公开(公告)号：US20190181848A1

公开(公告)日：2019-06-13

申请号：US16204520

申请日：2018-11-29

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang-Kyeom KIM ,  Won-Joo Yun ,  SukYong Kang ,  Ho-Jun Chang

IPC: H03K5/156 ,  H03L7/081 ,  H03L7/089 ,  G11C7/22

Abstract: A delay locked loop circuit includes a duty detector configured to detect a duty cycle of a clock signal, and to determine whether to perform a coarse duty cycle correction based on the detected duty, and a delay locked loop core. The delay locked loop core is configured to selectively perform the coarse duty cycle correction for the clock signal according to the determination of the duty detector, perform a coarse lock for the clock signal during a first time period different from a second time period in which the coarse duty cycle correction is performed, and perform a fine duty cycle correction and a fine lock for the clock signal.

公开(公告)号：US10680593B2

公开(公告)日：2020-06-09

申请号：US16204520

申请日：2018-11-29

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang-Kyeom Kim ,  Won-Joo Yun ,  SukYong Kang ,  Ho-Jun Chang

IPC: H03L7/06 ,  G06F1/04 ,  G11C7/22 ,  H03K5/04 ,  H03K5/156 ,  H03L7/08 ,  H03L7/081 ,  H03L7/089 ,  G11C29/02

Abstract: A delay locked loop circuit includes a duty detector configured to detect a duty cycle of a clock signal, and to determine whether to perform a coarse duty cycle correction based on the detected duty, and a delay locked loop core. The delay locked loop core is configured to selectively perform the coarse duty cycle correction for the clock signal according to the determination of the duty detector, perform a coarse lock for the clock signal during a first time period different from a second time period in which the coarse duty cycle correction is performed, and perform a fine duty cycle correction and a fine lock for the clock signal.

公开(公告)号：US10678688B2

公开(公告)日：2020-06-09

申请号：US16206247

申请日：2018-11-30

Applicant: Samsung Electronics Co., Ltd.

Inventor： SukYong Kang ,  Han-Gi Jung

IPC: G06F13/28 ,  G06F12/0802 ,  G06F13/16

Abstract: A semiconductor device includes a decoder configured to receive an extended mode register set (EMRS) code including specific information, and decode the received EMRS code to acquire the specific information; a peripheral controller configured to generate a control signal based on the specific information; and a peripheral region including a plurality of buffers, the plurality of buffers being configured to be controlled by the control signal, wherein the specific information includes information indicating an expected bandwidth of input data that is to be input to one of the plurality of buffers.

公开(公告)号：US09590628B2

公开(公告)日：2017-03-07

申请号：US14976716

申请日：2015-12-21

Applicant: Samsung Electronics Co., Ltd.

Inventor： SukYong Kang ,  Hun-Dae Choi

IPC: G11C7/22 ,  G11C7/10 ,  G11C7/06 ,  G11C11/4076 ,  G11C11/406 ,  H03K19/0175 ,  G11C5/14 ,  G11C7/14 ,  G11C29/02 ,  G11C7/12

CPC classification number: H03K19/017509 ,  G11C5/147 ,  G11C7/062 ,  G11C7/1084 ,  G11C7/12 ,  G11C7/14 ,  G11C7/22 ,  G11C7/222 ,  G11C29/028 ,  G11C2207/2254

Abstract: Provided are a reference voltage training device and a method thereof. The reference voltage training device includes a comparator configured to compare a toggle signal with a reference voltage and output a comparison signal, a duty cycle detector configured to check a duty ratio of the comparison signal, and a reference voltage level changing unit configured to fix the reference voltage when the duty ratio meets a predetermined condition and to change a level of the reference voltage when the duty ratio does not meet the predetermined condition. The comparator outputs a changed comparison signal using the changed reference voltage.

Abstract translation: 提供了一种参考电压训练装置及其方法。 参考电压训练装置包括：比较器，被配置为将触发信号与参考电压进行比较并输出比较信号;配置为检查比较信号的占空比的占空比检测器;以及参考电压电平改变单元， 当占空比满足预定条件时的参考电压，并且当占空比不满足预定条件时改变参考电压的电平。 比较器使用改变的参考电压输出改变的比较信号。

公开(公告)号：US09509309B2

公开(公告)日：2016-11-29

申请号：US14972453

申请日：2015-12-17

Applicant: Samsung Electronics Co., Ltd.

Inventor： SukYong Kang ,  Han-Gi Jung

IPC: H03K17/16 ,  H03K19/003 ,  H03K19/0175

CPC classification number: H03K19/017545

Abstract: A semiconductor device may include a termination resistor circuit including a first termination resistor connected to a power voltage and a second termination resistor between the first termination resistor and a ground, a value of the first termination resistor and the second termination resistor changes based on a feedback signal; a mismatch detector may generate a compared result based on a potential difference between a voltage of a center node, between the first and second termination resistors, and a reference voltage; a code generator may generate the feedback signal based on the compared result, and generate a feedback code based on the compared result; a code register may generate a mismatch code controlling a mismatch between the first and second termination resistors based on the feedback code; and a corrector may compensate for the mismatch between the first and second termination resistors based on the mismatch code.

Abstract translation: 半导体器件可以包括终端电阻器电路，其包括连接到第一终端电阻器和地之间的电源电压的第一终端电阻和第二终端电阻器，第一终端电阻器和第二终端电阻器的值基于反馈 信号; 不匹配检测器可以基于第一和第二终端电阻器之间的中心节点的电压与参考电压之间的电位差产生比较结果; 代码生成器可以基于比较结果生成反馈信号，并且基于比较结果生成反馈代码; 代码寄存器可以基于反馈代码产生控制第一和第二终端电阻之间的不匹配的失配代码; 并且校正器可以基于不匹配代码补偿第一和第二终端电阻器之间的不匹配。