Impurity measuring method and device
    4.
    发明申请
    Impurity measuring method and device 审中-公开
    杂质测量方法及装置

    公开(公告)号:US20060228017A1

    公开(公告)日:2006-10-12

    申请号:US10560270

    申请日:2004-06-14

    Abstract: An impurity measuring device includes a table (T) on which a sample (S) is to be placed with its fracture surface (h) facing up, an illuminating means (7) for irradiating the fracture surface (h) with light (L) from a plurality of directions, an image sensing means for sensing an image of the fracture surface (h) irradiated with the light (L), continuous tone color image processing means for processing the sensed image into a continuous tone color image, and a binarizing means for binarizing the continuous tone color image through comparison between the result of the continuous tone color image processing and a threshold value. As the fracture surface (h) is irradiated with the light (L) from the plurality of directions, the image obtained by sensing the image of the fracture surface (h) is free from shading or optical irregularities caused by minute irregularities on the fracture surface (h). Therefore, impurities in the sample (S) can be accurately detected from the fracture surface (h) by subjecting the image to the continuous tone color image processing and binarization.

    Abstract translation: 一种杂质测量装置,包括:台面(T),其表面(S)的断面(h)面朝上放置在所述台面(T)上;照射装置(7),用光(L)照射断裂面 从多个方向观察用于感测用光(L)照射的断裂面(h)的图像的图像感测装置,用于将感测图像处理成连续色调图像的连续色调图像处理装置,以及二值化 用于通过连续色调图像处理的结果与阈值之间的比较对连续色彩图像进行二值化的装置。 当从多个方向对光(L)照射断裂面(h)时,通过感测断裂面(h)的图像而获得的图像没有由断裂面上的微细凹凸引起的阴影或光学不规则 (H)。 因此,通过对图像进行连续色调图像处理和二值化处理,可以从断裂面(h)精确地检测样品(S)中的杂质。

    Machine vision light source with improved optical efficiency
    5.
    发明授权
    Machine vision light source with improved optical efficiency 失效
    机器视觉光源,提高光学效率

    公开(公告)号:US5822053A

    公开(公告)日:1998-10-13

    申请号:US796876

    申请日:1997-02-07

    CPC classification number: G01N21/8806 G01N2201/06153 Y10S362/80

    Abstract: The present invention relates to an LED light source for a machine vision system. The light source includes a plurality of LEDs each arranged in a base plate in predetermined manner during manufacturing. Each LED is then securely mounted to the base plate with an ultravioletly curable adhesive to remain pointed in the predetermined manner. The light source also includes an optically efficient non-lambertain diffuser which receives light from each of the LEDs and breaks the light up to provide a uniform light field to illuminate an object under inspection.

    Abstract translation: 本发明涉及一种用于机器视觉系统的LED光源。 光源包括在制造期间以预定方式布置在基板中的多个LED。 然后将每个LED用可紫外固化的粘合剂牢固地安装到基板上,以预定的方式保持指向。 光源还包括光学有效的非层状扩散器,其接收来自每个LED的光并且将光打破以提供均匀的光场以照亮被检查物体。

    Inspection lighting system
    6.
    发明授权
    Inspection lighting system 失效
    检验照明系统

    公开(公告)号:US4972093A

    公开(公告)日:1990-11-20

    申请号:US439553

    申请日:1989-11-20

    Abstract: An engineered lighting system for use in an inspection system is comprised of an array of light emitting diodes. A specimen is brought into the viewing area, and a current pulse is provided to the diodes of the array to selectively flash all or a portion of the diodes of the array. Reflected light from the specimen is sensed and a digitized image is generated therefrom. An illumination level of the digitized image is adjustable, in whole or in part, by varying the effective lighting intensity of one or more of the diodes of the array during a flash period. The digitized image of the specimen is compared to data indicative of acceptability of the specimen, and acceptance or rejection of the specimen is decided on a basis of a comparison therebetween.

    Abstract translation: 用于检查系统的工程照明系统由发光二极管阵列组成。 将样本带入观察区域,并且向阵列的二极管提供电流脉冲以选择性地闪烁阵列的二极管的全部或一部分。 检测到来自样本的反射光并从其中产生数字化图像。 通过在闪光期间改变阵列的一个或多个二极管的有效照明强度,数字化图像的照明水平可以全部或部分地调整。 将样本的数字化图像与指示样品可接受性的数据进行比较,并且基于它们之间的比较来确定样品的接受或排除。

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