阻器的可变电阻被选择为相对于下游可编程增益反相缩放，并且当前驱动源相对于下游可编程增益成比例地启用。
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公开(公告)号：US20210405085A1
公开(公告)日：2021-12-30
申请号：US17472126
申请日：2021-09-10
Applicant: STMicroelectronics, Inc.
Inventor： Davy Choi , Yamu Hu , Deyou Fang
IPC: G01P21/00 , G01P15/125 , G01R19/10 , G01R31/28
Abstract: In one embodiment, a method for detecting functional state of a microelectromechanical (MEMS) sensor is described. The method includes monitoring an input common-mode feedback (ICMFB) voltage generated by an ICMFB circuit coupled to the MEMS sensor through a plurality of nodes. The method also includes determining, using the monitored ICMFB voltage, whether all of the plurality of nodes of the MEMS sensor are electrically connected to the ICMFB circuit.
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公开(公告)号：US20180335446A1
公开(公告)日：2018-11-22
申请号：US15599234
申请日：2017-05-18
Applicant: STMicroelectronics, Inc.
Inventor： Davy Choi , Yamu Hu , Deyou Fang
IPC: G01P21/00 , G01P15/125 , G01R19/10 , G01R27/26 , G01R19/165
Abstract: In one embodiment, a method for detecting functional state of a microelectromechanical (MEMS) sensor is described. The method includes monitoring an input common-mode feedback (ICMFB) voltage generated by an ICMFB circuit coupled to the MEMS sensor through a plurality of nodes. The method also includes determining, using the monitored ICMFB voltage, whether all of the plurality of nodes of the MEMS sensor are electrically connected to the ICMFB circuit.
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Patent Agency Ranking
公开(公告)号：US11143670B2
公开(公告)日：2021-10-12
申请号：US15599234
申请日：2017-05-18
Applicant: STMicroelectronics, Inc.
Inventor： Davy Choi , Yamu Hu , Deyou Fang
IPC: G01P21/00 , G01P15/125 , G01R19/10 , G01R31/28
Abstract: In one embodiment, a method for detecting functional state of a microelectromechanical (MEMS) sensor is described. The method includes monitoring an input common-mode feedback (ICMFB) voltage generated by an ICMFB circuit coupled to the MEMS sensor through a plurality of nodes. The method also includes determining, using the monitored ICMFB voltage, whether all of the plurality of nodes of the MEMS sensor are electrically connected to the ICMFB circuit.
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公开(公告)号：US12092653B2
公开(公告)日：2024-09-17
申请号：US17472126
申请日：2021-09-10
Applicant: STMicroelectronics, Inc.
Inventor： Davy Choi , Yamu Hu , Deyou Fang
IPC: G01P21/00 , G01P15/125 , G01R19/10 , G01R31/28
CPC classification number: G01P21/00 , G01P15/125 , G01R19/10 , G01R31/2829
Abstract: In one embodiment, a method for detecting functional state of a microelectromechanical (MEMS) sensor is described. The method includes monitoring an input common-mode feedback (ICMFB) voltage generated by an ICMFB circuit coupled to the MEMS sensor through a plurality of nodes. The method also includes determining, using the monitored ICMFB voltage, whether all of the plurality of nodes of the MEMS sensor are electrically connected to the ICMFB circuit.
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公开(公告)号：US09755597B2
公开(公告)日：2017-09-05
申请号：US14971359
申请日：2015-12-16
Applicant: STMicroelectronics, Inc.
