Semiconductor device including capacitor

    公开(公告)号:US10090377B2

    公开(公告)日:2018-10-02

    申请号:US15424951

    申请日:2017-02-06

    IPC分类号: H01L49/02

    摘要: A semiconductor device comprises a capacitor that includes a first electrode, a second electrode, and a dielectric layer between the first electrode and the second electrode. The dielectric layer comprises a first high-k dielectric layer between the first electrode and the second electrode, a first silicon oxide layer between the first high-k dielectric layer and the second electrode, and a first aluminum oxide layer between the first high-k dielectric layer and the second electrode.

    Semiconductor device
    6.
    发明授权

    公开(公告)号:US10892345B2

    公开(公告)日:2021-01-12

    申请号:US15995049

    申请日:2018-05-31

    摘要: Disclosed is a semiconductor device including a bottom electrode, a dielectric layer, and a top electrode that are sequentially disposed on a substrate. The dielectric layer includes a hafnium oxide layer including hafnium oxide having a tetragonal crystal structure, and an oxidation seed layer including an oxidation seed material. The oxidation seed material has a lattice constant having a lattice mismatch of 6% or less with one of a horizontal lattice constant and a vertical lattice constant of the hafnium oxide having the tetragonal crystal structure.