公开(公告)号：US20200346299A1

公开(公告)日：2020-11-05

申请号：US16861709

申请日：2020-04-29

Applicant: SEMES CO., LTD.

Inventor： Soo Young PARK ,  Ohyeol KWON ,  Jun Keon AHN ,  Jung Hwan LEE

IPC: B23K26/042 ,  B23K26/03

Abstract: Disclosed is a substrate treating apparatus. The substrate treating apparatus includes a chamber providing a space in which a substrate is treated, a support unit supporting the substrate inside the chamber, a laser unit irradiating laser to an edge region of the substrate, a vision unit capturing the edge region of the substrate to measure an offset value of the substrate, and an adjustment unit adjusting an irradiation location of the laser based on the offset value of the substrate.

公开(公告)号：US20200350156A1

公开(公告)日：2020-11-05

申请号：US16861387

申请日：2020-04-29

Applicant: SEMES CO., LTD.

Inventor： Jun Keon AHN ,  Soo Young PARK ,  Ohyeol KWON ,  Jung Hwan LEE ,  Seungtae YANG

IPC: H01L21/02 ,  H01L21/67 ,  H01L21/687 ,  B08B7/00 ,  B23K26/08 ,  B23K26/06 ,  B23K26/0622 ,  B23K26/073 ,  B23K26/082

Abstract: A method for treating a substrate includes a first treating operation for treating an edge region of the substrate by irradiating a first laser beam having a first wavelength to the edge region of a rotating substrate, and a second treating operation for treating the edge region by irradiating a second laser beam of a second wavelength to the edge region of the rotating substrate, wherein the first wavelength and the second wavelength are different from each other.

公开(公告)号：US20210020485A1

公开(公告)日：2021-01-21

申请号：US16930660

申请日：2020-07-16

Applicant: SEMES CO., LTD.

Inventor： Ohyeol KWON ,  Jung Hwan LEE ,  Soo Young PARK

IPC: H01L21/677 ,  H01L21/687

Abstract: A substrate treating apparatus includes a plurality of load ports on which carriers having substrates received therein are placed, a plurality of process chambers that perform processes on the substrates, and a transfer robot that transfers the substrates between the load ports and the process chambers. The transfer robot is movable along a transfer passage having a lengthwise direction formed along a first direction, the load ports and the process chambers are arranged along the first direction on one side and an opposite side of the transfer passage, and the transfer robot transfers the substrates between the carriers placed on the load ports and the process chambers.

公开(公告)号：US20200346304A1

公开(公告)日：2020-11-05

申请号：US16862086

申请日：2020-04-29

Applicant: SEMES CO., LTD.

Inventor： Ohyeol KWON ,  Jun Keon AHN ,  Byungsun BANG

IPC: B23K26/362 ,  G02B27/14 ,  G02B27/09 ,  G02B26/10 ,  B23K26/06 ,  B23K26/0622 ,  B23K26/082 ,  B23K26/402

Abstract: An apparatus includes a support unit supporting a substrate including a film, a laser generation unit that generates a laser beam to process the film, a beam splitter that splits the laser beam into a first laser beam travelling along a first path toward an upper edge of the substrate and a second laser beam travelling along a second path toward a lower edge of the substrate, a first beam shaping unit on the first path shaping the first laser beam, a second beam shaping unit on the second path shaping the second laser beam, a first beam scanning unit downstream of the first beam shaping unit that applies the first laser beam to the upper edge in the manner of scanning, and a second beam scanning unit downstream of the second beam shaping unit that applies the second laser beam to the lower edge in the manner of scanning.

公开(公告)号：US20200167946A1

公开(公告)日：2020-05-28

申请号：US16685345

申请日：2019-11-15

Applicant: Semes Co., Ltd.

Inventor： Ohyeol KWON ,  Soo Young Park ,  Jihyun Lee ,  Young Ho Choo

IPC: G06T7/64 ,  G06T7/13 ,  G06T7/11 ,  G06T7/00 ,  H01L21/687

Abstract: Disclosed are a substrate treating apparatus, an eccentricity inspection apparatus, an eccentricity inspection method, and a recording medium for measuring the amount of eccentricity of a spin chuck. The substrate treating apparatus includes a process chamber, a support unit that supports a substrate and rotates the substrate about a support shaft of a spin chuck, and an eccentricity inspection device that inspects eccentricity of the support shaft. The eccentricity inspection device includes an image acquisition unit that obtains an image of the substrate supported on the support unit and an eccentricity measurement unit that obtains edge data of the substrate from the image of the substrate and measures an amount of eccentricity of the support shaft, based on the edge data.

公开(公告)号：US20230330768A1

公开(公告)日：2023-10-19

申请号：US18341838

申请日：2023-06-27

Applicant: SEMES CO., LTD.

Inventor： Soo Young PARK ,  Ohyeol KWON ,  Jun Keon AHN ,  Jung Hwan LEE ,  Seong Soo LEE

IPC: B23K26/0622 ,  B23K26/40 ,  B23K26/08

CPC classification number: B23K26/0622 ,  B23K26/0823 ,  B23K26/40 ,  B23K26/103

Abstract: Disclosed is a method for removing a film from a substrate by irradiating a plurality of unit pulse laser beams to an edge region of the substrate. The method includes a first irradiation operation for irradiating a plurality of unit pulse laser beams onto the substrate while the substrate is rotating, and a second irradiation operation for irradiating a plurality of unit pulse laser beams to regions of the substrate onto which the unit pulse laser beams are not irradiated in the first irradiation operation.

公开(公告)号：US20220093430A1

公开(公告)日：2022-03-24

申请号：US17474469

申请日：2021-09-14

Applicant: SEMES CO., LTD.

Inventor： Ohyeol KWON ,  Soo Yeon SHIN ,  Hyun Hoo KIM ,  Myung Chan CHO

IPC: H01L21/67 ,  G06T7/00 ,  G06N3/04

Abstract: The inventive concept provides a method to determine whether a substrate treatment process is normal using a deep learning model. The method comprising receiving input on a substrate treatment process video, preprocessing the inputted video, using the deep learning model to study a preprocessed video, and determining whether the substrate treatment process is normal by comparing the trained model and a real time substrate treatment process video.

公开(公告)号：US20200346300A1

公开(公告)日：2020-11-05

申请号：US16862162

申请日：2020-04-29

Applicant: SEMES CO., LTD.

Inventor： Soo Young PARK ,  Ohyeol KWON ,  Jun Keon AHN ,  Jung Hwan LEE ,  Seong Soo LEE

IPC: B23K26/0622 ,  B23K26/40 ,  B23K26/08

Abstract: Disclosed is a method for removing a film from a substrate by irradiating a plurality of unit pulse laser beams to an edge region of the substrate. The method includes a first irradiation operation for irradiating a plurality of unit pulse laser beams onto the substrate while the substrate is rotating, and a second irradiation operation for irradiating a plurality of unit pulse laser beams to regions of the substrate onto which the unit pulse laser beams are not irradiated in the first irradiation operation.