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公开(公告)号：US20240347596A1
公开(公告)日：2024-10-17
申请号：US18512322
申请日：2023-11-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Junmo PARK , Deokhwan Kim , Junsu Kong , Yeonho Park , Hyungjin Park , Sujin Lee , Jinseok Lee
IPC: H01L29/06 , H01L27/092 , H01L29/417 , H01L29/423 , H01L29/775 , H01L29/786
CPC classification number: H01L29/0673 , H01L27/092 , H01L29/0649 , H01L29/41733 , H01L29/42392 , H01L29/775 , H01L29/78696
Abstract: A semiconductor device including a substrate having an active pattern, first and second semiconductor patterns provided on the active pattern vertically spaced apart from each other, a source/drain pattern connected to the first and second semiconductor patterns, a gate electrode between the first and second semiconductor patterns, and a gate insulating pattern enclosing the gate electrode, wherein the gate insulating pattern includes, a high-k dielectric pattern enclosing the gate electrode, an inner spacer between the high-k dielectric pattern and the source/drain pattern, and a mask insulating pattern having an etch selectivity with respect to the inner spacer between the high-k dielectric pattern and the inner spacer.
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公开(公告)号：US12266058B2
公开(公告)日：2025-04-01
申请号：US17897608
申请日：2022-08-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jinseon Yoo , Sujin Lee , Minkyu Jung , Jongwoo Jung
Abstract: An electronic device according to various embodiments may include: a frame, a window supported by the frame, a display configured to output visual information to the window, a camera disposed in the frame configured to photograph a front of the frame, a communication module comprising communication circuitry, a memory, and a processor. The memory may store instructions that, when executed, cause the processor to: establish a communication connection with an external device through the communication module, acquire display attribute information of at least one first display connected to the external device, and display at least one virtual object having a same display attribute as the at least one first display in at least a portion of an area corresponding to a field of view of a user wearing the electronic device, based on the acquired display attribute information. The display attribute information may include at least one of a magnification, a resolution, a display orientation, or a use or not of multiple displays, of the first display.
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公开(公告)号：US11276366B2
公开(公告)日：2022-03-15
申请号：US17256801
申请日：2019-07-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Hyunseok Kim , Junghyuk Kim , Daegun Kim , Sujin Lee
Abstract: Disclosed is each display apparatus interconnected in series based on a DisplayPort standard. Each of the display apparatus includes a processor configured to request a front-stage display apparatus to confirm whether a first image signal is normally transmitted during an operation for displaying an image based on the first image signal of a first source device received from the front-stage display apparatus, control to display the image based on the first image signal received from the front-stage display apparatus in response to receiving a confirmation signal confirming whether the first image signal is normally transmitted from the front-stage display apparatus, and control to receive a second image signal of a second source device from a rear-stage display apparatus in response to not receiving the confirmation signal from the front-stage display apparatus.
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Patent Agency Ranking
公开(公告)号：US20210396510A1
公开(公告)日：2021-12-23
申请号：US17156049
申请日：2021-01-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kwangsoo Kim , Sungyoon Ryu , Daejun Park , Seong Yun , Seungryeol Oh , Sujin Lee , Jaeyong Lee , Minho Rim , Chungsam Jun , Myungjun Lee
Abstract: Provided is a through-focus image-based metrology device including an optical device, and a computing device configured to acquire at least one through-focus image of a target from the optical device, generate an intensity profile based on the acquired at least one through-focus image, and perform metrology on the target based on the generated intensity profile, wherein the optical device includes a stage on which the target is disposed, the stage being configured to move by one step in at least one direction based on control of the computing device, and to acquire the at least one through-focus image, an image sensor disposed on the stage, an objective lens disposed between the image sensor and the stage, the objective lens being configured to transmit reflected light from the target, and a light source configured to emit illumination light to the target through the objective lens.
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公开(公告)号：US11988495B2
公开(公告)日：2024-05-21
申请号：US17156049
申请日：2021-01-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kwangsoo Kim , Sungyoon Ryu , Daejun Park , Seong Yun , Seungryeol Oh , Sujin Lee , Jaeyong Lee , Minho Rim , Chungsam Jun , Myungjun Lee
CPC classification number: G01B11/02 , G01N21/8806 , G01N21/8851 , G03F7/70625 , G03F7/7065 , G01B2210/56 , G01N2021/8887
Abstract: Provided is a through-focus image-based metrology device including an optical device, and a computing device configured to acquire at least one through-focus image of a target from the optical device, generate an intensity profile based on the acquired at least one through-focus image, and perform metrology on the target based on the generated intensity profile, wherein the optical device includes a stage on which the target is disposed, the stage being configured to move by one step in at least one direction based on control of the computing device, and to acquire the at least one through-focus image, an image sensor disposed on the stage, an objective lens disposed between the image sensor and the stage, the objective lens being configured to transmit reflected light from the target, and a light source configured to emit illumination light to the target through the objective lens.
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公开(公告)号：US11792515B2
公开(公告)日：2023-10-17
申请号：US17589100
申请日：2022-01-31
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sujin Lee , Eunhee Kang , Kinam Kwon , Hyong Euk Lee
CPC classification number: H04N23/683 , H04N23/50
Abstract: An image acquisition apparatus includes a display layer including hole regions through which external light is received and pixel regions arranged between the hole regions, an image sensor disposed under the display layer and configured to generate a raw image by sensing the external light received through the hole regions, and a processor configured to perform image processing on the raw image based on blur information based on an arrangement of the hole regions.
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公开(公告)号：US11568519B2
公开(公告)日：2023-01-31
申请号：US17196084
申请日：2021-03-09
Applicant: Samsung Electronics Co., Ltd.
Inventor： Eunhee Kang , Kinam Kwon , Sujin Lee , Hyong Euk Lee , Byung In Yoo , Sangwon Lee , Jae Seok Choi
IPC: G06T5/00
Abstract: An image enhancement method, an image enhancement apparatus, and a method and apparatus for training the image enhancement apparatus are provided. The image enhancement apparatus may enhance a quality of a raw image captured by an under-display camera (UDC). The image enhancement apparatus may process the raw image for each channel according to characteristics of a photographing environment of the UDC. The image enhancement apparatus may further enhance the image by processing the raw image to reflect characteristics for each channel.
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公开(公告)号：US11272106B1
公开(公告)日：2022-03-08
申请号：US17230000
申请日：2021-04-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sujin Lee , Eunhee Kang , Kinam Kwon , Hyong Euk Lee
Abstract: An image acquisition apparatus includes a display layer including hole regions through which external light is received and pixel regions arranged between the hole regions, an image sensor disposed under the display layer and configured to generate a raw image by sensing the external light received through the hole regions, and a processor configured to perform image processing on the raw image based on blur information based on an arrangement of the hole regions.
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