Inventor： Davy Choi
IPC: H03F3/45 , H03G3/02 , H03G1/00 , H03F1/02 , H03F1/26 , H03F3/30 , H03F3/393 , H03G1/02 , H03G3/30 , H03M1/18
CPC classification number: H03G3/02 , H03F1/0205 , H03F1/26 , H03F3/3022 , H03F3/393 , H03F3/45 , H03F3/45094 , H03F3/45179 , H03F3/45475 , H03F2200/261 , H03F2203/45116 , H03F2203/45138 , H03F2203/45336 , H03G1/0035 , H03G1/02 , H03G3/3036 , H03M1/18
Abstract: An instrumentation amplifier includes first and second resistors for gain setting. The operational amplifiers within the instrumentation amplifier include selectively enabled current drive sources coupled to the amplifier output. The first and second resistors have variable resistances. A control circuit is configured to select the variable resistances of the first and second resistors to implement a fixed gain for the instrumentation amplifier and further selectively enable the current drive sources. The control circuit receives an indication of a downstream programmable gain (for example, from a downstream programmable gain amplifier). The variable resistances of the first and second resistors are selected to be scaled inversely with respect to the downstream programmable gain and the current drive sources are enabled proportionately with respect to the downstream programmable gain.
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公开(公告)号：US20160099696A1
公开(公告)日：2016-04-07
申请号：US14971359
申请日：2015-12-16
Applicant: STMicroelectronics, Inc.
Inventor： Davy Choi
CPC classification number: H03G3/02 , H03F1/0205 , H03F1/26 , H03F3/3022 , H03F3/393 , H03F3/45 , H03F3/45094 , H03F3/45179 , H03F3/45475 , H03F2200/261 , H03F2203/45116 , H03F2203/45138 , H03F2203/45336 , H03G1/0035 , H03G1/02 , H03G3/3036 , H03M1/18
Abstract: An instrumentation amplifier includes first and second resistors for gain setting. The operational amplifiers within the instrumentation amplifier include selectively enabled current drive sources coupled to the amplifier output. The first and second resistors have variable resistances. A control circuit is configured to select the variable resistances of the first and second resistors to implement a fixed gain for the instrumentation amplifier and further selectively enable the current drive sources. The control circuit receives an indication of a downstream programmable gain (for example, from a downstream programmable gain amplifier). The variable resistances of the first and second resistors are selected to be scaled inversely with respect to the downstream programmable gain and the current drive sources are enabled proportionately with respect to the downstream programmable gain.
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公开(公告)号：US09246458B2
公开(公告)日：2016-01-26
申请号：US14296914
申请日：2014-06-05
Applicant: STMicroelectronics, Inc.
Inventor： Davy Choi
CPC classification number: H03G3/02 , H03F1/0205 , H03F1/26 , H03F3/3022 , H03F3/393 , H03F3/45 , H03F3/45094 , H03F3/45179 , H03F3/45475 , H03F2200/261 , H03F2203/45116 , H03F2203/45138 , H03F2203/45336 , H03G1/0035 , H03G1/02 , H03G3/3036 , H03M1/18
Abstract: An instrumentation amplifier includes first and second resistors for gain setting. The operational amplifiers within the instrumentation amplifier include selectively enabled current drive sources coupled to the amplifier output. The first and second resistors have variable resistances. A control circuit is configured to select the variable resistances of the first and second resistors to implement a fixed gain for the instrumentation amplifier and further selectively enable the current drive sources. The control circuit receives an indication of a downstream programmable gain (for example, from a downstream programmable gain amplifier). The variable resistances of the first and second resistors are selected to be scaled inversely with respect to the downstream programmable gain and the current drive sources are enabled proportionately with respect to the downstream programmable gain.
Abstract translation: 仪表放大器包括用于增益设定的第一和第二电阻器。 仪表放大器内的运算放大器包括耦合到放大器输出的有选择地使能的电流驱动源。 第一和第二电阻具有可变电阻。 控制电路被配置为选择第一和第二电阻器的可变电阻以实现仪器放大器的固定增益，并且进一步选择性地启用当前的驱动源。 控制电路接收下游可编程增益的指示（例如，从下游可编程增益放大器）。 第一和第二电阻器的可变电阻被选择为相对于下游可编程增益反相缩放，并且当前驱动源相对于下游可编程增益成比例地启用。
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